| Literature DB >> 34068256 |
Tessa Marzi1, Giorgio Gronchi1, Maria Teresa Turano2, Fabio Giovannelli1, Fiorenza Giganti1, Mohamed Rebai3, Maria Pia Viggiano1.
Abstract
Individual abilities in face recognition (good versus bad recognizers) were explored by means of event-related potentials (ERPs). The adaptation response profile of the N170 component to whole faces, eyes and mouths was used in order to highlight the crucial role of individual abilities in identity repetition processes for unfamiliar faces. The main point of this study is to underline the importance of characterizing the performance (bad or good) of the participants and to show that behaviorally selected groups might reveal neural differences. Good recognizers showed selective right hemisphere N170 repetition effects for whole faces and not for features. On the contrary, bad recognizers showed a general repetition effect not specifically related to faces and more pronounced processing for features. These findings suggest a different contribution of holistic and featural analysis in bad and good performers. In conclusion, we propose that the N170 might be used as a tool to tease apart face encoding processes as a function of individual differences.Entities:
Keywords: N170; event-related potentials; featural processing; holistic processing; individual differences; neural adaptation
Year: 2021 PMID: 34068256 PMCID: PMC8153130 DOI: 10.3390/bs11050075
Source DB: PubMed Journal: Behav Sci (Basel) ISSN: 2076-328X
Figure 1The procedure: A same/different matching task for repeated stimuli S1 and S2; the stimuli consisted of whole faces, mouths or eyes.
Figure 2Grand average responses (T5 and T6 electrodes) for good and bad face recognizers for the different categories. The continuous lines represent responses to S2 while the dots represent the mean amplitudes of the N170 and (the N250) for responses to S1.
Figure 3The adaptation effect of the N170 for bad and good recognizers: S1 is confronted with S2 for faces, mouths and eyes.
Figure 4Single subjects (top panel good recognizers, bottom panel bad recognizers) mean amplitude values for whole faces in S1 and S2, measured in the time range of the N170 component.
Figure 5Topographical maps showing scalp distribution for the N170 component. Maps were generated by event-related potentials (ERPs) mean amplitudes measured in the N170 time window for S1 and S2.