| Literature DB >> 23409148 |
Markus Martini1, Marco R Furtner, Pierre Sachse.
Abstract
Is there a relation between working memory (WM) and incidental sequence learning? Nearly all of the earlier investigations in the role of WM capacity (WMC) in sequence learning suggest no correlations in incidental learning conditions. However, the theoretical view of WM and operationalization of WMC made strong progress in recent years. The current study related performance in a coordination and transformation task to sequence knowledge in a four-choice incidental deterministic serial reaction time (SRT) task and a subsequent free generation task. The response-to-stimulus interval (RSI) was varied between 0 ms and 300 ms. Our results show correlations between WMC and error rates in condition RSI 0 ms. For condition RSI 300 ms we found relations between WMC and sequence knowledge in the SRT task as well as between WMC and generation task performance. Theoretical implications of these findings for ongoing processes during sequence learning and retrieval of sequence knowledge are discussed.Entities:
Mesh:
Year: 2013 PMID: 23409148 PMCID: PMC3568126 DOI: 10.1371/journal.pone.0056166
Source DB: PubMed Journal: PLoS One ISSN: 1932-6203 Impact factor: 3.240
Figure 1Mean RTs by RSI conditions. Mean RTs (in ms) for training blocks (1–8 and 10) and transfer block (9), plotted separately for the corresponding RSI conditions.
Error bars depict standard errors.
Descriptive statistics of the relevant data for the two RSI conditions.
| Mean RTs Block 8 | % errors Block 8 | Mean RTs Block 9 | % errors Block 9 | Mean RTs Block 10 | % errors Block 10 | MU | SSTM | D | De | G | ||
| RSI 0 |
| 492.09 | 6.2 | 550.41 | 10.5 | 480.28 | 8.5 | .51 | .82 | 58.32 | .04 | .38 |
|
| 74.56 | 7.3 | 52.94 | 9.7 | 56.45 | 10.6 | .15 | .04 | 57.55 | .06 | .11 | |
| RSI 300 |
| 409.31 | 5.9 | 458.22 | 6.8 | 392.34 | 5.4 | .57 | .84 | 48.91 | .01 | .46 |
|
| 81.27 | 3.2 | 65.51 | 3.4 | 74.69 | 2.9 | .17 | .05 | 49.98 | .04 | .13 |
Note: MU = memory updating, SSTM = spatial short-term memory, D = difference score, De = difference score of the errors, G = generation score.