| Literature DB >> 36088475 |
Abstract
Beam hardening artefacts induced by highly-dense material (e.g. metal) is a common quality issue in maxillofacial Cone Beam Computed Tomography (CBCT-) images. This experimental and analytical study investigated attenuation patterns of two typical dental implant materials: zirconia-ceramic and pure titanium. By application of different x-ray beam energies (60, 70, 80, 90 [kVp]) energy-dependent attenuation of these materials is assessed and the resulting artefact induction in the resulting CBCT-images evaluated. A zirconia (Y-TZP-) implant ([Formula: see text]: 4.1 mm) and a pure titanium rod ([Formula: see text]: 4.0 mm) were exposed in a commercial CBCT (3D Accuitomo 170). The raw two-dimensional (2D) projection radiographs the CBCT utilizes for three-dimensional reconstruction applied for acquisition of attenuation profiles through the circular central slice of the implant-phantom images. Distances the x-rays traverse through the implant-phantoms at this location were computed. Using this information and the linear attenuation coefficient, transmission and attenuation was computed for each material and beam energy. These data were related to beam hardening artefacts that were assessed in the axial reconstructions of the implants' CBCT images. Transmission of titanium for all peak kilovoltages (kVp) was higher and approximately 200% that of Y-TZP at 60 kVp versus 530% at 90 kVp. At 4 mm diameter transmission for Y-TZP was only approximately 5 % for all four beam-energies. In agreement with this finding, beam hardening artefacts for Y-TZP could not be reduced using higher energies, whereas for titanium they decreased with increasing energy. For the energy spectrum used in this study (60-90 kVp), beam hardening caused by titanium can be reduced using higher energies while this is not the case for zirconia-ceramic (Y-TZP).Entities:
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Year: 2022 PMID: 36088475 PMCID: PMC9464216 DOI: 10.1038/s41598-022-19379-y
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.996
Figure 1Exemplary 2D projection radiograph from the 3D Accuitomo with the Y-TZP-implant positioned in the center of the FOV. The white line represents the line along which the gray value profile was measured and evaluated, so that in eventually only the values within the implant image were used for computing transmission.
Figure 2(A) Topview on the imaging geometry where the implant with radius r is exposed from the focal spot o on a detector D. The central x-ray is represented by the dashed line. Exemplarily the pixels with dimension p and the respective distances are indicated. Their centers are found at . (B) Distances and angles within the implant-cross-section used for calculation of the the x-ray-paths through the implant.
Exposure settings for acquisition of the CBCT-scans.
| Setting no. | kVp | mA | FOV-size [mm] | Pixel-size [mm] | ||
|---|---|---|---|---|---|---|
| 1 | 60 | 5 | 40 | 540.0 | 842.0 | 0.254 |
| 2 | 70 | 5 | 40 | 540.0 | 842.0 | 0.254 |
| 3 | 80 | 5 | 40 | 540.0 | 842.0 | 0.254 |
| 2 | 90 | 5 | 40 | 540.0 | 842.0 | 0.254 |
From these scans only the 2D-projection images acquired under the exposition parameters specified above were used for further evaluation.
mA milliampere, kVp peak kilovoltage, f source-to-object-distance, h source-to-receptor-distance.
Figure 3Set-up with the Y-TZP-implant centered and exposed in the CBCT-device. By means of the integrated laser-beam the central-ray was exactly centered in the field of view so that the required implant cross-section was centered in each PROJ.
Figure 5Slices through the DICOM CBCT-reconstruction of the implant samples for both materials and minimum (60 kVp) versus maximum (90 kVp) beam energy. Beam hardening is clearly visible in the center of the homogenouos implant as significantly darker gray values. This is particularly emphasized in the Y-TZP reconstructions (lower row).
Figure 6Numerical comparison of the actually occurring beam hardening in the reconstructed 3D CBCT-images of the implant samples. The plot shows averaged gray value-profiles through the implant cross-section (see Fig.5). Note the significant beam hardening artefact for Y-TZP equal for all four energies and representing as a significant reduction in gray value in the center of the implant image of approximately 50%.
Figure 4Transmission profiles for both materials and the four different beam energies averaged over both acquisitions. Note the transmission differences between the materials at equal distances within the material and the similarity of the transmission profiles for Y-TZP and all energies.
Mean attenuation and transmission (± standard deviation) averaged over both experiments.
| kVp | Parameter SD | Titanium | Y-TZP |
|---|---|---|---|
| 60 | Attenuation | 0.8878379 ± 0.2141 | 1.2459 ± 0.1891 |
| Transmission | 0.149 ± 0.1023 | 0.108 ± 0.0464 | |
| 70 | Attenuation | 0.7509472 ± 0.1862 | 1.3222 ± 0.1990 |
| Transmission | 0.1964 ± 0.1117 | 0.0877 ± 0.0431 | |
| 80 | Attenuation | 0.6574 ± 0.1567 | 1.3270 ± 0.2015 |
| Transmission | ± 0.1078 | 0.091 ± 0.0421 | |
| 90 | Attenuation | 0.4492 ± 0.1616 | 1.1942 ± 0.1920 |
| Transmission | 0.383 ± 0.1790 | 0.117 ± 0.0509 |
All values are computed over all intensities along the projection line within the implant image in Fig. 1.
Method error as absolute transmission differences between the two experiments.
| kVp | Parameter | Titanium | Y-TZP |
|---|---|---|---|
| 60 | Absolute difference:mean | − 0.00546 | − 0.00589 |
| p | 0.9554 | 0.5353 | |
| 70 | Absolute difference:mean | − 0.00698 | − 0.01925 |
| p | 0.9924 | 0.9445 | |
| 80 | Absolute difference:mean | − 0.00138 | − 0.02150 |
| p | 0.957 | 0.9527 | |
| 90 | Absolute difference:mean | 0.02813 | − 0.02194 |
| p | 0.6563 | 0.991 |
P-values (paired t-test) comparing Transmission in experiment 1 and 2 are also indicated. All values are computed over all intensities along the projection line within the implant image in Fig. 1.
Figure 7Plot of the mass attenuation coefficient for titanium and zirconium (as main compound of Y-TZP) for beam energies from 1 to 100 kVp (data taken from: physics.nist.gov).