| Literature DB >> 33907252 |
Shekhar Bhatia1, Venkateshbabu Nagendrababu1,2, Ove A Peters3,4, Amr Fawzy5, Umer Daood6,7.
Abstract
To evaluate structural profiles and mechanical behaviour of WaveOne Gold (WOG), Twisted File Adaptive (TFA) and XP-endo shaper (XPS) instruments after root canal preparation. Standardized in vitro shaping was performed in presence of 5.25% sodium hypochlorite. File morphology was analyzed using scanning electron microscopy; X-ray diffraction analysis was performed before and after use along with Raman spectroscopy. Nanoindentation was carried out to characterize surface topography. Ni2+ release was measured at 1, 3, 5 and 7 days. X-ray photoelectron spectroscopy (XPS) analysis was done before and after use. After allocating scan line shifts like in WOG, mechanical deformation was shown using first order polynomials. XPS file system showed minimal grooves on surface. SEM of WOG instrument showed scraping surface defects. Hardness varied from 8.11 ± 0.99 GPa in TFA system to 6.7 ± 1.27 GPa and 4.06 ± 4.1 GPa in XPS and WOG. Ni2+ concentration from WOG was 171.2 μg/L. Raman peak at 540-545 cm-1 is attributed to Cr2O3. High resolution of Ti 2p spectrum show distinctive peaks with binding energies dominating in WOG, XPS and TFA file system. XRD exhibited NiTi phases with diffraction peaks. WOG files showed more surface deterioration and less passive layer formation as compared to TFA and XPS systems.Entities:
Year: 2021 PMID: 33907252 PMCID: PMC8079699 DOI: 10.1038/s41598-021-88570-4
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1SEM micrographs of three different endodontic instrument systems showing different surface characteristics. (A) XPS file system showing the presence of minimal grooves on the instrument surface; (B) TFA file system showing absence of cracks or grooves on the surface of file system; (C) SEM micrograph of the final 3 mm of WOG instrument showing the transition angle of surface defects on instrument surface. The yellow lines are depicting the process of correcting scan line shift artifacts in SEM images (D) SEM micrograph of WOG system showing metal strips and scraping on the instrument surface (E) compared to the XPS system after one use (F) Image of XPS file system after one use.
Presence of the type of defects of the groups Twisted File, Wave One Gold and XP Endo shaper.
| Groups | Irregular | Grooves | Microcavities | |||
|---|---|---|---|---|---|---|
| Tip | 10 mm | Tip | 10 mm | Tip | 10 mm | |
| Wave One Gold | 9 | 4 | 6 | 7 | 7 | 8 |
| Twisted Apical File | 4 | 1 | 1 | 0 | 3 | 2 |
| Endo Shaper | 1 | 1 | 2 | 1 | 5 | 2 |
Figure 2(A, B) corresponding AFM image (inset plan view optical microscope image at × 40 magnification) at mN load (C) Load–displacement curves for nanoindentation of all specimens numbered, blue > control TFA file, red > TFA instrumented file, red/U > XPS file, green > WOG, with (D) individual hardness vs. displacement curves.
Means ± standard deviations of the variations in the surface mechanical properties (nano-indentation) in terms of hardness (H); Ni2+ release rate and concentration in the medium solution for samples as a function of the immersion time kept at 37 °C.
| Groups | 1st day | 3rd day | 5th day | 7th day | |
|---|---|---|---|---|---|
| Wave one gold protocol (WOG) | 171.2 μg/L ± 23.6 | 179.3 μg/L ± 19.1 | 154.1 μg/L ± 29.9 | 121.5 μg/L ± 14.5 | |
| 4.06 ± 4.1 (H) | |||||
| Twisted Adaptive File | 47.4 μg/L ± 9.9 | 39.5 μg/L ± 6.7 | 31.6 μg/L ± 9.1 | 27.9 μg/L ± 7.7 | |
| 8.11 ± 0.99 (H) | |||||
| XP Endo Shaper | 69.3 μg/L ± 12.1 | 58.7 μg/L ± 15.1 | 49.1 μg/L ± 12.1 | 39.5 μg/L ± 6.3 | |
| 6.7 ± 1.27 (H) |
Figure 3(A) Raman spectrum of specimens for prominent band with Raman peak located at 540 cm−1. An analysis of Raman spectra tabulated indicate alloy’s chromium concentration increases, the amount of Cr2O3 included in the alloy’s surface film would increase. The intensity is highest found in TFA files (light blue spectrum) > followed by XPS Endo system (dark blue spectrum) > followed by Wave One Gold system (black spectrum) as compared to control spectrum (green); (B) XPS spectra of the three file systems (TFA, WOG, XPS) and control (CT) used in the region of Ti 2p, and Ni 2p.
Figure 4XRD patterns of the tested files after one use. Purple—control unused wave one gold for standard; blue—WaveOne gold (WOG)—black—XP-endo shaper(XPS); green Twisted File Adapted (TFA) after use.