Literature DB >> 16905258

Stroboscopic image capture: reducing the dose per frame by a factor of 30 does not prevent beam-induced specimen movement in paraffin.

Dieter Typke1, Christopher J Gilpin, Kenneth H Downing, Robert M Glaeser.   

Abstract

Beam-induced specimen movement may be the major factor that limits the quality of high-resolution images of organic specimens. One of the possible measures to improve the situation that was proposed by Henderson and Glaeser [Ultramicroscopy 16 (1985) 139-150], which we refer to here as "stroboscopic image capture", is to divide the normal exposure into many successive frames, thus reducing the amount of electron exposure--and possibly the amount of beam-induced movement--per frame. The frames would then be aligned and summed. We have performed preliminary experiments on stroboscopic imaging using a 200-kV electron microscope that was equipped with a high dynamic range Charge-coupled device (CCD) camera for image recording and a liquid N2-cooled cryoholder. Single-layer paraffin crystals on carbon film were used as a test specimen. The ratio F(g)/F(0) of paraffin reflections, calculated from the images, serves as our criterion for the image quality. In the series that were evaluated, no significant improvement of the F(image)(g)/F(image)(0) ratio was found, even though the electron exposure per frame was reduced by a factor of 30. A frame-to-frame analysis of image distortions showed that considerable beam-induced movement had still occurred during each frame. In addition, the paraffin crystal lattice was observed to move relative to the supporting carbon film, a fact that cannot be explained as being an electron-optical effect caused by specimen charging. We conclude that a significant further reduction of the dose per frame (than was possible with this CCD detector) will be needed in order to test whether the frame-to-frame changes ultimately become small enough for stroboscopic image capture to show its potential.

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Year:  2006        PMID: 16905258     DOI: 10.1016/j.ultramic.2006.06.005

Source DB:  PubMed          Journal:  Ultramicroscopy        ISSN: 0304-3991            Impact factor:   2.689


  9 in total

Review 1.  Precise beam-tilt alignment and collimation are required to minimize the phase error associated with coma in high-resolution cryo-EM.

Authors:  Robert M Glaeser; Dieter Typke; Peter C Tiemeijer; James Pulokas; Anchi Cheng
Journal:  J Struct Biol       Date:  2010-12-21       Impact factor: 2.867

Review 2.  Enabling direct nanoscale observations of biological reactions with dynamic TEM.

Authors:  James E Evans; Nigel D Browning
Journal:  Microscopy (Oxf)       Date:  2013-01-12       Impact factor: 1.571

3.  Images of paraffin monolayer crystals with perfect contrast: minimization of beam-induced specimen motion.

Authors:  R M Glaeser; G McMullan; A R Faruqi; R Henderson
Journal:  Ultramicroscopy       Date:  2010-10-26       Impact factor: 2.689

4.  Radiation damage in single-particle cryo-electron microscopy: effects of dose and dose rate.

Authors:  Manikandan Karuppasamy; Fatemeh Karimi Nejadasl; Milos Vulovic; Abraham J Koster; Raimond B G Ravelli
Journal:  J Synchrotron Radiat       Date:  2011-04-09       Impact factor: 2.616

5.  Cryo-tomography tilt-series alignment with consideration of the beam-induced sample motion.

Authors:  Jose-Jesus Fernandez; Sam Li; Tanmay A M Bharat; David A Agard
Journal:  J Struct Biol       Date:  2018-02-03       Impact factor: 2.867

6.  Detective quantum efficiency of electron area detectors in electron microscopy.

Authors:  G McMullan; S Chen; R Henderson; A R Faruqi
Journal:  Ultramicroscopy       Date:  2009-05-07       Impact factor: 2.689

7.  A dose-rate effect in single-particle electron microscopy.

Authors:  James Z Chen; Carsten Sachse; Chen Xu; Thorsten Mielke; Christian M T Spahn; Nikolaus Grigorieff
Journal:  J Struct Biol       Date:  2007-10-01       Impact factor: 2.867

8.  Non-rigid image registration to reduce beam-induced blurring of cryo-electron microscopy images.

Authors:  Fatemeh Karimi Nejadasl; Manikandan Karuppasamy; Emily R Newman; John E McGeehan; Raimond B G Ravelli
Journal:  J Synchrotron Radiat       Date:  2012-11-29       Impact factor: 2.616

9.  Electron counting and beam-induced motion correction enable near-atomic-resolution single-particle cryo-EM.

Authors:  Xueming Li; Paul Mooney; Shawn Zheng; Christopher R Booth; Michael B Braunfeld; Sander Gubbens; David A Agard; Yifan Cheng
Journal:  Nat Methods       Date:  2013-05-05       Impact factor: 28.547

  9 in total

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