| Literature DB >> 27660591 |
Lara J Gamble1, Christopher R Anderton2.
Abstract
Secondary ion mass spectrometry (SIMS) is a technique capable of imaging tissues, single cells, and microbes revealing chemical species with sub-micrometer spatial resolution. The recently developed Fourier transform ion cyclotron resonance (FTICR) SIMS instrument provides high mass resolving power and mass accuracy, ToF-SIMS can generate chemical maps with an order of magnitude better lateral resolution than the FTICR-SIMS, and the NanoSIMS instrument offers sub-100 nm spatial resolution in chemical imaging. Many commercial ToF-SIMS instruments are also capable of depth profiling that allows three-dimensional reconstructions of cell and tissue structure.Entities:
Year: 2016 PMID: 27660591 PMCID: PMC5028133 DOI: 10.1017/S1551929516000018
Source DB: PubMed Journal: Micros Today ISSN: 1551-9295