| Literature DB >> 33487963 |
Nikita Agarwal1, Sanchit Bansal1, Umesh Yeshwanth Pai1, Shobha J Rodrigues1, Thilak B Shetty1, Sharon J Saldanha1.
Abstract
AIM: This study assessed the effect of postetch cleansing on the surface microstructure, surface topography, and microshear bond strength (μSBS) of lithium disilicate and the resin cement. SETTING ANDEntities:
Keywords: Ceramic; hydrofluoric acid; lithium disilicate; phosphoric acid; ultrasonic cleansing
Year: 2020 PMID: 33487963 PMCID: PMC7814682 DOI: 10.4103/jips.jips_443_19
Source DB: PubMed Journal: J Indian Prosthodont Soc ISSN: 0972-4052
Figure 1Specimen fabrication with resin cement cylinders on lithium disilicate discs
Figure 2Microshear bond strength testing
Different letter (A/B/C) shows that there is statistical significant difference between the groups (P<0.001)
| Groups | Mean | Std. deviation | Welch statistics (*)/ | |||
|---|---|---|---|---|---|---|
| Micro | HF | 17 | 42.11A | 1.41 | 306.20* | <0.001 |
| Shear bond | HFP | 19 | 49.52B | 2.23 | ||
| Strength | HFPU | 18 | 58.88C | 2.52 | ||
| (µSBS) (MPa) | Total | 54 | 50.30 | 7.14 |
*Suggests that the welch test is used which is a variant of ANOVA. It is used when the variances are not equal
Post Hoc Tukey Test showing significant difference between different groups
| Dependent Variable | (I) group | (J) group | Mean difference (I-J) | Std. error | |
|---|---|---|---|---|---|
| Microshear | Group HF | Group HFP | -7.41* | 0.70 | <0.001 |
| Bond Strength | Group HFP | -16.78* | 0.71 | <0.001 | |
| (µSBS) (Mpa) | Group HFP | Group HFPU | -9.36* | 0.69 | <0.001 |
*Suggests that the welch test is used which is a variant of ANOVA. It is used when the variances are not equal
Figure 3Bar diagram showing fractographic analysis
Figure 4Bar diagram showing mean microshear bond strength values
Figure 5SEM images obtained from each experimental group (×1000): (a) Group HF, (b) Group HFP, (c) Group HFPU
Figure 6Scanning electronic microscope images obtained from each experimental group (×3000): (a) Group HF, (b) Group HFP, (c) Group HFPU
Elemental composition (in weight %) of all the three groups
| Groups | Si | C | O | F | Na | Mg | Al | K | |
|---|---|---|---|---|---|---|---|---|---|
| HF | 36.1 | 6.7 | 47.5 | 2.1 | 0 | 0 | 1.9 | 3.9 | 1.8 |
| HFP | 38.5 | 6.2 | 48.3 | 1.2 | 0.3 | 0.2 | 1.5 | 2.5 | 1.3 |
| HFPU | 39.8 | 5.5 | 49.9 | 0 | 0 | 0 | 1.3 | 2.3 | 1.2 |
Roughness values of all groups at 50 µm where Ra - is mean arithmetic mean, Rq - square root mean and Rz - maximum peak value or roughness value
| Type of roughness | Group HF (In nm) | Group HFP (In nm) | Group HFPU (In nm) |
|---|---|---|---|
| Arithmetic roughness (Ra) | 527 | 575 | 596 |
| Root mean square roughness (Rq) | 653 | 729 | 761 |
| Max. peak value (Rz) | 4667 | 5556 | 6371 |
Figure 7Atomic force microscope images of Group HF, Group HFP, HFPU