| Literature DB >> 30603621 |
Kyung Sook Kim1,2, Se Jik Han2, Tae-Hee Lee3, Tae-Joon Park3, Samjin Choi1,2, Yoon-Goo Kang4, Ki-Ho Park4.
Abstract
OBJECTIVE: The aim of this study was to analyze the surface composition, roughness, and relative friction of metal clips from various ceramic self-ligating brackets.Entities:
Keywords: Rhodium coating; Self-ligating bracket; Surface roughness
Year: 2018 PMID: 30603621 PMCID: PMC6306314 DOI: 10.4041/kjod.2019.49.1.12
Source DB: PubMed Journal: Korean J Orthod Impact factor: 1.372
Figure 1Images of (A) the control group and (B–F) the experimental groups. The closed and open clips for each bracket are shown on the left and right, respectively. A, Mini-Clippy® (Tomy, Tokyo, Japan); B, Clippy-C® (Tomy); C, Empower clear® (American Orthodontics, Sheboygan, WI, USA); D, MACH® (World Bio Tech, Seongnam, Korea); E, QuicKlear® (Forestadent, Pforzheim, Germany); F, WOW-A® (Hubit, Uiwang, Korea).
Main chemical components of outer surface of each bracket clip obtained using SEM-EDS (units: wt.%)
SEM, Scanning electron microscopy; EDS, energy-dispersive X-ray spectroscopy; mC, mini-Clippy® (Tomy, Tokyo, Japan); CC, Clippy-C® (Tomy); EC, Empower clear® (American Orthodontics, Sheboygan, WI, USA); MA, MACH® (World Bio Tech, Seongnam, Korea); QK, QuicKlear® (Forestadent, Pforzheim, Germany); WA, WOW-A® (Hubit, Uiwang, Korea).
Main chemical components of inner surface of each bracket clip obtained using SEM-EDS (units: wt.%)
SEM, Scanning electron microscopy; EDS, energy-dispersive X-ray spectroscopy; mC, mini-Clippy® (Tomy, Tokyo, Japan); CC, Clippy-C® (Tomy); EC, Empower clear® (American Orthodontics, Sheboygan, WI, USA); MA, MACH® (World Bio Tech, Seongnam, Korea); QK, QuicKlear® (Forestadent, Pforzheim, Germany); WA, WOW-A® (Hubit, Uiwang, Korea).
Figure 2Optical microscopic images (left, 500×) and atomic force microscopy images (right) of the outer surfaces of A, mini-Clippy® (Tomy, Tokyo, Japan); B, Clippy-C® (Tomy); C, Empower clear® (American Orthodontics, Sheboygan, WI, USA); D, MACH® (World Bio Tech, Seongnam, Korea); E, QuicKlear® (Forestadent, Pforzheim, Germany); F, WOW-A® (Hubit, Uiwang, Korea).
Quantitative analysis of surface roughness of each bracket clip using AFM-Sa (nm)
Values are presented as mean ± standard deviation.
AFM, Atomic force microscopy; mC, mini-Clippy® (Tomy, Tokyo, Japan); CC, Clippy-C® (Tomy); EC, Empower clear® (American Orthodontics, Sheboygan, WI, USA); MA, MACH® (World Bio Tech, Seongnam, Korea); QK, QuicKlear® (Forestadent, Pforzheim, Germany); WA, WOW-A® (Hubit, Uiwang, Korea).
A one-way ANOVA was performed and the results were verified using Scheffe's post hoc test.
***p < 0.001 is considered statistically significant differences among the bracket groups.
A < B is considered a statistically significant difference for the outer surface of the bracket groups.
a < b < c is considered a statistically significant difference for the inner surface of the bracket groups.
Quantitative analysis of relative frictional resistance of each bracket clip using LFM-Fa (au)
Values are presented as mean ± standard deviation.
LFM, Lateral force microscopy; au, arbitrary unit; mC, mini-Clippy® (Tomy, Tokyo, Japan); CC, Clippy-C® (Tomy); EC, Empower clear® (American Orthodontics, Sheboygan, WI, USA); MA, MACH® (World Bio Tech, Seongnam, Korea); QK, QuicKlear® (Forestadent, Pforzheim, Germany); WA, WOW-A® (Hubit, Uiwang, Korea).
A one-way ANOVA was performed and the results were verified using Scheffe's post hoc test.
*p < 0.05, **p < 0.01 are considered statistically significant differences among the bracket groups.
A < B is considered a statistically significant difference for the outer surface of the bracket groups.
a < b considered a statistically significant difference for the inner surface of the bracket groups.
Figure 3Optical microscopic images (left, 500×) and atomic force microscopy images (right) of the inner surfaces of A, mini-Clippy® (Tomy, Tokyo, Japan); B, Clippy-C® (Tomy); C, Empower clear® (American Orthodontics, Sheboygan, WI, USA); D, MACH® (World Bio Tech, Seongnam, Korea); E, QuicKlear® (Forestadent, Pforzheim, Germany); F, WOW-A® (Hubit, Uiwang, Korea).
Figure 4A, Commercial atomic force microscopy (AFM) system (TT-AFM; Probes Inc., Seoul, Korea). B, A schematic of the AFM imaging system.