| Literature DB >> 14525322 |
S R Schofield1, N J Curson, M Y Simmons, F J Ruess, T Hallam, L Oberbeck, R G Clark.
Abstract
We demonstrate the controlled incorporation of P dopant atoms in Si(001), presenting a new path toward the creation of atomic-scale electronic devices. We present a detailed study of the interaction of PH3 with Si(001) and show that it is possible to thermally incorporate P atoms into Si(001) below the H-desorption temperature. Control over the precise spatial location at which P atoms are incorporated was achieved using STM H lithography. We demonstrate the positioning of single P atoms in Si with approximately 1 nm accuracy and the creation of nanometer wide lines of incorporated P atoms.Entities:
Year: 2003 PMID: 14525322 DOI: 10.1103/PhysRevLett.91.136104
Source DB: PubMed Journal: Phys Rev Lett ISSN: 0031-9007 Impact factor: 9.161