| Literature DB >> 31197138 |
Gisela Brändén1, Greger Hammarin2, Rajiv Harimoorthy2, Alexander Johansson2, David Arnlund2, Erik Malmerberg3, Anton Barty4, Stefan Tångefjord2, Peter Berntsen2, Daniel P DePonte5, Carolin Seuring4,6, Thomas A White4, Francesco Stellato4, Richard Bean4, Kenneth R Beyerlein4, Leonard M G Chavas4, Holger Fleckenstein4, Cornelius Gati4, Umesh Ghoshdastider7, Lars Gumprecht4, Dominik Oberthür4, David Popp7, Marvin Seibert5, Thomas Tilp4, Marc Messerschmidt5, Garth J Williams5, N Duane Loh8, Henry N Chapman4,6,9, Peter Zwart3, Mengning Liang4,5, Sébastien Boutet5, Robert C Robinson7,10,11, Richard Neutze12.
Abstract
X-ray free electron lasers (XFELs) create new possibilities for structural studies of biological objects that extend beyond what is possible with synchrotron radiation. Serial femtosecond crystallography has allowed high-resolution structures to be determined from micro-meter sized crystals, whereas single particle coherent X-ray imaging requires development to extend the resolution beyond a few tens of nanometers. Here we describe an intermediate approach: the XFEL imaging of biological assemblies with helical symmetry. We collected X-ray scattering images from samples of microtubules injected across an XFEL beam using a liquid microjet, sorted these images into class averages, merged these data into a diffraction pattern extending to 2 nm resolution, and reconstructed these data into a projection image of the microtubule. Details such as the 4 nm tubulin monomer became visible in this reconstruction. These results illustrate the potential of single-molecule X-ray imaging of biological assembles with helical symmetry at room temperature.Entities:
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Year: 2019 PMID: 31197138 PMCID: PMC6565740 DOI: 10.1038/s41467-019-10448-x
Source DB: PubMed Journal: Nat Commun ISSN: 2041-1723 Impact factor: 14.919
Fig. 1Schematic illustration of the experimental setup. Samples of pre-formed microtubules were injected across a focused X-ray free electron laser (XFEL) beam. Diffraction data were recorded on a CSPAD X-ray detector which was read out at 120 Hz, which matched the incoming repetition rate of the XFEL. Under the experimental conditions approximately twenty microtubules were intercepted by the X-ray beam as it passed through the microjet. Figures 1, 2, and 5 were originally presented in the doctoral thesis of Harimoorthy[59]
Fig. 2X-ray diffraction images and class averages. a X-ray diffraction image recorded from exposure of microtubule samples to a single XFEL pulse. The inner yellow circle indicates 4 nm resolution and the outer circle indicates 2 nm resolution. This scale applies to all panels. b Average of approximately 200 images selected by class average sorting of the X-ray diffraction patterns using software originally developed for electron microscopy applications[36]. c Sum of the class averages (13,511 images summed in total) after aligning each class average by rotating about the beam center. d Fitted diffraction image recovered by fitting Gaussian peaks to the features identified as diffraction peaks in (c)
Fig. 5Projection images recovered by iterative phase retrieval. a 2D projection image of microtubule samples recovered after Fourier transform of the image in Fig. 2a using a featureless tube for initial phase and after 100 cycles of iterative phase retrieval. b 2D projection image recovered after 100 cycles of iterative phase retrieval of the image shown in Fig. 2b. c 2D projection image recovered after 100 cycles of iterative phase retrieval of the image shown in Fig 2c. d 2D projection image recovered after 100 cycles of iterative phase retrieval of the image shown in Fig. 2d. These projection images shows increasing detail after each processing step. Both the average microtubule diameter of approximately 25 nm and sub-structures of 4 nm become visible when inverting the fitted diffraction image. White bars indicate 25 nm in the horizontal direction and 4 nm in the vertical direction. Blue represents low projection density whereas yellow is high projection density
Fig. 3Flow chart for data processing of the diffraction images. Manual intervention is indicated in gray boxes. An asterisk indicates where data processing steps used only the four central detector panels
Fig. 4Iterative phase retrieval algorithm. a Flow chart illustrating the input of X-ray diffraction data, initial phases, application of solvent flattening (support function) and forward and backward Fourier transformations. Pink boxes represent real space and cream boxes represent reciprocal space. b Initial phases were provided from a projection of a featureless tube onto a 2D image
Fig. 6Oversimplified model illustrating single fibril snapshots. a Iterative phase retrieval image recovered from theoretical data generated from projection images of a single snapshot of a simplified helical model constructed from 4 nm spheres. b Iterative phase retrieval image recovered from the same object but rotated by 66° relative to its orientation in (a). c Iterative phase retrieval image recovered from the same object but averaged over 360° of rotation about its helical axis. White bars indicate 25 nm in the horizontal direction and 4 nm in the vertical direction