| Literature DB >> 17977018 |
James Z Chen1, Carsten Sachse, Chen Xu, Thorsten Mielke, Christian M T Spahn, Nikolaus Grigorieff.
Abstract
A low beam intensity, low electron dose imaging method has been developed for single-particle electron cryo-microscopy (cryo-EM). Experiments indicate that the new technique can reduce beam-induced specimen movement and secondary radiolytic effects, such as "bubbling". The improvement in image quality, especially for multiple-exposure data collection, will help single-particle cryo-EM to reach higher resolution.Entities:
Mesh:
Year: 2007 PMID: 17977018 PMCID: PMC2213720 DOI: 10.1016/j.jsb.2007.09.017
Source DB: PubMed Journal: J Struct Biol ISSN: 1047-8477 Impact factor: 2.867