Transition metal dichalcogenides have emerged as promising materials for nanophotonic resonators because of their large refractive index, low absorption within a large portion of the visible spectrum, and compatibility with a wide range of substrates. Herein, we use these properties to fabricate WS2 double-pillar nanoantennas in a variety of geometries enabled by the anisotropy in the crystal structure. Using dark-field spectroscopy, we reveal multiple Mie resonances, to which we couple WSe2 monolayer photoluminescence and achieve Purcell enhancement and an increased fluorescence by factors up to 240 for dimer gaps of 150 nm. We introduce postfabrication atomic force microscope repositioning and rotation of dimer nanoantennas, achieving gaps as small as 10 ± 5 nm, which enables a host of potential applications, including strong Purcell enhancement of single-photon emitters and optical trapping, which we study in simulations. Our findings highlight the advantages of using transition metal dichalcogenides for nanophotonics by exploring applications enabled by their properties.
Transition metal dichalcogenides have emerged as promising materials for nanophotonic resonators because of their large refractive index, low absorption within a large portion of the visible spectrum, and compatibility with a wide range of substrates. Herein, we use these properties to fabricate WS2 double-pillar nanoantennas in a variety of geometries enabled by the anisotropy in the crystal structure. Using dark-field spectroscopy, we reveal multiple Mie resonances, to which we couple WSe2 monolayer photoluminescence and achieve Purcell enhancement and an increased fluorescence by factors up to 240 for dimer gaps of 150 nm. We introduce postfabrication atomic force microscope repositioning and rotation of dimer nanoantennas, achieving gaps as small as 10 ± 5 nm, which enables a host of potential applications, including strong Purcell enhancement of single-photon emitters and optical trapping, which we study in simulations. Our findings highlight the advantages of using transition metal dichalcogenides for nanophotonics by exploring applications enabled by their properties.
Transition
metal dichalcogenides
(TMDs) have drawn large scientific and technological interest in the
past decade since the discovery of a direct band gap in monolayers
due to quantum confinement effects,[1] which
in conjunction with reduced dielectric screening leads to strongly
bound excitons.[2] These layered materials
found their way to research involving integration with nanophotonic
structures such as plasmonic and dielectric cavities to realize both
weak and strong coupling,[3−7] low-threshold lasing,[8] Purcell[9,10] and quantum efficiency enhancement[11] of
single-photon emitters (SPEs), as well as coupling to collective resonances
found in periodic structures.[12,13] In these studies, the
use of TMDs was limited to single- and few-layer samples focusing
on coupling emitted light from 2D semiconductors to resonances and
cavity modes in different material systems.[14]Alternatively, the fabrication of a photonic resonator from
a layered
material similar to TMDs was first achieved in hexagonal boron nitride
(hBN). Recent reports utilized electron beam induced and reactive
ion etching of hBN to fabricate suspended one- and two-dimensional
photonic crystal cavities as well as ring resonators, circular Bragg
gratings, and waveguides.[15,16] Moreover, hBN microcavity-like
structures have been shown to control the spontaneous emission rate
of excitons in MoS2 monolayers.[17] Microrotator structures, twisted with an atomic force microscope
(AFM) cantilever tip, have also been shown to facilitate the control
of second harmonic generation (SHG) enhancement in hBN[18] as well as the properties of electronic devices.[19] Photonic resonators fabricated in TMDs, however,
have only recently been reported even though these materials offer
a number of advantages. The refractive index of WS2 in
the visible range (n > 4)[20] is higher than that of hBN (n ≈ 2.1)[21] or other high-index dielectrics traditionally
used to fabricate nanophotonic resonators such as gallium phosphide
(n ≈ 3.5)[22] or
silicon (n ≈ 3.8).[22−25] TMDs also often maintain a sizable
transparency window in the visible[26] range
and offer advantages due to their layered nature, such as large optical
anisotropy[27] and adhesion to a large variety
of substrates owing to their van der Waals attractive forces.[28] These properties offer the possibility of producing
a highly contrasting refractive index boundary by deposition of TMD
crystals onto low refractive index materials such as SiO2,[29] thereby providing a straightforward
route to highly confined optical resonances.Recent reports
of TMD photonic structures have demonstrated strong
coupling using WS2 photonic crystals,[30] gratings,[31] nanoantenna resonators,[20] as well as TMD bulk flakes.[32] Waveguiding or quasi-waveguiding has also been achieved
in monolayer WS2 photonic crystals[33] and bulk TMD flakes.[27] TMD nanodisk Mie
resonators, hosting nonradiative anapole modes, have also been fabricated
to show second and third harmonic generation enhancement[34] and Raman scattering enhancement.[35] Numerical studies have explored the possibility
of entire optical circuits in TMDs, including rib waveguides, photonic
crystal cavities, and electro-optic modulators.[36] Further theoretical reports enable the realization of MoS2 nanoresonator modes[37] as well
as WS2 nanoantenna metasurface resonances[38] characterized as bound states in continuum.Photonic
structures with gaps smaller than 20 nm and a double-vertex
geometry are highly desirable because of the possibility of strong
confinement of electric and magnetic fields due to the boundary conditions
on the normal and parallel components of the electric field at a sharp
refractive index contrasting boundary.[39] The high fields are a prerequisite for large radiative rate enhancements
of emitters as evidenced from tip cavity structures in photonic crystal
nanobeam cavities[39] and plasmonic bowtie
antennas.[40] Incidentally, such large electric
field intensities can also lead to stable optical trapping and therefore
precise positioning of nanoparticles such as quantum dots or polystyrene
beads, which closely resemble the size and refractive index of large
proteins. This is due to an attractive Lorentz force in the direction
of an electromagnetic hotspot under optical excitation, which is dependent
on the particle size, refractive index, the input pump power, and
the energy confinement provided by the photonic environment.[41] Previous reports of nanoantenna optical trapping
utilize plasmonic resonators;[42] however,
they suffer from large changes in temperature leading to loss in stability
as well as quenching of emission due to increased optical absorption
processes.[25,43] Alternatively, dielectric nanoresonators,
such as silicon dimer nanoantennas,[25,44] can be advantageous
for optical trapping in different applications, including biological
nanoparticles at risk of degrading because of heating effects as well
as quantum dot positioning without emission quenching. The large field
confinement in closely spaced double-vertex structures, which is advantageous
for Purcell enhancement as well as optical trapping, may be achieved
in WS2 by using the etching anisotropy of the crystallographic
axes[45] and the weak van der Waals forces.In this work, we pattern nanoantenna structures into thin WS2 crystals. We exfoliate 25–500 nm thick flakes of WS2 onto a SiO2 substrate and utilize established
nanofabrication techniques such as electron beam lithography (EBL)
and reactive ion etching (RIE) to define submicrometer nanoantennas
with nanometer scale gaps. We observe that WS2 can be selectively
fabricated in circular, square, or hexagonal geometries with potentially
atomically sharp edges and vertices depending on the etching recipe
used. Dark-field spectroscopy of single (monomer) and double (dimer)
nanopillar resonators reveals geometric Mie resonances, which we compare
with finite-difference time-domain (FDTD) simulations. We transfer
a monolayer of WSe2 onto an array of fabricated dimer nanoantennas
and observe photoluminescence enhancement factors of more than 240
on the structures when compared to emission from regions on flat SiO2. We also observe polarization-dependent PL emission aligned
with the dimer axis and lifetime shortening by a factor of nearly
2, confirming the coupling of the WSe2 monolayer emission
to the photonic resonances of the nanoantennas and yielding a Purcell
factor lower bound of 1.85. Subsequently, we utilize contact mode
atomic force microscopy (AFM) as a postfabrication step to reposition
the constituent nanopillars of dimer nanoantennas achieving gaps of
10 ± 5 nm. We further numerically study the viability of utilizing
dimer nanoantennas for the enhancement of single-photon emission rates.
We simulate the electric field confinement as well as the Purcell
factor for an SPE positioned at the hotspots of the dimer nanoantenna
mode for gap sizes smaller than 20 nm, which we name ultrasmall. These
simulations yield electric field intensity enhancements of >103 compared to vacuum and Purcell factors of >150 for hexagonal
and square geometries. We subsequently numerically explore the prospect
of using WS2 dimer nanoantennas with ultrasmall gaps in
optical trapping. For the smallest experimentally achieved dimer gap,
we calculate attractive forces toward the electric field hotspots
of >350 fN for colloidal quantum dots (QDs) and >70 fN for polystyrene
beads (PBs) which closely emulate large proteins. Our experimental
and numerical studies of TMD material photonic resonators explore
different methods of radiative rate enhancement and optical trapping
which may lead to a scalable route of fabricating Purcell enhanced
SPEs for a variety of applications, including quantum computing and
communication.
Results and Discussion
Fabrication of Nanoantennas
WS2 consists
of covalently bonded monolayers (Figure a) with a hexagonal crystal structure held
together by van der Waals forces in bulk crystals. We mechanically
exfoliated WS2 flakes onto a 290 nm SiO2 on
silicon substrate with thicknesses ranging from 25 to 500 nm. Figure b shows a schematic
representation of the subsequent fabrication process. We spun a positive
resist onto the sample and patterned circular disks and squares with
varying radii using EBL. After development, we transferred the pattern
into the WS2 crystals with RIE using two different recipes.
Etching was terminated once the etch depth (estimated from the etching
rate and time) matched the thickness of the exfoliated crystal, defining
the nanoantenna height (see Methods). An anisotropic
etch using a mixture of CHF3 and SF6 gases along
with a high DC bias and low chamber pressure yielded circular nanopillars
with vertical sidewalls, which resulted from the physical etching
of the resist pattern into the WS2. Examples of completed
structures are shown in the AFM and scanning electron microscopy (SEM)
images in the upper row of Figure c.
Figure 1
Fabrication procedure for WS2 nanoantennas.
(a) Representation
of a top view of a single layer of WS2 found at the top
of a hexagonal nanoantenna at the position of the vertex. The zigzag
axis defines the edges of the structure because of its higher stability
as shown by the two bonds on outlying sulfur atoms when compared to
the armchair axis with its single bond for outlying sulfur atoms.
(b) Fabrication steps and their order following the black outline
arrows. The first step includes spinning of resist onto a WS2 flake. The second step is patterning and development after electron
beam lithography into a circular or square geometry. The final step
is reactive ion etching using either a more physical or chemical etching
recipe. The height (h) is defined by the thickness
of the original flake. The radius (r) is defined as the distance from
the center of the structure to an outside vertex for hexagonal and
square geometries. (c) AFM and SEM images of fabricated nanoantennas.
The left column shows 3D representations of AFM scans of circular,
hexagonal, and square nanoantennas in the upper, middle, and lower
row, respectively. Scale bars in AFM scans = 200 nm. The right column
shows SEM images of similar structures taken at a 60° tilt of
the sample. Scale bars in SEM images = 100 nm.
Fabrication procedure for WS2 nanoantennas.
(a) Representation
of a top view of a single layer of WS2 found at the top
of a hexagonal nanoantenna at the position of the vertex. The zigzag
axis defines the edges of the structure because of its higher stability
as shown by the two bonds on outlying sulfur atoms when compared to
the armchair axis with its single bond for outlying sulfur atoms.
(b) Fabrication steps and their order following the black outline
arrows. The first step includes spinning of resist onto a WS2 flake. The second step is patterning and development after electron
beam lithography into a circular or square geometry. The final step
is reactive ion etching using either a more physical or chemical etching
recipe. The height (h) is defined by the thickness
of the original flake. The radius (r) is defined as the distance from
the center of the structure to an outside vertex for hexagonal and
square geometries. (c) AFM and SEM images of fabricated nanoantennas.
The left column shows 3D representations of AFM scans of circular,
hexagonal, and square nanoantennas in the upper, middle, and lower
row, respectively. Scale bars in AFM scans = 200 nm. The right column
shows SEM images of similar structures taken at a 60° tilt of
the sample. Scale bars in SEM images = 100 nm.Upon substitution of the CHF3 with additional SF6 gas, a reduction of the DC bias, and an increase in the chamber
pressure, the resulting nanoantennas exhibited a hexagonal geometry
with a radius defined from the center of the structure to one of the
vertices at the edge, as shown in the middle right panel of Figure b. This definition
corresponds to the radius of the previously circular resist pattern.
The physical etching mechanism was suppressed, and the increased proportion
of reactive fluorine radicals ensured a dominant chemical etch, which
preferentially removed the WS2 crystal in the armchair
crystal axis leading to zigzag terminated sidewalls at 120° angles
to each other following the crystal symmetry. This agrees with DFT
results, which also predict that zigzag edges are more stable.[46,47] The AFM and SEM images in the middle row of Figure c display an example of hexagonal nanoantennas.The final geometry we achieved was that of a square, which resulted
from a combination of resist patterning and chemical etching of the
WS2. We defined a square resist pattern with sides oriented
parallel to the zigzag axis of the crystal. The subsequent chemical
etching similarly removed the WS2 in the armchair crystal
axes, ultimately leading to 90° angles describing a square shaped
nanoantenna, examples of which are displayed in the lower panels of Figure c. The hexagonal
geometry and, in part, the square nanoantenna geometry are formed
because of the relative stability of the zigzag axis and can therefore
lead to atomically sharp vertices.
Photonic Resonances of
WS2 Nanoantennas
We studied the fabricated structures
using dark-field spectroscopy
and compared the experimental results to FDTD simulations, which yielded
close agreement. We identified an electric dipole resonance with small
contributions from higher-order modes as well as anapole and higher-order
anapole modes (see Supporting Information 1). As expected from Mie theory, the resonances forming in the studied
nanoantennas red-shifted with increasing radius and blue-shifted with
decreasing height. The ability to change the geometry of nanoantennas
through the choice of etching recipe provides an additional, more
precise tuning mechanism for the observed resonances (see Supporting Information 2).Next we considered
more complex architectures by placing a pair of hexagonal nanopillars
in close proximity to form a dimer nanoantenna, as shown schematically
in the left panel of Figure a. An SEM image of a fabricated structure is also displayed
in the right panel of Figure a. Dark-field spectra of dimer nanoantennas also exhibit scattering
Mie resonances as well as anapole modes which red-shift with increasing
size (see Supporting Information 3). However,
when two single nanopillars are placed in close proximity to form
a dimer, their photonic resonances hybridize forming two cross-polarized
modes with an energy splitting (see Supporting Information 4). One of these modes is excited with a polarization
parallel to the axis connecting the midpoints of the single nanopillars
(dimer axis), which we name the X-pol mode, while the other is excited
perpendicularly, here named the Y-pol mode. An intriguing result from
this hybridization is the increased electric field intensity surrounding
the side-walls of the nanoantennas. For the X-polarized mode, high
electric field intensity hotspots form in the gap separating the two
nanopillars, as shown in the upper panel of Figure b. For the Y-polarized mode, these hotspots
form at the upper and lower wall of each nanopillar, as shown in the
lower panel of Figure b. This confinement of the electric field intensity is expected to
induce a large density of optical states, suggesting that these nanoantennas
are advantageous for Purcell enhancement of emission.
Figure 2
PL emission enhancement
from monolayer WSe2 on WS2 hexagonal dimer nanoantennas.
(a) Left panel: Schematic illustration
of a hexagonal dimer nanoantenna. Right panel: SEM image of the top
view of a fabricated hexagonal dimer nanoantenna. (b) Top view spatial
distributions of the simulated electric field intensity 0.5 nm from
the top surface of a WS2 dimer nanoantenna with a radius
of 165 nm, a gap of 200 nm, and a height of 135 nm. Incident plane
wave polarization is parallel to the double white arrow in the upper
left corner of each panel. Hotspots of high electric field intensity
form on the edges toward the gap and away from it in the upper panel
(X-pol mode). Hotspots form at upper and lower edges of the nanostructure
in the lower panel (Y-pol mode), yielding less confinement for this
plane wave polarization. Axes (x, y) indicate cross-sectional surface similar to that in the right panel
of a. Dashed white outlines represent the physical edges of the structures.
Scale bars = 100 nm. (c) Photoluminescence microscope image overlaid
on a bright field microscope image showing a map of the studied sample
including the monolayer region. Bright emission is observed at nanoantenna
sites. Inset: Magnified PL image of NA1 showing that bright
emission regions follow the outline of the nanoantenna geometry. (d)
Dark-field scattering spectra for three exemplary nanoantennas shown
with colored circles in panel c. Photoluminescence spectra from the
WSe2 monolayer on the nanoantenna sites (red) as well as
from a flat region on SiO2 (black) are displayed as well.
The PL intensity on all nanoantenna sites is enhanced compared to
that from flat SiO2. The overlap between the scattering
resonances and the monolayer PL spectrum from the nanoantenna sites
suggests enhanced emission. (e) Excitation polarization-dependent
integrated PL measured at the three nanoantenna sites. Degrees of
linear polarization are shown on the left side of each curve. All
nanoantennas exhibit a polarization dependence, which is aligned to
the dimer axis suggesting coupling between the monolayer emission
and the nanoantenna resonances. The intensity is normalized to that
from a flat monolayer on SiO2 and vertically offset for
illustration purposes. (f) Photoluminescence decay measured from the
monolayer at each nanoantenna site and on bulk WS2 crystal.
The measured lifetimes are as follows: WS2, 1.78 ±
0.08 ns; NA1, 1.34 ± 0.02 ns; NA2, 0.96
± 0.01 ns; NA3, 1.45 ± 0.02 ns. Reduced lifetimes
on nanoantennas suggests Purcell enhancement of emission.
PL emission enhancement
from monolayer WSe2 on WS2 hexagonal dimer nanoantennas.
(a) Left panel: Schematic illustration
of a hexagonal dimer nanoantenna. Right panel: SEM image of the top
view of a fabricated hexagonal dimer nanoantenna. (b) Top view spatial
distributions of the simulated electric field intensity 0.5 nm from
the top surface of a WS2 dimer nanoantenna with a radius
of 165 nm, a gap of 200 nm, and a height of 135 nm. Incident plane
wave polarization is parallel to the double white arrow in the upper
left corner of each panel. Hotspots of high electric field intensity
form on the edges toward the gap and away from it in the upper panel
(X-pol mode). Hotspots form at upper and lower edges of the nanostructure
in the lower panel (Y-pol mode), yielding less confinement for this
plane wave polarization. Axes (x, y) indicate cross-sectional surface similar to that in the right panel
of a. Dashed white outlines represent the physical edges of the structures.
Scale bars = 100 nm. (c) Photoluminescence microscope image overlaid
on a bright field microscope image showing a map of the studied sample
including the monolayer region. Bright emission is observed at nanoantenna
sites. Inset: Magnified PL image of NA1 showing that bright
emission regions follow the outline of the nanoantenna geometry. (d)
Dark-field scattering spectra for three exemplary nanoantennas shown
with colored circles in panel c. Photoluminescence spectra from the
WSe2 monolayer on the nanoantenna sites (red) as well as
from a flat region on SiO2 (black) are displayed as well.
The PL intensity on all nanoantenna sites is enhanced compared to
that from flat SiO2. The overlap between the scattering
resonances and the monolayer PL spectrum from the nanoantenna sites
suggests enhanced emission. (e) Excitation polarization-dependent
integrated PL measured at the three nanoantenna sites. Degrees of
linear polarization are shown on the left side of each curve. All
nanoantennas exhibit a polarization dependence, which is aligned to
the dimer axis suggesting coupling between the monolayer emission
and the nanoantenna resonances. The intensity is normalized to that
from a flat monolayer on SiO2 and vertically offset for
illustration purposes. (f) Photoluminescence decay measured from the
monolayer at each nanoantenna site and on bulk WS2 crystal.
The measured lifetimes are as follows: WS2, 1.78 ±
0.08 ns; NA1, 1.34 ± 0.02 ns; NA2, 0.96
± 0.01 ns; NA3, 1.45 ± 0.02 ns. Reduced lifetimes
on nanoantennas suggests Purcell enhancement of emission.
WSe2 Monolayer Photoluminescence Enhancement
In order to investigate whether these nanostructures can be used
for such an application, we transferred a monolayer of WSe2 onto an array of WS2 dimer nanoantennas with a varying
radius and gap distance using an all-dry technique (see Methods). A photoluminescence (PL) image of the completed
sample is shown in Figure c. The brighter emission surrounding the nanoantenna sites
is a first indication of the enhanced PL emitted by the monolayer
due to an interaction with the dimer nanoantennas. The shape of this
bright emission follows the outer walls of the nanoantennas, as seen
in the inset of Figure c, similar to the calculated higher electric field intensity regions
shown in Figure b.In order to experimentally evaluate the photonic response of the
structures, we subsequently measured the dark-field spectra of three
nanoantennas with a monolayer of WSe2 on top. These are
displayed in Figure d together with PL emission from the monolayer measured at each nanoantenna
site. These structures have a height of 135 nm, a gap of 150 nm, as
well as a range of radii (NA1, r = 235
nm; NA2, r = 185 nm; NA3, r = 120 nm), representing an exemplary set of the measured
nanoantennas from our sample, which included 86 dimers with nominal
geometries corresponding to one of the three presented here. The overlap
between the scattering Mie resonances and the PL spectrum suggests
that all of the nanostructures may induce some emission enhancement;
however, the strongest effect is expected from dimer NA2.We subsequently carried out detailed room-temperature photoluminescence
measurements in a micro-PL setup in order to study the enhanced emission
from the WSe2 monolayer in more detail. The excitation
source, a pulsed laser (80 MHz) at 638 nm, was chosen to be below
the WS2 absorption edge so that it would be absorbed only
in the WSe2 monolayer and not in the nanoantennas. The
spectra recorded at the position of the three dimer nanoantennas are
displayed in Figure d (red). These are compared to a PL spectrum measured from a flat
portion of monolayer on SiO2 shown in black. The red-shift
of the PL spectrum observed here is due to strain in the monolayer
as it conforms to the nanoantenna geometry, which however provides
only a negligible contribution to the large photoluminescence enhancement
observed here as evidenced by a lack of brightening at the edges of
the unpatterned bulk WS2 crystal regions in Figure c where the WSe2 monolayer is also strained.[48] This suggests
that the WS2 dimer nanoantenna platform is ideal to study
strain effects in monolayer TMDs similar to dimers fabricated from
other dielectrics.[11,48] The luminescence intensity from
the monolayer at the nanoantenna positions is 3.5–4 times brighter.
As the excitation spot is much larger than the nanostructures, we
defined an experimental enhancement factor ⟨EF⟩, similar
to that in ref (7),
in order to estimate the enhanced PL intensity:where ID and are the spectrally
integrated PL intensity
measured on each dimer nanoantenna and on the flat SiO2 substrate, respectively. The area of each dimer nanoantenna and
the area of the laser spot are represented as AD and respectively. Using this definition, we
calculated enhancement factors of 120, 235, and 241 for nanoantennas
NA1, NA2, and NA3 respectively, when
compared to a flat monolayer on the SiO2 substrate. If
monolayer emission from positions on bulk WS2 (seen at
the left edge of Figure c) rather than on flat SiO2 is used for comparison, the
enhancement factors are estimated to be 246, 486, and 533 for nanoantennas
NA1, NA2 and NA3, respectively. This
is due to the lower monolayer PL on bulk WS2 when compared
to flat SiO2, which we largely attribute to charge transfer
between the WSe2 and WS2 crystal.[49] We also compared the experimental ⟨EF⟩
to simulations of the maximum fluorescence intensity enhancement in
the vicinity of dimer nanoantennas with the same geometry and found
order of magnitude agreement (see Supporting Information 5).Another method of probing the photonic enhancement
of the WSe2 emission due to the nanoantennas is to induce
a linear polarization
in the excitation source and rotate this with respect to the dimer
axis. As the electric field intensity surrounding the nanoantennas
is higher for the X-pol mode when compared to the Y-pol mode, which
can be observed in Figure b, the PL intensity is also expected to increase for this
polarization. In this experiment, the integrated intensity at each
polarization angle was normalized to that from a monolayer region
on flat SiO2, defined as ID(θ)/ISiO(θ),
so as to highlight the effect of the nanoantenna photonic resonances.
The results are shown in Figure e where all structures yield a degree of linear polarization
of the photoluminescence, shown on the left of each plot, confirming
the coupling of the emission to the nanoantenna resonances. Further
evidence of photonic enhancement of the WSe2 monolayer
due to an enhanced electric field intensity can be extracted from
a comparison of absorption spectra measured at the position of the
nanoantennas as well as on the flat SiO2 substrate (see Supporting Information 6).The last experiment
performed in order to study the photonic enhancement
of WSe2 monolayer emission due to the WS2 dimer
nanoantennas was a measurement of the PL decay time, displayed in Figure f. For this study,
an avalanche photodiode was used as a detector with an instrument
response function (IRF, gray) defined by the laser pulse (∼90
ps). A very low excitation power density of 0.02 μJ/cm2 was used in order to avoid exciton–exciton annihilation processes,
which dominate in these materials at higher powers.[50] The results yield single exponential decay lifetimes, which
consist of contributions from both radiative and nonradiative recombination
rates. An increase in the radiative rate due to photonic enhancement
will lead to a decrease in the emission lifetime as this component
is shortened. The intrinsic WSe2 monolayer PL lifetime
at room temperature measured from the monolayer on the WS2 bulk crystal was τ = 1.78 ± 0.08 ns. The PL decay times
measured for NA1, NA2, and NA3 are
τ1 = 1.34 ± 0.02 ns, τ2 = 0.96
± 0.02 ns, and τ3 = 1.45 ± 0.02 ns, respectively.
These are lower than that measured on the bulk crystal, suggesting
the presence of Purcell enhancement. If we assume that the nonradiative
rate contribution to the lifetime is low, we can extract Purcell factors
of 1.33, 1.85, and 1.23 for NA1, NA2, and NA3, respectively. However, previous measurements of the quantum
efficiency of WSe2 monolayers report values ranging from
0.06% to 5%;[51−53] therefore, the nonradiative recombination rate is
much higher than the radiative. As the Purcell factor affects only
the radiative component of the lifetime, the values extracted above
are only lower bounds on the spontaneous emission enhancement factor,
which may be much higher. The upper bound of the Purcell factor can
be extracted from FDTD simulations, which yield a factor of nearly
40 for the geometry of NA2 (see Supporting Information 5). As suggested by the higher overlap of the PL
emission with the scattering resonances of the nanoantenna, the shortest
PL lifetime was measured for NA2 where the highest Purcell
enhancement is expected. This suggests that the enhancement factor
can be modulated by tuning the dimer nanoantenna resonances closer
or further from the PL emission energy of the monolayer (see Supporting Information 5). We also varied the
linear polarization of the excitation source and measured the PL decay
time for the X-pol and Y-pol modes. For the majority of the measured
nanoantenna sites, the X-pol mode yielded a lower lifetime than the
Y-pol mode (see Supporting Information 7) as expected from the higher simulated electric field intensities,
in Figure b, and therefore
higher Purcell factors.As further evidence of the photonic
capabilities of WS2 dimer nanoantennas, we performed second
harmonic generation enhancement
experiments using an anapole resonance present in 60 nm high nanoantennas
with a radius of 205 nm and a gap of 130 nm. The anapole resonance
at a wavelength of 800 nm led to confinement of the excitation laser
and a 7.2 times enhanced SHG signal when compared with bulk crystal.
The enhancement also proved to be polarization-dependent in dimer
nanoantennas, as opposed to monomers, as the electric fields are confined
outside (inside) the nanostructure geometry for the X-pol (Y-pol)
anapole mode. This behavior was confirmed by simulations of the confined
electric energy, which also reveal that the SHG enhancement polarization
orientation can be rotated with a change in excitation wavelength
and its degree of linear polarization can be modulated with an increase
in dimer gap (see Supporting Information 8).
AFM Repositioning
The fabrication procedure outlined
in Figure yields
minimum dimer separation gaps of 50 nm, which result in resonances
with limited electric field intensity and therefore Purcell factors.
We attempted to improve upon this by using the properties of layered
materials to our advantage. The relatively weak van der Waals forces,
which facilitate mechanical exfoliation of thin WS2 crystals,
also allow for a weak adhesion of the fabricated structures to the
SiO2/Si substrate. As a postfabrication procedure, we employed
an AFM cantilever in order to translate one nanopillar with respect
to the other and achieve gaps as small as 10 nm without damaging the
nanoantenna. Smaller separation distances may be achievable; however,
the accurate measurement of the gap width is a considerable challenge
because of the finite size of the cantilever tip, which ranges from
1 to 10 nm.Nanoantennas were repositioned by using AFM in contact
mode. Scanning parallel to the dimer axis in a small area immediately
adjacent to one nanopillar with the scan slightly overlapping the
distal edge of the nanoantenna forced the cantilever tip to displace
the structure closer to the other. A schematic representation of the
translation is shown in Figure a. Very fine positioning can be achieved using this method
as shown in Figure b, where we translated one nanopillar with respect to the other,
reducing the dimer gap separation from 105 nm to 15 ± 5 nm.
Figure 3
AFM repositioning
of dimer nanoantennas. (a) Schematic illustration
of the scanning technique used in contact mode AFM to translate and
rotate single nanopillars of the dimer nanoantenna. (b) AFM scan of
a dimer structure (r = 140 nm, h = 170 nm, gap = 105 nm) before and after manipulation. The dimer
gap is reduced to 15 nm, and one pillar is rotated by 8° in order
to position inside vertices closer to each other. (c) Dark-field scattering
spectra of the dimer-nanoantenna for excitation parallel to the dimer
axis (as shown in the inset) before and after repositioning compared
to a simulated scattering cross section with gaps of 105 and 15 nm.
AFM repositioning
of dimer nanoantennas. (a) Schematic illustration
of the scanning technique used in contact mode AFM to translate and
rotate single nanopillars of the dimer nanoantenna. (b) AFM scan of
a dimer structure (r = 140 nm, h = 170 nm, gap = 105 nm) before and after manipulation. The dimer
gap is reduced to 15 nm, and one pillar is rotated by 8° in order
to position inside vertices closer to each other. (c) Dark-field scattering
spectra of the dimer-nanoantenna for excitation parallel to the dimer
axis (as shown in the inset) before and after repositioning compared
to a simulated scattering cross section with gaps of 105 and 15 nm.An additional advantage of using this repositioning
method is the
ability to rotate the nanopillars with great precision (<1°).
As shown in the lower panel of Figure b, by scanning the AFM cantilever along a tangent of
one of the nanopillars and contacting with only the edge, it was rotated
by over 8°. Scanning closer to the midpoint of the nanopillar
translated it closer to the other. These methods of contacting the
AFM tip with the nanopillars allow for fine positioning of the inside
vertices of the dimer. The repositioning procedure is iterative and
entirely reversible, allowing alignment to be fine-tuned or completely
changed as necessary. Further AFM scans of repositioned nanoantennas
are displayed in Supporting Information 9, confirming the reproducibility of the procedure and showing the
minimum gap separation we have achieved (10 ± 5 nm).To
confirm that the AFM repositioning modified the photonic response,
we performed dark-field spectroscopy before and after the translation
procedure. As shown in Figure c, the dipole resonance seen in scattering increased after
repositioning for an excitation parallel to the dimer axis, which
is the most sensitive configuration to changes in gap separation.
The dashed curves in the same figure represent simulations of the
geometry before and after repositioning with close agreement to experiment
supporting the achievement of a 15 nm gap.
Electric Field and Purcell
Enhancement of Emission
Ultrasmall gaps, such as those achieved
with the AFM repositioning
technique, are expected to provide very high electric field confinements.[39] We therefore simulated the electric field intensity
and Purcell enhancement induced by three dimer designs, corresponding
to the different geometries shown in Figure , with a gap of 10 nm. Each design was optimized
for electric field confinement at the top surface of the dimer.The electric field intensity spatial distribution is shown 0.5 nm
above the top surface of the dimers in the left column of Figure a and as a cross-sectional
cut along the z-axis through the middle of the individual
nanopillars in the right column of Figure a. Each distribution was calculated at the
wavelength of the maximum electric field intensity (751.5, 749.5,
and 697.5 nm for the circular, hexagonal, and square geometries, respectively).
The radii of the optimized geometries are r = 225
nm, r = 240 nm, and r = 260 nm for
the circular, hexagonal, and square geometries, respectively, while
their heights are h = 200 nm, h =
200 nm, and h = 150 nm. In order to closely approximate
realistic structures, which can be fabricated, we measured the radius
of curvature of the vertices of fabricated hexagonal and square dimer
nanoantennas using atomic force microscopy. This yielded vertex radii
of curvature as low as 22 nm for the hexagonal and 10 nm for the square
geometry (see Supporting Information 10). These values were then subsequently taken into account in the
simulation of the hexagonal and square geometries. The electric field
hotspots forming at the vertices between the two nanopillars for an
incident plane wave polarized parallel to the dimer axis exhibit intensities
of more than 103 compared to vacuum as shown in Figure a. We compare the
hotspots simulated for the three geometries achievable through the
fabrication process. The hexagonal and square shaped nanoantennas
induce a higher electric field intensity confinement than the circular
design, with the hexagonal geometry inducing the largest enhancement.
Smaller vertex radii of curvature for the latter two geometries, which
may be achievable with the chemical etching recipe discussed earlier,
are expected to yield even higher electric field intensity enhancements
(see Supporting Information 10).
Figure 4
Simulations
of the electric field hotspots and Purcell enhancement
for single-photon emission. (a) Top-view and side-view spatial distributions
of the electric field intensity in and surrounding optimized designs
of each geometry of WS2 dimer nanoantenna at 10 nm separation
gap. Circular design: r = 225 nm, h = 200 nm, wavelength = 751.5 nm. Hexagonal design: r = 240 nm, h = 200 nm, radius of curvature of vertices
= 22 nm, wavelength = 749.5 nm. Square design: r =
260 nm, h = 150 nm, radius of curvature of vertices
= 10 nm, wavelength = 697.5 nm. Hotspots of electric field confinement
form at inner and outer edges of the dimer. Incident plane wave polarization
(X-pol) is parallel to the double white arrow in the upper left corner
of the panels. Axes indicate cross section with (x, y) indicating a surface 0.5 nm above the top of
the dimer and (x, z) indicating
a vertical cut through the dimer axis. Dashed white outlines represent
the physical edges of the structures. Scale bars = 100 nm. (b) Purcell
enhancement for a dipole placed at different positions with polarization
parallel to the dimer axis, 0.5 nm above the top surface of the structures.
Solid dots and curves indicate dimers with a gap of 10 nm, and dashed
curves indicate dimers with a gap of 50 nm. Placement positions of
the dipole above the dimer are shown as solid white lines in panel
a.
Simulations
of the electric field hotspots and Purcell enhancement
for single-photon emission. (a) Top-view and side-view spatial distributions
of the electric field intensity in and surrounding optimized designs
of each geometry of WS2 dimer nanoantenna at 10 nm separation
gap. Circular design: r = 225 nm, h = 200 nm, wavelength = 751.5 nm. Hexagonal design: r = 240 nm, h = 200 nm, radius of curvature of vertices
= 22 nm, wavelength = 749.5 nm. Square design: r =
260 nm, h = 150 nm, radius of curvature of vertices
= 10 nm, wavelength = 697.5 nm. Hotspots of electric field confinement
form at inner and outer edges of the dimer. Incident plane wave polarization
(X-pol) is parallel to the double white arrow in the upper left corner
of the panels. Axes indicate cross section with (x, y) indicating a surface 0.5 nm above the top of
the dimer and (x, z) indicating
a vertical cut through the dimer axis. Dashed white outlines represent
the physical edges of the structures. Scale bars = 100 nm. (b) Purcell
enhancement for a dipole placed at different positions with polarization
parallel to the dimer axis, 0.5 nm above the top surface of the structures.
Solid dots and curves indicate dimers with a gap of 10 nm, and dashed
curves indicate dimers with a gap of 50 nm. Placement positions of
the dipole above the dimer are shown as solid white lines in panel
a.Furthermore, we evaluated the
Purcell factor for a single-photon
source positioned onto these structures by simulating a dipole emitter
at positions along the dimer axis with a polarization parallel to
the same axis. It is displaced by 0.5 nm from the top surface of the
structure, and its emission wavelength was set to the one used for
the respective geometry in Figure a. The calculated Purcell factors at each position
are shown in Figure b. Solid white lines in the left panels of Figure a indicate the simulated positions of the
emitter. The maxima seen at positions corresponding to the inner edges
of the nanoantenna yield the largest results (>100) as expected
from
the electric field hotspots seen in Figure a. Weakly confined hotspots at the outside
edges of the structure also exhibit local maxima in the Purcell factor
with values as high as 20. For the minimum achieved gap separation
in the postfabrication AFM repositioning, the hexagonal geometry exhibits
the highest Purcell factor within its hotspot (157) with the square
as a close second (153). The circularly shaped dimer leads to a maximal
Purcell factor of 105. We have also simulated the Purcell factors
for the minimum gap separation achievable without the use of AFM repositioning
(50 nm), which are shown in Figure b as dashed curves. This yields much smaller Purcell
enhancements (as high as 46). There are several degrees of freedom
in the fabrication process that can be used to modulate both the electric
field intensity and the Purcell enhancements expected for these dimer
structures. One method is to vary the gap separation of the dimer,
leading to an exponential decrease in the electric field intensity
and Purcell factor by 1 order of magnitude for a gap of 100 nm when
compared to a gap of 10 nm. A similar decrease in both factors can
also be achieved by rotation of one nanopillar with respect to the
other (see Supporting Information 11).
Such modulations can be experimentally achieved through the use of
nanofabrication techniques or AFM repositioning.
Dimer Nanoantenna
Optical Trapping
In order to study
the potential of ultrasmall gap WS2 dimer nanoantennas
for optical trapping, we perform numerical simulations based on the
finite element method (FEM) to determine the Maxwell stress tensor
(MST) and calculate the force exerted on small dielectric particles.
The simulation geometry consists of the earlier optimized hexagonal
nanoantenna with the addition of a nanosphere (r =
5 nm) with a refractive index corresponding to either an approximated
colloidal quantum dot (n = 2.4)[44] or a polystyrene bead (n = 1.6), which
closely mimics the refractive index and size of a large protein.[54] Because optical trapping experiments often require
a suspension of the nanoparticles in a solution, we set the background
refractive index to that of water. For all simulations, we use an
experimentally feasible pump power density of 10 mW/μm2. A schematic representation of the simulation is shown in Figure a.
Figure 5
Optical trapping simulations
of nanoparticles using WS2 hexagonal nanoantennas. (a)
Schematic illustration of optical trapping
of a nanoparticle in water through the use of WS2 hexagonal
dimer nanoantenna hotspots. (b and c) Comparison of the optical force
for a spherical nanoparticle (r = 5 nm) placed in
the middle of the dimer nanoantenna (r = 240 nm, h = 200 nm) gap, along the z-axis for gaps
of 10 and 15 nm. The trapping force is calculated at the wavelength
of its maximum value for a QD (b) (763 nm) and a PB (c) (755 nm).
Insets illustrate the positioning of the respective nanoparticle with
the zero position at the top surface of the nanoantenna. (d) Maximum
optical force applied to a QD (purple) and a PB (yellow) at the top
surface of a dimer nanoantenna (r = 240 nm, h = 200 nm) with a varying gap separation. (e and f) Attractive
force distribution for a nanoparticle in a plane 5 nm from the top
surface of a dimer nanoantenna (r = 240 nm, h = 200 nm, g = 10 nm) centered at the
gap. The trapping force is calculated at the wavelength of its maximum
value for a QD (e) (763 nm) and a PB (f) (755 nm). The double white
arrow in the upper left portion of the figure identifies the pump
polarization along the dimer axis (X-pol). Dashed white lines identify
the physical edges of the structure. Inset schematics highlight the
position of the plane over which the optical force is simulated. Maximum
force values coincide with the electric field hotspots. Input pump
power density used for all simulations is 10 mW/μm2.
Optical trapping simulations
of nanoparticles using WS2 hexagonal nanoantennas. (a)
Schematic illustration of optical trapping
of a nanoparticle in water through the use of WS2 hexagonal
dimer nanoantenna hotspots. (b and c) Comparison of the optical force
for a spherical nanoparticle (r = 5 nm) placed in
the middle of the dimer nanoantenna (r = 240 nm, h = 200 nm) gap, along the z-axis for gaps
of 10 and 15 nm. The trapping force is calculated at the wavelength
of its maximum value for a QD (b) (763 nm) and a PB (c) (755 nm).
Insets illustrate the positioning of the respective nanoparticle with
the zero position at the top surface of the nanoantenna. (d) Maximum
optical force applied to a QD (purple) and a PB (yellow) at the top
surface of a dimer nanoantenna (r = 240 nm, h = 200 nm) with a varying gap separation. (e and f) Attractive
force distribution for a nanoparticle in a plane 5 nm from the top
surface of a dimer nanoantenna (r = 240 nm, h = 200 nm, g = 10 nm) centered at the
gap. The trapping force is calculated at the wavelength of its maximum
value for a QD (e) (763 nm) and a PB (f) (755 nm). The double white
arrow in the upper left portion of the figure identifies the pump
polarization along the dimer axis (X-pol). Dashed white lines identify
the physical edges of the structure. Inset schematics highlight the
position of the plane over which the optical force is simulated. Maximum
force values coincide with the electric field hotspots. Input pump
power density used for all simulations is 10 mW/μm2.We explore the optical force applied
to the QD and the PB, shown
in panels b and c of Figure , respectively, as they are translated along the z-axis in the middle of the dimer gap. We simulate the forces for
two gap separations of the dimer hexagonal nanoantenna (10 and 15
nm) and observe an attractive (negative) force, which is maximized
at the top surface of the nanoantenna where the electric field hotspots
are formed. We observe a maximum optical force of 353 fN on the QD
and 73 fN on the PB for the dimer nanoantennas with a 10 nm separation.
For the larger dimer gap (15 nm), this reduces to 123 fN on the QD
and 31 fN on the PB. We also study the dependence of this maximum
optical force in the electric field hotspots on the dimer gap, which
is varied from 10 to 50 nm. As shown in Figure d, the maximum attractive force imparted
on the nanoparticles decreases exponentially by 1 order of magnitude
as expected from the decay of the electric field intensity with an
increased separation (see Supporting Information 11).We subsequently explore the lateral spatial dependence
of the optical
force by simulating the QD and PB in a plane, which is 5 nm above
the top surface of the dimer nanoantenna with a 10 nm gap, as shown
in Figure e,f. This
is an emulation of the position of nanoparticles placed onto the top
surface of the dimer. The optical force, as expected, is maximized
at the position of the electric field hotspots yet still maintains
values of more than 100 fN for the QD and 20 fN for the PB.
Conclusion
We have fabricated and characterized both monomer and dimer WS2 nanoantennas with the aim to highlight the advantages of
their use in photonic applications such as tunable photoluminescence
enhancement, polarization-dependent SHG enhancement, SPE enhancement,
and optical trapping, thereby broadening the versatility of TMD nanoantennas.
Dark-field studies on monomer and dimer nanoantennas reveal a straightforward
approach for tuning resonances in the structures in order to fit with
different applications by varying the radius, height, or geometry.
For the first time, we couple monolayer WSe2 emission to
dimer resonances in the same, TMD, material system and achieve PL
enhancement factors of more than 240 and a Purcell enhancement factor
lower bound of nearly 2 for a large dimer gap of 150 nm. Through the
use of a dimer anapole mode we show polarization-dependent SHG enhancement,
not present in bulk TMD flakes or monomer nanoantennas, that can be
rotated by a change in excitation polarization which may prove advantageous
for the realization of optical logic gates.[55] Post-fabrication repositioning of dimer nanoantennas utilizing AFM
led us to attain ultrasmall gaps of 10 ± 5 nm, on the order of
the feature resolution limit set by FIB milling,[56] which we achieve through a more precise, less damaging
technique. Although a previous report has demonstrated AFM positioning
of plasmonic bowtie nanoantennas,[57] this
technique has only become possible for dielectric nanoantennas made
from layered materials because of their intrinsic van der Waals attractive
forces. This allows us to achieve the smallest separation recorded
for a dielectric resonator defined through the use of electron beam
lithography followed by reactive ion etching.[25,58] Another advantage of this method is the possibility to change the
relative orientation of individual nanopillars, thereby aligning their
potentially atomically sharp vertices in closer or further proximity.The numerical simulation studies of dimer nanoantennas exhibiting
an ultrasmall gap yield highly confined electric field intensity hotspots
(103 enhancement compared to vacuum). We predict the practical
utility of WS2 nanoantennas for radiative rate enhancement
of single-photon emission with Purcell factors of up to 157 for a
hexagonal and 153 for a square geometry. The expected quantum emission
enhancement in the dimer nanoantennas is higher than the largest currently
achieved in photonic crystal cavities[59] because of the previously inaccessibly small proximity attained
with the AFM repositioning method. We also explore two different routes
to modulate the photonic enhancement through variation of the dimer
gap as well as the relative rotation of the individual nanopillars,
which are both controllable either through the fabrication process
or, to a greater precision, the postfabrication repositioning. These
methods of controlling the emission properties of single-photon sources
may prove useful for WSe2 SPEs, which form at high strain
gradients in monolayers transferred onto dimer nanoantennas collocated
with the electric field hotspots.[48] Previous
reports have shown quantum efficiency enhancement for WSe2 SPEs[11] as well as rotation of the emitter
dipole moment due to a change in the strain gradient,[60] both of which can be controlled by a change in separation
and rotation of individual nanopillars in the dimer nanoantenna through
AFM repositioning.We further explored a route to the precise
positioning of SPEs
by simulating optical trapping forces due to the highly confined electric
field in the gap of the dimer nanoantennas. We calculated a maximum
attractive force of 353 fN for a colloidal quantum dot and 73 fN for
a protein-like, polystyrene bead both with a radius of 5 nm under
a pump power density of 10 mW/μm2. When compared
to previous examples of dielectric nanoantennas for optical trapping,
the WS2 dimers yield higher attractive forces by a factor
of >83 for QDs[44] and >40 for PBs[25] with the same size and under the same pump power
conditions. Therefore, WS2 dimer nanoantennas with ultrasmall
gaps show great potential for applications of stable trapping of very
small nanoparticles with a moderate optical power. This once again
highlights the advantage of the AFM repositioning technique to reduce
the dimer gap below the limits available to standard nanofabrication.
The large Purcell enhancements and optical trapping forces predicted
for WS2 dimer nanoantennas with ultrasmall gaps highlight
the potential for TMD nanoresonator research and applications. This
is possible because of the refractive index and van der Waals forces,
which allow the formation of highly confined resonances and hotspots
while simultaneously providing the opportunity to use AFM repositioning.
The field of nanophotonics includes a diverse library of materials
for the fabrication of resonators, and here we demonstrate additional
functionalities and applications enabled by adding thin crystals of
TMDs to the list.
Methods
Sample Fabrication
WS2 Exfoliation
WS2 flakes were
mechanically exfoliated from bulk crystal (HQ-graphene) onto a nominally
290 nm SiO2 on silicon substrate. Large flakes with recognizable
crystal axes via straight edged sides at 120° to each other were
identified, and their positions within the sample were recorded for
further patterning.
Electron Beam Lithography
Samples
were spin-coated
with ARP-9 resist (AllResist GmbH) at 3500 rpm for 60 s and baked
at 180° for 5 min, yielding a film of 200 nm thickness. Electron
beam lithography was performed in a Raith GmbH Voyager system operating
at 50 kV using a beam current of 560 pA.
Reactive Ion Etching
Anisotropic etching to imprint
the resist pattern into the WS2 flakes physically was carried
out using a mixture of CHF3 (14.5 sccm) and SF6 (12.5 sccm) at a DC bias of 180 V and a pressure of 0.039 mbar for
40 s. Isotropic etching was achieved by using a more chemical recipe
with solely SF6 (20 sccm) at a DC bias of 50 V and a pressure
of 0.13 mbar for 40 s. Removal of the remaining resist after etching
was accomplished by a bath in warm 1165 resist remover (1 h) followed
by acetone (5 min) and IPA (5 min). If resist is still found on the
sample, final cleaning is done in a bath of acetone (1 h) and IPA
(5 min) followed by 1 h in a UV ozone treatment. In some cases, the
structures were slightly overetched leading to nanoantennas with a
small pedestal of SiO2 (<20 nm). This, however, did
not lead to any noticeable changes in the photonic resonances nor
in the ability to reposition the structures with AFM.
WSe2 Transfer
WSe2 monolayers
were mechanically exfoliated from a bulk crystal (HQ-graphene) onto
a (PDMS) stamp, which had previously been attached to a glass slide.
Large monolayers were identified using PL imaging. The glass slide
is rotated upside down and attached to a holder arm by means of a
vacuum. The target substrate, consisting of WS2 nanoantennas
on a SiO2 surface, was also held to a stage using the same
vacuum. The WSe2 monolayer was slowly brought into contact
with the target substrate through the use of a piezo-scanner stage.
After the entire monolayer contacted the surface, the glass slide
with PDMS was slowly moved away from the target substrate. The low
speed of the peeling process makes use of the viscoelastic properties
of the PDMS polymer and leaves the monolayer of WSe2 onto
the substrate.
Dark-Field Spectroscopy
Optical
spectroscopy in a dark-field
configuration was achieved using a Nikon LV150N microscope with a
fiber-coupled output. Incident illumination from a tungsten halogen
lamp in the microscope was guided to a circular beam block with a
diameter smaller than that of the beam. The light was then reflected
by a 50:50 beam splitter toward a 50× Nikon (0.8 NA) dark-field
objective which illuminates the sample only at large angles to the
normal. Reflected light from the sample is guided back through the
same objective toward a fiber coupler. Because of the small diameter
of the multimode fiber core used, only light reflected back at small
angles to the normal is collected. The fiber from the microscope was
subsequently coupled to a Princeton Instruments spectrometer and charge
coupled device (CCD).
Micro-photoluminescence Spectroscopy
In order to record
the photoluminescence emitted from monolayer WSe2 at different
regions of our sample, we used a home-built setup, which includes
a pulsed diode laser at 638 nm. The sample was mounted into an Oxford
Instruments flow cryostat, and the chamber was pumped to vacuum. The
collimated excitation laser was passed through a 700 nm short-pass
filter, a Glan-Thompson linear polarizer, and a half wave plate before
being deflected by a 50:50 beam splitter and passing through a 100×
(0.7 NA) Mitutoyo objective which focused the beam onto the sample.
The emitted light is collected by the same objective, passes through
the beam splitter to be guided through a 700 nm long-pass filter,
and is focused onto the slit of a Princeton Instruments spectrometer
(0.75 m) and CCD (data shown in Figure d,e and Supporting Information 5 and 7). The PL decay time studies utilized the pulsed laser
excitation, and the emitted light was spectrally filtered (10 nm)
using the exit slit of the spectrometer before it was fiber-coupled
to an ID Quantique avalanche photodiode (id100) (data shown in Figure f and Supporting Information 7).
Atomic Force
Microscope Repositioning and Imaging
All
repositioning was carried out using a JPK Nanowizard 3 Ultra AFM using
Bruker SNL probes (cantilever C, nominal stiffness 0.24 N/m). First,
nanoantennas were imaged in QI mode with a set point of 1 nN, a Z
length of 400 nm, and a pixel time of 15 ms. To reposition the nanoantennas,
the AFM was switched to contact mode and 200 nm scans were performed
with a set point of 1 nN and a scan rate of 2 Hz on the substrate
immediately adjacent to the nanoantenna. The fast scan axis was oriented
along the desired direction of movement, and the scan area was progressively
moved so that the scan overlapped with the nanoantenna to translate
it in the desired direction in increments of 5–50 nm at a time.
Periodically, the nanoantenna was reimaged in QI mode to check the
relative position and orientation of the pillars. Final characterization
after repositioning was performed in QI mode.
FDTD Simulations
The finite-difference time-domain
simulations were carried out using Lumerical Inc. software.
Scattering
Simulations
Calculations of the scattering
cross section shown in Figure and Supporting Information 1 and 3 were carried out by defining the geometry of the WS2 nanoantennas
onto a SiO2 substrate utilizing the refractive index of
WS2 from ref (20). Illumination with a plane wave was sent normal to the
surface using a TFSF source from the air side. The illumination was
unpolarized; however, for Figure the polarization was set parallel to the dimer axis.
The scattered intensity was subsequently collected from a monitor
set above the illumination plane (in the far-field) so that the dark-field
spectroscopy experiments could be closely emulated.
Electric
Field Intensity Simulations
Calculations of
the near-field electric field intensity normalized to vacuum, shown
in Figures b and 4a, were simulated using the same geometry and illumination
scheme as for the scattering simulations (polarization is shown as
a white double arrow in upper left corner of each panel) with a monitor
recording the electric field 0.5 nm above the top surface of the nanoantennas
or as a vertical cross section of the structure passing through the
dimer axis as shown in the right-most panels of Figure a. For Supporting Information 8, the monitor was designed as a cross-sectional profile through
the midpoint of the nanoantenna height. For Figures b and 4a this monitor
was defined to encompass the entire cross section of the nanoantennas.
For the simulations performed in Supporting Information 5, 6 and 11, only a single point 1 nm from the inside edge
of the dimer nanoantenna within the hotspot was recorded.
Purcell Factor
Simulations
Simulations of the Purcell
factor were carried out using the same geometry as for the electric
field intensity simulations. The illumination was achieved through
a dipole source placed at different positions, 0.5 nm above the top
surface of the nanoantenna with a polarization parallel to the dimer
axis for Figure b.
For the simulations displayed in Supporting Information 11, the position was set to 0.5 nm above the top surface of
the nanoantenna and 1 nm from the inside edge within the electric
field hotspot.
Optical Trapping Force Simulations
We have used the
3D finite element method (COMSOL Multiphysics) to calculate the optical
forces in the hexagonal dimer nanoantenna. The structure is illuminated
with a plane wave propagating in a normal direction to the top surface
of the structure with a polarization along the dimer axis. The background
refractive index was set to that of water to enable access of the
nanosphere to the trapping site. We have calculated the optical forces
at the resonance of the nanoantenna, corresponding to the maximum
energy enhancement. The value of the optical force is obtained by
integrating the Maxwell stress tensor on the surface of the target
nanoparticle.[41] A fine mesh (resolution
of ≤3 nm) has been employed in the dimer gap to calculate the
electromagnetic distribution with a high accuracy, minimizing the
error on the evaluation of the optical force. The computational domain
has been set to a sufficiently large value (>2 μm) and surrounded
by perfectly matched layers in order to avoid undesired reflection
and scattering from the boundary.
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