| Literature DB >> 31561479 |
Krishna P Khakurel1, Borislav Angelov2, Jakob Andreasson3,4.
Abstract
Crystallography has long been the unrivaled method that can provide the atomistic structural models of macromolecules, using either X-rays or electrons as probes. The methodology has gone through several revolutionary periods, driven by the development of new sources, detectors, and other instrumentation. Novel sources of both X-ray and electrons are constantly emerging. The increase in brightness of these sources, complemented by the advanced detection techniques, has relaxed the traditionally strict need for large, high quality, crystals. Recent reports suggest high-quality diffraction datasets from crystals as small as a few hundreds of nanometers can be routinely obtained. This has resulted in the genesis of a new field of macromolecular nanocrystal crystallography. Here we will make a brief comparative review of this growing field focusing on the use of X-rays and electrons sources.Entities:
Keywords: X-ray free-electron laser; electron diffraction; nanocrystallography
Mesh:
Substances:
Year: 2019 PMID: 31561479 PMCID: PMC6804143 DOI: 10.3390/molecules24193490
Source DB: PubMed Journal: Molecules ISSN: 1420-3049 Impact factor: 4.411
Figure 1Experimental setup for serial femtosecond crystallography (SFX) data collection using an LCP injector. Microcrystals dispersed in LCP are injected as a continuous column of 20–50 μm diameter and intersected with 1.5 μm diameter pulsed XFEL beam focused by Kirkpatrick–Baez (KB) mirrors. Single pulse diffraction patterns are collected at 120 Hz using a CSPAD detector. (Adapted from Liu et al. [28]).
Figure 2(a) Electron micrograph of a nanocrystal and (b) the diffraction from the selected area in the micrograph. (Adapted from Clabbers et al. [3]).
Challenges in nanocrystallography.
| Nanocrystallography | |
|---|---|
| Screening, crystal identification | Need for development of less invasive tools for screening and crystal identification. |
| Detector Requirements | The photons reaching detector are sparse with small crystals. Necessity of sample background reduction. |
| Radiation damage | Methods to minimize radiation damage in nanocrystals with continuous and pulsed X-ray and electron sources have to be found. One approach is to use ultrashort pulses |
| Data analysis | Challenging due to datasets from multiple crystals in unknown orientation. |
Comparison of X-ray and electron nanocrystallography.
| X-Ray Nanocrystallography | Electron Nanocrystallography | |
|---|---|---|
| Source/accessibility | Large Facilities/Less accessible | Laboratory Sources/Frequent accessibility |
| Sample consumption | Large to moderate with serial crystallography | Less |
| Radiation damage | Minimal with X-ray FEL | Large and limits the highest attainable resolution. However, can be overcome by merging a large number of low dose datasets |
| Room temperature studies | Possible with current technologies | Not possible with current technologies |
| Ultrafast Time resolved studies | Possible | Not possible |
| Sensitivity to ions and H-atom | Less sensitive | Highly sensitive |