| Literature DB >> 26774849 |
Christopher J Russo1, Lori A Passmore2.
Abstract
The physical principles of electron-specimen interaction govern the design of specimen supports for electron cryomicroscopy (cryo-EM). Supports are constructed to suspend biological samples within the vacuum of the electron microscope in a way that maximises image contrast. Although the problem of specimen motion during imaging has been known since cryo-EM was first developed, the role of the support in this movement has only been recently identified. Here we review the key technological advances in specimen supports for cryo-EM. This includes the use of graphene as a surface for the adsorption of proteins and the design of an ultrastable, all-gold substrate that reduces the motion of molecules during electron irradiation. We discuss the implications of these and other recent improvements in specimen supports on resolution, and place them in the context of important developments in structure determination by cryo-EM.Entities:
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Year: 2016 PMID: 26774849 PMCID: PMC4863039 DOI: 10.1016/j.sbi.2015.12.007
Source DB: PubMed Journal: Curr Opin Struct Biol ISSN: 0959-440X Impact factor: 6.809
Figure 1Physical constraints on specimen design in cryo-EM. Diagram (a) of high-energy electron scattering in a thin layer of ice, with types of events shown in order of decreasing probability from left to right. Only the unscattered and single elastic scattering events (bold) contribute to typical phase contrast imaging; the remainder damage the specimen (inelastic) or contribute noise to the image. The relative probability of these events is described by their scattering cross sections, whose sum is closely related to the total mean free path, shown in (b). Several other physical parameters that constrain specimen design in cryo-EM are plotted versus energy in (b). Unlike for light microscopy, neither the electron wavelength (light green line) nor the lens optics (pink line, chromatic aberration) limit resolution. Instead, specimen movement during imaging (black dashed line, information limit for moving particles without motion correction on Quantifoil supports) and information content in the individual images limits practical resolution. High-speed detectors can be used to compensate for specimen motion (to move below black dashed line) and new supports reduce movement (gold dashed line, information limit on all-gold grids). Cryo-EM is now starting to approach the information limits imposed by the optics of the microscope (pink line) and the diffusion of the particles within the vitrified ice (purple dashed line, 1 MDa particles). The thickness of the specimen is limited by the total mean free path in ice (blue dashed line), and the depth of field (DOF) at a particular resolution caused by curvature of the Ewald sphere. Theory after [22, 23, 24••, 25, 26, 27, 21••, 28]; see Appendix A.
Figure 2Design of cryo-EM specimen supports. Top view and section diagrams of typical specimen support geometries, comprising a perforated foil on a metal mesh grid. Sometimes an additional thin continuous film is added to the foil to change its surface properties. Three different magnifications are shown (a)–(c) along with lists of materials used for each component of the support. The most commonly used materials are in bold.
Figure 3Reducing movement of biological specimens to the physical limits. Electron radiation induced movement of ribosomes was measured on different supports under the same irradiation conditions (a)–(d). Ribosomes imaged on amorphous carbon (am-C) supports (a,b) show a large degree of movement during irradiation. Replacing the thin amorphous carbon film (a) with graphene (c) reduces the movement and improves reproducibility. Making the entire support from gold reduces the movement to less than 2 Å in a typical micrograph, (d). Further developments are required to reduce the radiation induced movement to the theoretical limit set by pseudo-diffusion of the particles in the ice (e). Panels (a–d) reproduced from [20•, 21••], panel (e) calculated with the Stokes-Einstein equation using the water diffusion coefficient measured in [28]. Values for these curves at 15 e−/Å2 are used to calculate the information limits in Figure 1.
| Description | Formula | Reference(s) | Notes |
|---|---|---|---|
| Electron wavelength | [ | ||
| Chromatic aberration limit | [ | ||
| Inelastic mean free path | [ | † | |
| Depth of field | [ | 66° phase error‡ |