| Literature DB >> 23989164 |
Hasan Demirci1, Raymond G Sierra, Hartawan Laksmono, Robert L Shoeman, Sabine Botha, Thomas R M Barends, Karol Nass, Ilme Schlichting, R Bruce Doak, Cornelius Gati, Garth J Williams, Sébastien Boutet, Marc Messerschmidt, Gerwald Jogl, Albert E Dahlberg, Steven T Gregory, Michael J Bogan.
Abstract
High-resolution ribosome structures determined by X-ray crystallography have provided important insights into the mechanism of translation. Such studies have thus far relied on large ribosome crystals kept at cryogenic temperatures to reduce radiation damage. Here, the application of serial femtosecond X-ray crystallography (SFX) using an X-ray free-electron laser (XFEL) to obtain diffraction data from ribosome microcrystals in liquid suspension at ambient temperature is described. 30S ribosomal subunit microcrystals diffracted to beyond 6 Å resolution, demonstrating the feasibility of using SFX for ribosome structural studies. The ability to collect diffraction data at near-physiological temperatures promises to provide fundamental insights into the structural dynamics of the ribosome and its functional complexes.Entities:
Keywords: 30S ribosomal subunit; X-ray free-electron laser; ribosome; serial femtosecond X-ray crystallography
Mesh:
Year: 2013 PMID: 23989164 PMCID: PMC3758164 DOI: 10.1107/S174430911302099X
Source DB: PubMed Journal: Acta Crystallogr Sect F Struct Biol Cryst Commun ISSN: 1744-3091
Figure 1Sample preparation (pre-filtration and injection) and experimental setup at the CXI endstation at the LCLS (Boutet & Williams, 2010 ▶; Boutet et al., 2012 ▶). The image of the gas dynamic virtual nozzle (GDVN) shows the liquid jet formed by the buffer containing ribosome microcrystals. The position of the LCLS beam interaction point is indicated by the red circle enclosed in the dashed rectangle. This is also shown by the white cross-hair in the real-time image.
Figure 2Images of 30S microcrystals and preliminary SFX diffraction image of 30S ribosomal subunits. (a) Long needles (3 × 5 × 200 µm) of 30S microcrystals before pre-filtration. (b) 30S microcrystals broken after filtration. (c) SFX diffraction image collected on a CSPAD detector extending to beyond 6 Å resolution, with unit-cell parameters a = b = 405, c = 177 Å, α = β = γ = 90°. (d) The same image as in (c) with the reflection predictions after indexing.