| Literature DB >> 27572721 |
G McMullan1, A R Faruqi1, R Henderson2.
Abstract
Direct electron detectors have played a key role in the recent increase in the power of single-particle electron cryomicroscopy (cryoEM). In this chapter, we summarize the background to these recent developments, give a practical guide to their optimal use, and discuss future directions.Keywords: CMOS; DDD; DQE; Direct Electron; Electron microscopy; FEI; Gatan; MTF; Sensor; cryoEM
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Year: 2016 PMID: 27572721 DOI: 10.1016/bs.mie.2016.05.056
Source DB: PubMed Journal: Methods Enzymol ISSN: 0076-6879 Impact factor: 1.600