| Literature DB >> 31455776 |
Weining Miao1,2, Yuxing Yao3, Zhiwei Zhang4, Chunping Ma4, Shengzhe Li5, Jiayue Tang6, He Liu2, Zemin Liu2, Dianyu Wang7, Michael A Camburn8, Jen-Chun Fang8, Ruiran Hao6, Xinyu Fang8, Shuang Zheng9, Nan Hu4, Xiaoguang Wang8.
Abstract
Current metal film-based electronics, while sensitive to external stretching, typically fail via uncontrolled cracking under a relatively small strain (~30%), which restricts their practical applications. To address this, here we report a design approach inspired by the stereocilia bundles of a cochlea that uses a hierarchical assembly of interfacial nanowires to retard penetrating cracking. This structured surface outperforms its flat counterparts in stretchability (130% versus 30% tolerable strain) and maintains high sensitivity (minimum detection of 0.005% strain) in response to external stimuli such as sounds and mechanical forces. The enlarged stretchability is attributed to the two-stage cracking process induced by the synergy of micro-voids and nano-voids. In-situ observation confirms that at low strains micro-voids between nanowire clusters guide the process of crack growth, whereas at large strains new cracks are randomly initiated from nano-voids among individual nanowires.Entities:
Year: 2019 PMID: 31455776 PMCID: PMC6711965 DOI: 10.1038/s41467-019-11803-8
Source DB: PubMed Journal: Nat Commun ISSN: 2041-1723 Impact factor: 14.919
Fig. 1Bioinspired hierarchical assembly of nanowires. a Schematic illustrations and corresponding optical micrographs of capillary force-induced assembly of nanowires (scale bar, 20 μm). b SEM images of micro-voids between nanowire clusters and nano-voids among individual nanowires within a single nanowire cluster (scale bar in left and right figures are 500 nm and 2 μm, respectively). MV (yellow arrow) and NV (green arrow) represent micro-voids and nano-voids, respectively. c Atomic force microscopy (AFM) topography image of the deposited 24-nm-thick Pt film
Fig. 2Simulation of cracking of nanowire-structured surfaces guided by MVs and NVs. a SEM images of cracking induced by MVs (yellow arrow) and NVs (red arrow) of Pt films (scale bar, 2 μm). CMV (yellow arrow) and CNV (red arrow) represent cracks initiated from MVs and NVs. b Key features of nanowire assembly in FE modeling. c Evolution of hierarchical assembly of 4-μm-length nanowires as a function of strain (See Supplementary Movie 2). d, e Influence of nanowire length and cluster size on (d) MV-induced cracking or (e) global strain of the nanowire-structured surfaces
Fig. 3Influence of strains on morphology and electrical resistance of Pt films. a, b In-situ imaging of cracking process of Pt films coated on (a) a flat surface or (b) a nanowire-structured surface at different strains, respectively (two MVs and corresponding CMV are marked with yellow arrows or box; NV region and corresponding CNV are marked with greed dashed box; scale bar in a, 200 μm; scale bar in b, 20 μm; scale bar of enlarged figures of 0% and 115% strain in b, 5 μm). c, d Linear density and length of cracks of the Pt film coated on hierarchical assemblies of 4-μm-length nanowires plotted as a function of strains. Subscripts x and y represent the directions parallel and perpendicular to the stretch, respectively. Error bars, s.d. (n = 20). e Electrical resistance of the Pt film and calculated P (ρxlx / (l0-ρyly)) as a function of strains (see Supplementary Note 4 for details). f Tolerable strain as a function of nanowire length. Error bars, s.d. (n = 5)
Fig. 4Ultrastretchable and highly sensitive electronics. a A 1.5-cm-length 1D actuators installed with our metal film-based electronics. b The electrical resistance of the metal film sensor as a function of actuator deformation. c Nanowire-structured Pt films for detection of the soft gripper’s locomotion. d Variation of the resistance of the metal film sensor in the process of grabbing-holding-releasing objects by the soft gripper (see Supplementary Movie 3 and 4). e, f ΔR/R0 of cracked Pt film on nanowire clusters versus strain within the range of (e) 0–0.1% or (f) 100–100.03%. Insets show the corresponding resistance as a function of strain. g A nanowire-structured Pt film-based sensor mounted on a loudspeaker. h Influence of sound intensity on the resistance of the metal film sensor (See Supplementary Movie 5). The length of the nanowire is 4 µm