| Literature DB >> 34160197 |
Fan Cui1, Yunyan Zhang1,2, H Aruni Fonseka3, Premrudee Promdet4, Ali Imran Channa5, Mingqing Wang6, Xueming Xia4, Sanjayan Sathasivam4, Hezhuang Liu5, Ivan P Parkin4, Hui Yang7, Ting Li8, Kwang-Leong Choy6, Jiang Wu5, Christopher Blackman4, Ana M Sanchez3, Huiyun Liu1.
Abstract
Narrow-band-gap III-V semiconductor nanowires (NWs) with a suitable band structure and strong light-trapping ability are ideal for high-efficiency low-cost solar water-splitting systems. However, due to their nanoscale dimension, they suffer more severe corrosion by the electrolyte solution than the thin-film counterparts. Thus, short-term durability is the major obstacle for using these NWs for practical water-splitting applications. Here, we demonstrated for the first time that a thin layer (∼7 nm thick) of compact TiO2 deposited by atomic layer deposition can provide robust protection to III-V NWs. The protected GaAs NWs maintain 91.4% of its photoluminescence intensity after 14 months of storage in ambient atmosphere, which suggests the TiO2 layer is pinhole-free. Working as a photocathode for water splitting, they exhibited a 45% larger photocurrent density compared with unprotected counterparts and a high Faraday efficiency of 91% and can also maintain a record-long highly stable performance among narrow-band-gap III-V NW photoelectrodes; after 67 h photoelectrochemical stability test reaction in a strong acid electrolyte solution (pH = 1), they show no apparent indication of corrosion, which is in stark contrast to the unprotected NWs that fully failed after 35 h. These findings provide an effective way to enhance both stability and performance of III-V NW-based photoelectrodes, which are highly important for practical applications in solar-energy-based water-splitting systems.Entities:
Keywords: III−V nanowires; long-term stability; narrow-band-gap semiconductors; thin TiO2 protection; water splitting
Year: 2021 PMID: 34160197 PMCID: PMC8289235 DOI: 10.1021/acsami.1c03903
Source DB: PubMed Journal: ACS Appl Mater Interfaces ISSN: 1944-8244 Impact factor: 9.229
Figure 1Structural information of GaAs NWs covered by TiO2 and Pt. (a) Low-magnification SEM images showing the NWs. (b) Low-magnification TEM image of a NW. (c) EDX mapping of Ga and Ti in a NW segment. (d) EDX composition line scan near the NW surface. (e) Higher-magnification TEM image showing the NW/TiO2 interface. (f) and (g) are the fast fourier transforms of areas shown in (e). (h) Low-magnification TEM image showing an entire NW. Higher-magnification TEM images showing the NW/TiO2 interfaces at the (i) bottom, (j) middle, and (k) tip of the NW marked in (h).
Figure 2PL spectra from GaAs NWs with and without a TiO2 protection layer. The TiO2 protection layer was deposited on the same day of the NW growth. The spectra were taken on the 1st day of NW growth and after 14 months storage in atmosphere.
Figure 3Photoelectrochemical properties of GaAs photocathodes. (a) J–V curves of unprotected photocathodes and the inset figure shows the enlarged J–V curve above 0.5 V vs RHE. (b) TiO2-protected photocathodes under 1 sun illumination (AM 1.5 G 100 mW/cm2) in 0.5 M H2SO4 electrolyte (pH = 1). (c) Experimental and theoretical H2 evolution of TiO2-protected photocathodes under continuous illumination (AM 1.5 G 100 mW/cm2). (d) Stability of the protected and unprotected photocathodes measured with a bias of −0.6 V and under an AM 1.5 sun illumination.
Figure 4Morphology and structure of GaAs NW photocathodes after the stability test. (a–d) are from unprotected photocathode. (a) SEM image gives an overall view of the sample surface. (b) Higher-magnification SEM image of the orange square shown in (a). (c) TEM image showing the bottom of a NW with severe corrosion. (d) TEM image showing the Pt-free surface of the NWs. (e–h) are from protected photocathodes. (e) SEM image of the sample surface. (f) TEM image of the NW surface showing GaAs/TiO2 interface and Pt particles. (g) Ti element mapping of the NW bottom.