| Literature DB >> 23126749 |
J Szlachetko1, M Nachtegaal, E de Boni, M Willimann, O Safonova, J Sa, G Smolentsev, M Szlachetko, J A van Bokhoven, J-Cl Dousse, J Hoszowska, Y Kayser, P Jagodzinski, A Bergamaschi, B Schmitt, C David, A Lücke.
Abstract
We report on the design and performance of a wavelength-dispersive type spectrometer based on the von Hamos geometry. The spectrometer is equipped with a segmented-type crystal for x-ray diffraction and provides an energy resolution in the order of 0.25 eV and 1 eV over an energy range of 8000 eV-9600 eV. The use of a segmented crystal results in a simple and straightforward crystal preparation that allows to preserve the spectrometer resolution and spectrometer efficiency. Application of the spectrometer for time-resolved resonant inelastic x-ray scattering and single-shot x-ray emission spectroscopy is demonstrated.Entities:
Year: 2012 PMID： 23126749 DOI： 10.1063/1.4756691
Source DB: PubMed Journal: Rev Sci Instrum ISSN： 0034-6748 Impact factor: 1.523