Literature DB >> 10816267

Characterisation of the signal and noise transfer of CCD cameras for electron detection.

R R Meyer1, A I Kirkland.   

Abstract

Methods to characterise the performance of CCD cameras for electron detection are investigated with particular emphasis on the difference between the transfer of signal and noise. Similar to the Modulation Transfer Function MTF, which describes the spatial frequency dependent attenuation of contrast in the image, we introduce a Noise Transfer Function NTF that describes the transfer of the Poisson noise that is inevitably present in any electron image. A general model for signal and noise transfer by an image converter is provided. This allows the calculation of MTF and NTF from Monte-Carlo simulations of the trajectories of electrons and photons in the scintillator and the optical coupling of the camera. Furthermore, accurate methods to measure the modulation and noise transfer functions experimentally are presented. The spatial-frequency dependent Detection Quantum Efficiency DQE, an important figure of merit of the camera which has so far not been measured experimentally, can be obtained from the measured MTF and NTF. The experimental results are in good agreement with the simulations and show that the NTF at high spatial frequencies is in some cases by a factor of four higher than the MTF. This implies that the noise method, which is frequently used to measure the MTF, but in fact measures the NTF, gives over-optimistic results. Furthermore, the spatial frequency dependent DQE is lower than previously assumed. Copyright 2000 Wiley-Liss, Inc.

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Year:  2000        PMID: 10816267     DOI: 10.1002/(SICI)1097-0029(20000501)49:3<269::AID-JEMT5>3.0.CO;2-B

Source DB:  PubMed          Journal:  Microsc Res Tech        ISSN: 1059-910X            Impact factor:   2.769


  11 in total

1.  Initial evaluation of a direct detection device detector for single particle cryo-electron microscopy.

Authors:  Anna-Clare Milazzo; Anchi Cheng; Arne Moeller; Dmitry Lyumkis; Erica Jacovetty; James Polukas; Mark H Ellisman; Nguyen-Huu Xuong; Bridget Carragher; Clinton S Potter
Journal:  J Struct Biol       Date:  2011-09-10       Impact factor: 2.867

2.  Applications of direct detection device in transmission electron microscopy.

Authors:  Liang Jin; Anna-Clare Milazzo; Stuart Kleinfelder; Shengdong Li; Philippe Leblanc; Fred Duttweiler; James C Bouwer; Steven T Peltier; Mark H Ellisman; Nguyen-Huu Xuong
Journal:  J Struct Biol       Date:  2007-10-26       Impact factor: 2.867

3.  A charge coupled device camera with electron decelerator for intermediate voltage electron microscopy.

Authors:  Kenneth H Downing; Paul E Mooney
Journal:  Rev Sci Instrum       Date:  2008-04       Impact factor: 1.523

4.  Practical performance evaluation of a 10k × 10k CCD for electron cryo-microscopy.

Authors:  Benjamin E Bammes; Ryan H Rochat; Joanita Jakana; Wah Chiu
Journal:  J Struct Biol       Date:  2011-05-17       Impact factor: 2.867

5.  Characterization of a direct detection device imaging camera for transmission electron microscopy.

Authors:  Anna-Clare Milazzo; Grigore Moldovan; Jason Lanman; Liang Jin; James C Bouwer; Stuart Klienfelder; Steven T Peltier; Mark H Ellisman; Angus I Kirkland; Nguyen-Huu Xuong
Journal:  Ultramicroscopy       Date:  2010-03-25       Impact factor: 2.689

Review 6.  Multiscale observation of biological interactions of nanocarriers: from nano to macro.

Authors:  Su-Eon Jin; Jin Woo Bae; Seungpyo Hong
Journal:  Microsc Res Tech       Date:  2010-09       Impact factor: 2.769

7.  Ranking TEM cameras by their response to electron shot noise.

Authors:  Patricia Grob; Derek Bean; Dieter Typke; Xueming Li; Eva Nogales; Robert M Glaeser
Journal:  Ultramicroscopy       Date:  2013-01-29       Impact factor: 2.689

8.  Detective quantum efficiency of electron area detectors in electron microscopy.

Authors:  G McMullan; S Chen; R Henderson; A R Faruqi
Journal:  Ultramicroscopy       Date:  2009-05-07       Impact factor: 2.689

9.  Quantitative characterization of electron detectors for transmission electron microscopy.

Authors:  Rachel S Ruskin; Zhiheng Yu; Nikolaus Grigorieff
Journal:  J Struct Biol       Date:  2013-11-01       Impact factor: 2.867

10.  Comparison of optimal performance at 300keV of three direct electron detectors for use in low dose electron microscopy.

Authors:  G McMullan; A R Faruqi; D Clare; R Henderson
Journal:  Ultramicroscopy       Date:  2014-08-09       Impact factor: 2.689

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