Literature DB >> 14525322

Atomically precise placement of single dopants in si.

S R Schofield1, N J Curson, M Y Simmons, F J Ruess, T Hallam, L Oberbeck, R G Clark.   

Abstract

We demonstrate the controlled incorporation of P dopant atoms in Si(001), presenting a new path toward the creation of atomic-scale electronic devices. We present a detailed study of the interaction of PH3 with Si(001) and show that it is possible to thermally incorporate P atoms into Si(001) below the H-desorption temperature. Control over the precise spatial location at which P atoms are incorporated was achieved using STM H lithography. We demonstrate the positioning of single P atoms in Si with approximately 1 nm accuracy and the creation of nanometer wide lines of incorporated P atoms.

Entities:  

Year:  2003        PMID: 14525322     DOI: 10.1103/PhysRevLett.91.136104

Source DB:  PubMed          Journal:  Phys Rev Lett        ISSN: 0031-9007            Impact factor:   9.161


  25 in total

1.  Embracing the quantum limit in silicon computing.

Authors:  John J L Morton; Dane R McCamey; Mark A Eriksson; Stephen A Lyon
Journal:  Nature       Date:  2011-11-16       Impact factor: 49.962

2.  A single-atom transistor.

Authors:  Martin Fuechsle; Jill A Miwa; Suddhasatta Mahapatra; Hoon Ryu; Sunhee Lee; Oliver Warschkow; Lloyd C L Hollenberg; Gerhard Klimeck; Michelle Y Simmons
Journal:  Nat Nanotechnol       Date:  2012-02-19       Impact factor: 39.213

3.  Field-directed sputter sharpening for tailored probe materials and atomic-scale lithography.

Authors:  S W Schmucker; N Kumar; J R Abelson; S R Daly; G S Girolami; M R Bischof; D L Jaeger; R F Reidy; B P Gorman; J Alexander; J B Ballard; J N Randall; J W Lyding
Journal:  Nat Commun       Date:  2012-07-03       Impact factor: 14.919

4.  Silicon epitaxy on H-terminated Si (100) surfaces at 250 °C.

Authors:  Xiao Deng; Pradeep Namboodiri; Kai Li; Xiqiao Wang; Gheorghe Stan; Alline F Myers; Xinbin Cheng; Tongbao Li; Richard M Silver
Journal:  Appl Surf Sci       Date:  2016-03-31       Impact factor: 6.707

5.  Single dopants in semiconductors.

Authors:  Paul M Koenraad; Michael E Flatté
Journal:  Nat Mater       Date:  2011-02       Impact factor: 43.841

6.  Low-Resistance, High-Yield Electrical Contacts to Atom Scale Si:P Devices Using Palladium Silicide.

Authors:  Scott W Schmucker; Pradeep N Namboodiri; Ranjit Kashid; Xiqiao Wang; Binhui Hu; Jonathan E Wyrick; Alline F Myers; Joshua D Schumacher; Richard M Silver; M D Stewart
Journal:  Phys Rev Appl       Date:  2019       Impact factor: 4.985

7.  Evolution of circuits for machine learning.

Authors:  Cyrus F Hirjibehedin
Journal:  Nature       Date:  2020-01       Impact factor: 49.962

8.  The initialization and manipulation of quantum information stored in silicon by bismuth dopants.

Authors:  Gavin W Morley; Marc Warner; A Marshall Stoneham; P Thornton Greenland; Johan van Tol; Christopher W M Kay; Gabriel Aeppli
Journal:  Nat Mater       Date:  2010-08-15       Impact factor: 43.841

9.  Single-donor ionization energies in a nanoscale CMOS channel.

Authors:  M Pierre; R Wacquez; X Jehl; M Sanquer; M Vinet; O Cueto
Journal:  Nat Nanotechnol       Date:  2009-12-06       Impact factor: 39.213

10.  Measuring central-spin interaction with a spin-bath by pulsed ENDOR: Towards suppression of spin diffusion decoherence.

Authors:  S J Balian; M B A Kunze; M H Mohammady; G W Morley; W M Witzel; C W M Kay; T S Monteiro
Journal:  Phys Rev B Condens Matter Mater Phys       Date:  2012-09-21
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