| Literature DB >> 36065198 |
Shun Zhang1, Shuliang Liu1, Li Shen1, Shujuan Chen1, Li He1, Aiping Liu1.
Abstract
The quality and safety of wheat flour are of public concern since they are related to the quality of flour products and human health. Therefore, efficient and convenient analytical techniques are needed for the quality and safety controls of wheat flour. Near-infrared (NIR) spectroscopy has become an ideal technique for assessing the quality and safety of wheat flour, as it is a rapid, efficient and nondestructive method. The application of NIR spectroscopy in the quality and safety analysis of wheat flour is addressed in this review. First, we briefly summarize the basic knowledge of NIR spectroscopy and chemometrics. Then, recent advances in the application of NIR spectroscopy for chemical composition, technological parameters, and safety analysis are presented. Finally, the potential of NIR spectroscopy is discussed. Combined with chemometric methods, NIR spectroscopy has been used to detect chemical composition, technological parameters, deoxynivalenol, adulterants and additives of wheat flour. Furthermore, NIR spectroscopy has shown great potential for the rapid and online analysis of the quality and safety of wheat flour. It is anticipated that the current review will serve as a reference for the future analysis of wheat flour by NIR spectroscopy to ensure the quality and safety of flour products.Entities:
Keywords: Near-infrared spectroscopy; Nondestructive analysis; Quality; Safety; Wheat flour
Year: 2022 PMID: 36065198 PMCID: PMC9440252 DOI: 10.1016/j.crfs.2022.08.006
Source DB: PubMed Journal: Curr Res Food Sci ISSN: 2665-9271
Conventional methods for quality and safety parameters of wheat flour.
| Parameter | Methods | Reference |
|---|---|---|
| Protein | Kjeldahl method AACC 46-12, ICC 105-2, Dumas combustion AACC 46-30, ICC 167 | |
| Moisture | Gravimetric method, AACC 44-15A, ICC 110-1 | |
| Ash | Burning method, AACC 8-01, ICC 104-1 | |
| Rheological properties | Mixolab, Farinograph and Extensograph AACC54-21, AACC 56–61A, ICC 116-1 | |
| Wet gluten content | Automatic glutomatic machine method AACC 38-12A, ICC 137-1 | |
| Falling number | Hagberg-Perten method, AACC 56–81B, ICC 107-1 | |
| Additives | High-performance liquid chromatography; X-ray diffraction | |
| Deoxynivalenol | Liquid chromatography-mass spectrometry; enzyme-linked immunosorbent assay; thin-layer chromatography method AACC 45-41 |
Applications of NIR spectroscopy in the detecting of technological parameters of wheat flour.
| Parameters | Spectral range | Data analysis | Accuracy/Performance | Reference |
|---|---|---|---|---|
| Sedimentation | 400–2500 nm | MPLS | R2 = 0.6, SEP = 6.5 | |
| Hagberg Falling number | 4000–10000 cm−1 | PLSR | R2 = 0.982, RMSEV = 7.550 | |
| Swelling index | 4000–10000 cm−1 | PLSR | R2 = 0.874, RMSEV = 0.981 | |
| solvent retention capacity | 4000–10000 cm-1 | PLSR | R2 = 0.862, RMSEV = 0.846 |
Applications of NIR spectroscopy in chemical additive detection of wheat flour.
| Additives | Spectral range | Data analysis | Accuracy/Performance | Reference |
|---|---|---|---|---|
| talc content | 400–2500 nm | RBF | Rp = 0.9999, RMSEP = 0.0765, RPD = 65.0909 | |
| sodium hydroxymethanesulfonate | 12500–4000 cm−1 | LS-SVM | classification accuracy:92.0%–94.7%, detection limit = 1.5 mg/kg | |
| azodicarbonamide | 400–2498 nm | RBF | R = 0.99996, RMSEP = 0.5467, RPD = 116.5858 | |
| azodicarbonamide | 400–2500 nm | RF | R2 = 0.99814, RMSEP = 2.91345, RPD = 23.54332 | |
| talcum powder or benzoyl peroxide (BPO) | 900–1700 nm | two-band spectral analysis method | talcum powder and BPO powder under different depths of wheat flour were successfully detected | |
| benzoyl peroxide | 1000–2500 nm | PLSR | R2p = 1.000, SEP = 0.006% | |
| Talcum powder | 12500–4000 cm−1 | BP neural network | R2 = 0.9904, RMSEC = 0.8209, RMSEP = 1.8143 | |
| Kojic acid | 1000–2400 nm | PLS | R2 = 0.949–0.972, RMSE = 0.581%–0.830%, RPD = 4.171–4.830 |
Applications of NIR spectroscopy in adulterant detection of wheat flour.
| Species | Spectral range | Data analysis | Accuracy/Performance | Reference |
|---|---|---|---|---|
| durum wheat flour, common bread wheat flour | 400–2498 nm | PLS | sensibility of 0.5% | |
| cassava starch | 1100–2500 nm | PLSR | certified additive-free wheat flour: rpred = 0.977, RMSEP = 1.826 mg/kg, commercial wheat flour: rpred = 0.995, RMSEP = 1.004 mg/kg, | |
| sorghum, oat and corn flours | 400–1000 nm | MSPC | detection sensibility until 2.5% | |
| potato flour | 4000–10000 cm−1 | PLS | R2cv = 0.8865, RPD = 3.07 | |
| peanut powder | 935.61–1720.23 nm | PLSR | R2p = 0.993–0.991, | |
| unripe banana flour | 447–1005 nm | PLSR | R2c = 0.991; R2p = 0.993; RPD = 12.021, RMSEC = 2.226 g/kg, RMSEP = 1.993 g/kg | |
| Chilean flour samples | 1100–2000 nm | DPLS | correctly classified between 90% and 96% | |
| different origins and years wheat flour | 950–1650 nm | LDA | correct percentages of 100% and 73% |