| Literature DB >> 30424139 |
Yuchen Xu1,2,3,4, Chuan Luo5,6,7, Fan-Gang Zeng8, John C Middlebrooks9, Harrison W Lin10, Zheng You11,12,13.
Abstract
The micro-fabricated thin film electrode array (TFEA) has been a promising design for cochlear implants (CIs) because of its cost-effectiveness and fabrication precision. The latest polymer-based cochlear TFEAs have faced difficulties for cochlear insertion due to the lack of structural stiffness. To stiffen the TFEA, dissolvable stiffening materials, TFEAs with different structures, and TFEAs with commercial CIs as carriers have been invested. In this work, the concept of enhancing a Parylene TFEA with Kapton tape as a simpler carrier for cochlear insertion has been proved to be feasible. The bending stiffness of the Kapton-aided TFEA was characterized with an analytical model, a finite element model, and a cantilever bending experiment, respectively. While the Kapton tape increased the bending stiffness of the Parylene TFEA by 10³ times, the 6-μm-thick TFEA with a similar Young's modulus, as a polyimide, in turn significantly increased the bending stiffness of the 170-μm-thick Kapton carrier by 60%. This result indicated that even the TFEA is ultra-flexible and that its bending stiffness should not be neglected in the design or selection of its carrier.Entities:
Keywords: Parylene; carrier-aided insertion; cochlear implant; thin film electrode array
Year: 2018 PMID: 30424139 PMCID: PMC6187472 DOI: 10.3390/mi9050206
Source DB: PubMed Journal: Micromachines (Basel) ISSN: 2072-666X Impact factor: 2.891
Figure 1Schematics of the fabrication process, the three rows demonstrates the whole thin film electrode array (TFEA) structure, one electrode, and its cross-section view, respectively: (a) deposition of 500-nm aluminum and lithography of 2.2 μm AZ GXR-601 (AZ Electronic Materials Co., Wiesbaden, Germany); (b) deposition of 5 μm Parylene C; (c) Lift-off of 20-nm titanium and 200-nm platinum, respectively; (d) deposition of 1 μm Parylene C, Parylene patterning with AZ 4620, and O2 plasma etching; (e) TFEA release with fuming nitric acid.
Figure 2(a) The four Kapton tapes peeled off from the roll with the same 21.5 mm length (carved by a fine scalpel) and the clamped edge being aligned; (b) The upward vertical bending distance measured by a ruler.
Figure 3(a) Schematic of the TFEA; (b–d) Preparation of the TFEA and TFEA-Kapton: (b) TFEA sample and pre-shaped Kapton tape carrier; (c) adhering the TFEA onto the Kapton tape carrier; (d) electrical connection of the TFEA-Kapton onto a print circuit board.
Figure 4(a) Incremental element of a cantilever beam (dashed square in (b)); (b) Cantilever beam model based on the loading conditions in the bending experiment; (c) Optical microscopy of the TFEA’s patterned metal layer.
Thickness and y-axis location of different layers.
| Layer Material | PET | Bottom Silicone Adhesive | Polyimide ( | Top Silicone Adhesive | Bottom Parylene | Platinum ( | Top Parylene |
|---|---|---|---|---|---|---|---|
| 75 | 110 | 135 | 170 | 175 | 175.2 | 176.2 |
Material properties of different layers.
| Layer Material | PET ( | Silicone Adhesive ( | Polyimide ( | Parylene C ( | Platinum ( |
|---|---|---|---|---|---|
| Young’s modulus ( | 2.10 | 4.15 × 10−3 | 2.07 | 2.80 | 154 |
| Density ( | 1430 | 1280 | 1420 | 1289 | 21,387 |
| Poisson’s ratio ( | 0.40 | 0.49 | 0.35 | 0.40 | 0.345 |
Figure 5(a) Finite element model (FEM) with mesh rendering. (b) w(l) at the loading point with the increase of load P.
Figure 6Deflection |w(l)| at the loading point of the TFEA with the increase of load P calculated with the analytical and FEM, respectively.
Figure 7(a) Schematic of the bending experiment; (b) bending experiment of the Kapton tape; (c) bending experiment of the TFEA-Kapton; (d) deflection force P as a function of the vertical deflection |w(l)| at the loading point, in comparison to the analytical and FEM results.
Equivalent bending stiffness results.
| Object of Study | Method | Equivalent Bending Stiffness ( | Calculation Deviation Compared with Experimental Results |
|---|---|---|---|
| Kapton tape only | Analytical model | 2.88 × 10−7 | −7.31% |
| FEM | 3.02 × 10−7 | −2.63% | |
| Experiment | 3.10 × 10−7 | N/A | |
| TFEA-Kapton | Analytical model with 200-nm-thick Pt | 7.03 × 10−7 | 41.77% |
| FEM with 200-nm-thick Pt | 7.14 × 10−7 | 44.07% | |
| Analytical model with no Pt | 4.39 × 10−7 | −11.44% | |
| FEM with no Pt | 4.62 × 10−7 | −6.85% | |
| Experiment | 4.96 × 10−7 | N/A |