| Literature DB >> 35436377 |
Ghada Aldosary1,2, Jason Belec3,4, Claire Foottit3,4, Eric Vandervoort1,3,4.
Abstract
Due to their many favorable characteristics, moldable silicone (MS) composites have gained popularity in medicine and recently, in radiotherapy applications. We investigate the dosimetric properties of silicones in radiotherapy beams and determine their suitability as water substitutes for constructing boluses and phantoms. Two types of silicones were assessed ( ρ $\rho \;$ = 1.04 g/cm3 and ρ $\rho \;$ = 1.07 g/cm3 ). Various dosimetric properties were characterized, including the relative electron density, the relative mean mass energy-absorption coefficient, and the relative mean mass restricted stopping power. Silicone slabs with thickness of 1.5 cm and 5.0 cm were molded to mimic a bolus setup and a phantom setup, respectively. Measurements were conducted for Co-60 and 6 MV photon beams, and 6 MeV electron beams. The doses at 1.5 cm and 5.0 cm depths in MS were measured with solid water (SW) backscatter material (DMS-SW ), and with a full MS setup (DMS-MS ), then compared with doses at the same depths in a full SW setup (DSW-SW ). Relative doses were reported as DMS-SW /DMS-SW and DMS-MS /DSW-SW . Experimental results were verified using Monaco treatment planning system dose calculations and Monte Carlo EGSnrc simulations. Film measurements showed varying dose ratios according to MS and beam types. For photon beams, the bolus setup DMS-SW /DSW-SW exhibited a 5% relative dose reduction. The dose for 6 MV beams was reduced by nearly 2% in a full MS setup. Up to 2% dose increase in both scenarios was observed for electron beams. Compared with dose in SW, an interface of MS-SW can cause relatively high differences. We conclude that it is important to characterize a particular silicone's properties in a given beam quality prior to clinical use. Because silicone compositions vary between manufacturers and differ from water/SW, accurate dosimetry using these materials requires consideration of the reported differences.Entities:
Keywords: anthropomorphic; bolus; deformable; phantom; radiotherapy; silicone
Mesh:
Substances:
Year: 2022 PMID: 35436377 PMCID: PMC9195024 DOI: 10.1002/acm2.13605
Source DB: PubMed Journal: J Appl Clin Med Phys ISSN: 1526-9914 Impact factor: 2.243
Physical and mechanical properties of commercial moldable silicones used in this study, as reported by the manufacturer (Smooth‐On, Inc., PA, USA)
| Manufacturer reported physical property | Ecoflex™ 00–10 (E10) | Ecoflex™ 00–50 (E50) |
|---|---|---|
| Mass density (g/cm3) | 1.04 | 1.07 |
| Shore hardness | 00–10 | 00–50 |
| 100% Modulus (kPa) | 55.2 | 83.0 |
| Tensile strength (kPa) | 827.4 | 2171.8 |
Stoichiometric data and fractional weight of each element found in different media of interest used in this study. Each element is listed with its atomic number, Z, provided in brackets
| Fractional weight | |||||||
|---|---|---|---|---|---|---|---|
| Medium | H (1) | C (6) | N (7) | O (8) | Si (14) | Cl (17) | Ca (20) |
| Silicone | 0.081 | 0.324 | – | 0.216 | 0.379 | – | – |
| Solid Water (RMI457) | 0.081 | 0.672 | 0.024 | 0.198 | – | 0.001 | 0.023 |
| Water | 0.112 | – | – | 0.888 | – | – | – |
FIGURE 1The molding process for the silicone slabs included using a custom‐built acrylic open faced cuboid container, which had an optional Markus IC dummy insert that can be added at the base to form a slot for IC placement. The molded E10 and E50 silicone slabs are shown on the right‐hand image, and were 1.5 cm and 5.0 cm thick
FIGURE 2Pictoral representations of the experimental setups used for each beam type. Photon beams were measured at depths of 1.5 cm and 5.0 cm: setups (1)–(6) as shown in (a) and (b). Electron beams were measured using 1.5 cm depth slabs: setups (1), (2), and (3) as shown in (a). IC measurements were conducted in the lower MS slabs that were made to fit the IC flush against its surface. The measurement points (at the interfaces) are identified with the x marker in the illustrations shown in (a) and (b) and evaluated dose ratios are shown in grey boxes. Measurements are compared to Monaco TPS calculations for 6 MV and to EGSnrc Monte Carlo simulations for Co‐60 and 6 MV at the same depths. An example of one of the setups used for measurements in the Co‐60 beam is provided in (c), in which the sides of the acrylic mold were used as a frame to maintain the silicone slabs in an upright position for a lateral beam orientation. An example of one of the setups used for measurements in the 6 MV beam, using the Markus IC, is provided in (d). Measurements for 6 MeV beams were conducted with a 10 × 10 cm2 electron applicator in a similar setup to that shown in (d)
Physical quantities related to radiation attenuation and absorption, as reported for generic silicone, and compared to common materials used in radiotherapy dosimetry (namely, solid water and water)
| Material | |||
|---|---|---|---|
| Physical quantity | Silicone | Solid Water (RMI457) | Water |
| ρ (g/cm3) | 1.01 | 1.03 | 1.00 |
|
| 10.65 | 7.40 | 7.42 |
| RED | 0.983 | 1.01 | 1.00 |
| Mean excitation energy (eV) | 93.80 | 70.00 | 75.00 |
|
| 0.975 | 0.944 | 1.00 |
|
| 0.975 | 0.973 | 1.00 |
|
| 0.930 | 1.067 | 1.00 |
|
| 0.929 | 1.080 | 1.00 |
Summary of simulation properties and parameters used to simulate radiation dose attenuation in silicone and solid water phantoms
| Item name | Description | References |
|---|---|---|
|
System/code, version/release date |
EGSnrc code system/DOSXYZnrc, v2021/ 2000 | Kawrakow et al. [ |
| Validation | Simulation results are compared with experimental measurements | See Figure |
| Timing | Simulation times ranged from 2.092 to 3.517 single CPU hours (2.7 GHz) | – |
| Source Description |
HEN_HOUSE input spectra data files: co60.spectrum (Co‐60) and mohan6.spectrum (6 MV) | Kawrakow et al. [ |
| Cross‐section data |
PEGLESS –mode Using silicone and Solid Water stoichiometric data |
Kawrakow See |
| Transport parameters |
Boundary crossing algorithm: EXACT Electron‐step algorithm: PRESTA‐II Photon cut‐off energy: 1 keV Electron cut‐off energy: 512 keV Spin effects: On Bremmstrahlung angular sampling: simple Bethe–Heitler Bremssrahlung cross‐sections: On | – |
| Variance reduction techniques | None | – |
| Scored quantities | Absorbed dose to medium | – |
| # Histories/statistical uncertainty | 7 × 109/ | – |
| Statistical methods | History‐by‐history | Kawrakow et al. [ |
| Postprocessing | None | – |
Uncertainty budget for dose value readings obtained with the Markus ionization chamber in both photon (Co‐60 and 6 MV) and 6 MeV electron beams
| Category of uncertainty | Source of uncertainty | Uncertainty (%) | Evaluation Type (A or B) | Remark |
|---|---|---|---|---|
| Measurement Setup | Front‐pointer setting | 0.03 | A | Measured |
| Field size setting | 0.02 | A | Measured | |
| Depth setting (drilling accuracy) | 0.17 | A | Measured | |
| Temperature and pressure variation | 0.01 | A | Measured | |
| Humidity change | 0.05 | A | Measured | |
| Silicone slab thickness variation (sag) | 0.26 | A | Measured | |
| Shutter error (for Co‐60 beams) | 0.00 | A | Measured shutter error is 3 ms | |
| Ionization chamber‐related |
| 0.50 | A | Obtained directly at the standard lab |
| Ionization chamber stability | 0.00 | A | Measured | |
| Leakage current | 0.05 | A | Measured | |
| Solid water phantom material variability | 0.70 | B | Source: AAPM TG‐51 Addendum [ | |
|
| 0.92 | |||
|
| 1.84 |
Uncertainty budget for net optical density readings obtained with EBT3 film in both photon (Co‐60 and 6 MV) and 6 MeV electron beams
| Uncertainty (%) | |||||
|---|---|---|---|---|---|
| Category of uncertainty | Source of uncertainty | Co‐60 beam | 6 MV and 6 MeV beams | Evaluation Type (A or B) | Remark |
| Measurement setup | Front‐pointer setting | 0.03 | 0.03 | A | Measured |
| Field size setting | 0.02 | 0.02 | A | Measured | |
| Depth setting (drilling accuracy) | 0.17 | 0.17 | A | Measured | |
| Temperature and pressure variation | 0.01 | 0.00 | A | Measured | |
| Humidity change | 0.05 | 0.00 | A | Measured | |
| Silicone slab thickness variation (sag) | 0.26 | 0.26 | A | Measured | |
| Shutter error (for Co‐60 beams) | 0.00 | 0.00 | A | Measured shutter error is 3 ms | |
| Ionization chamber‐related |
| 0.50 | 0.00 | A | Obtained directly at the primary standard lab |
| Ionization chamber stability | 0.00 | 0.00 | A | Measured | |
| Leakage current | 0.05 | 0.05 | A | Measured | |
| Solid water phantom material variability | 0.70 | 0.70 | B | Source: AAPM TG‐51 Addendum [ | |
| EBT3 Film‐related | Scanner uniformity | 0.28 | 0.28 | B | Source: Van Battum et al. [ |
| Lateral correction | 1.00 | 0.00 | A | Measured | |
| Calibration curve fitting | 0.50 | 0.30 | A | Measured | |
| Intra‐batch variations | 0.28 | 0.28 | A | Measured | |
| Background | 0.50 | 0.00 | A | Measured | |
| Energy dependence | 0.50 | 0.00 | B | Source: Van Battum et al. [ | |
| Angular dependence | 0.50 | 0.00 | B | Source: Van Battum et al. [ | |
| Intrinsic film homogeneity | 1.10 | 0.60 | B | Source: Van Battum et al. [ | |
|
| 2.06 | 1.11 | |||
|
| 4.12 | ||||
and values at 100 SAD and variable depths, in a Co‐60 photon beam from experimental measurements and MC simulations (DOSXYZnrc). Note that MC simulations were performed for a generic form of silicone, therefore the same simulation output data is provided for both types of silicone (E10 and E50)
|
|
| ||||
|---|---|---|---|---|---|
| Depth (cm) | Method | E10 Silicone | E50 Silicone | E10 Silicone | E50 Silicone |
|
|
| 0.943 ± 0.013 | 0.945 ± 0.013 | 0.951 ± 0.013 | 0.945 ± 0.013 |
|
| 0.950 ± 0.028 | 0.959 ± 0.028 | 1.009 ± 0.029 | 1.025 ± 0.030 | |
|
| 0.983 ± 0.004 | 0.990 ± 0.004 | |||
|
|
| 0.937 ± 0.013 | 0.935 ± 0.013 | 0.925 ± 0.013 | 0.932 ± 0.013 |
|
| 0.968 ± 0.028 | 0.983 ± 0.029 | 1.037 ± 0.030 | 1.018 ± 0.030 | |
|
| 0.991 ± 0.004 | 1.001 ± 0.004 | |||
and values at 100 cm SAD and two depths, in a 6 MV photon beam from experimental measurements, TPS‐CC calculations (using collapsed cone convolution algorithm), TPS‐MC (using Monaco's MC calculation algorithm) and MC simulations (DOSXYZnrc). Note that MC simulations and TPS calculations were performed for a generic form of silicone, therefore the same resulting output data are provided for both types of silicone (E10 and E50)
|
|
| ||||
|---|---|---|---|---|---|
| Depth (cm) | Method | E10 Silicone | E50 Silicone | E10 Silicone | E50 Silicone |
|
|
| 0.960 ± 0.012 | 0.961 ± 0.012 | 0.957 ± 0.012 | 0.953 ± 0.012 |
|
| 0.957 ± 0.012 | 0.964 ± 0.013 | 0.960 ± 0.013 | 0.957 ± 0.012 | |
|
| 0.970 ± 0.012 | 0.959 ± 0.012 | 0.998 ± 0.012 | 0.980 ± 0.012 | |
|
| 1.001 ± 0.011 | 0.998 ± 0.011 | |||
|
| 1.001 ± 0.008 | 0.999 ± 0.013 | |||
|
| 0.979 ± 0.003 | 1.009 ± 0.003 | |||
|
|
| 0.932 ± 0.012 | 0.947 ± 0.012 | 0.944 ± 0.012 | 0.939 ± 0.012 |
|
| 0.934 ± 0.012 | 0.954 ± 0.012 | 0.951 ± 0.012 | 0.948 ± 0.012 | |
|
| 0.948 ± 0.011 | 0.960 ± 0.012 | 0.995 ± 0.012 | 0.982 ± 0.012 | |
|
| 0.992 ± 0.018 | 0.996 ± 0.017 | |||
|
| 0.998 ± 0.018 | 0.996 ± 0.017 | |||
|
| 0.978 ± 0.003 | 1.009 ± 0.003 | |||
and values at 100 cm SAD and 1.5 cm depth, in a 6 MeV electron beams from experimental measurements and TPS‐MC (using Monaco's MC Calculation Algorithm). Note that TPS calculations were performed for a generic form of silicone, therefore the same calculation data are provided for both types of silicone (E10 and E50)
|
|
| ||||
|---|---|---|---|---|---|
| Depth (cm) | Method | E10 Silicone | E50 Silicone | E10 Silicone | E50 Silicone |
|
|
| 1.022 ± 0.013 | 1.001 ± 0.013 | 1.027 ± 0.013 | 1.000 ± 0.013 |
|
| 1.012 ± 0.013 | 0.992 ± 0.013 | 1.013 ± 0.013 | 0.988 ± 0.013 | |
|
| 1.003 ± 0.012 | 0.983 ± 0.012 | 1.041 ± 0.012 | 1.019 ± 0.012 | |
|
| 1.005 ± 0.005 | 0.988 ± 0.005 | |||
FIGURE 3Monte Carlo (MC, DOSXYZnrc) simulation results showing relative dose values around the interface of two phantom slabs when different configurations of material placements were used: top and bottom phantoms slabs are solid water (SW–SW), the top slab is molded silicone and the bottom slab is solid water (MS–SW), or the top and bottom slabs are molded silicone (MS–MS). Results are shown using a Co‐60 photon beam with a 1.5 cm top phantom slab thickness (a) and a 5.0 cm top phantom slab thickness (b), as well as for a 6 MV photon beam with a top phantom slab thickness of 1.5 cm (c), and a top phantom slab thickness of 5.0 cm (d). In all cases, the dose is presented relative to the dose at 100 cm source‐to‐axis distance (SAD) for the SW–SW setup at each respective depth and beam energy. The field size and SAD for all simulations were 10 × 10 cm2, and 100 cm, respectively, and all simulations yielded values with uncertainties below 0.3%. Dose ratios from film measurements made with silicone E10 and E50 types are also shown for comparison and are labeled as (film‐E10) or (film‐E50), for film measurements in each type of silicone material (E10 or E50)