Similarity-scaling studies of dot-pattern classification and recognition.

Classification performance in the dot-pattern, prototype-distortion paradigm (e.g., Posner & Keele, 1968) was modeled within a multidimensional scaling (MDS) framework. MDS solutions were derived for sets of dot patterns that were generated from prototypes. These MDS solutions were then used in conjunction with exemplar, prototype, and combined models to predict classification and recognition performance. Across 3 experiments, an MDS-based exemplar model accounted for the effects of several fundamental learning variables, including level of distortion of the patterns, category size, delay of transfer phase, and item frequency. Most important, the model quantitatively predicted classification probabilities for individual dot patterns in the sets, not simply general trends of performance. There was little evidence for the existence of a prototype-abstraction process that operated above and beyond pure exemplar-based generalization.