| Literature DB >> 35860454 |
Lin Pan1,2,3, Peng Miao1,3, Anke Horneber1,3, Alfred J Meixner1,3, Pierre-Michel Adam2, Dai Zhang1,3.
Abstract
Using a triangular molybdenum diselenide (MoSe2) flake as surface-enhanced Raman spectroscopy (SERS) platform, we demonstrate the dependency of the Raman enhancement on laser beam polarization and local structure using copper phthalocyanine (CuPc) as probe. Second harmonic generation (SHG) and photoluminescence spectroscopy and microscopy are used to reveal the structural irregularities of the MoSe2 flake. The Raman enhancement in the focus of an azimuthally polarized beam, which possesses exclusively an in-plane electric field component is stronger than the enhancement by a focused radially polarized beam, where the out-of-plane electric field component dominates. This phenomenon indicates that the face-on oriented CuPc molecules strongly interact with the MoSe2 flake via charge transfer and dipole-dipole interaction. Furthermore, the Raman scattering maps on the irregular MoSe2 surface show a distinct correlation with the SHG and photoluminescence optical images, indicating the relationship between local structure and optical properties of the MoSe2 flake. These results contribute to understand the impacts of local structural properties on the Raman enhancement at the surface of the 2D transition-metal dichalcogenide.Entities:
Keywords: copper phthalocyanine; local structure; molybdenum diselenide; optical spectroscopy; surface-enhanced Raman spectroscopy
Year: 2022 PMID: 35860454 PMCID: PMC9263549 DOI: 10.3762/bjnano.13.49
Source DB: PubMed Journal: Beilstein J Nanotechnol ISSN: 2190-4286 Impact factor: 3.272
Figure 1Optical properties of a triangular MoSe2 flake covered with a thin film of 5 nm of CuPc. (a) Bright-field optical image of CuPc/MoSe2. (b) AFM topographic image of CuPc/MoSe2. The upper and lower insets show high-resolution AFM images (2 × 2 μm) scanned from the SiO2/Si substrate to the border of MoSe2 flake and from the border to the center of MoSe2 flake, respectively. The dashed white line represents the position where the height profile was taken. (c) Height profile of CuPc/MoSe2. (d) SHG map of CuPc/MoSe2. The dashed white triangle denotes the real size of the triangular MoSe2 flake. SHG measurements were performed using a custom-built confocal microscope with a femtosecond pulsed laser (89.8 fs, 40 MHz, 780 nm, linear polarization). The excitation power used in the SHG map in (d) is 5.80 mW. (e) SHG spectra collected from CuPc/MoSe2. The inset shows the integrated SHG intensity as a function of the excitation power. (f) and (h) show optical images of CuPc/MoSe2 under the excitation of a radial and an azimuthally polarized laser beam, respectively. The optical measurements are performed using a custom-built confocal microscope with a 636 nm diode laser. Raman and photoluminescence spectra are collected simultaneously in the optical images. The blue, red, and green stars indicate the positions where the optical spectra are collected at the center of the MoSe2 flake, the border of the MoSe2 flake, and the SiO2/Si substrate, respectively. The insets in (f) and (h) show the diagrams of electric field intensity distribution in the x–y plane in the focus of a radially and an azimuthally polarized laser beam (636 nm, continuous wave), respectively. The excitation powers of radially and azimuthally polarized beam were 76.0 μW and 75.0 μW, respectively. (g) Raman spectra collected from the center position of the CuPc/MoSe2 flake under the excitation with a radially and an azimuthally polarized laser beam, respectively. (i) Raman spectra measured at the different positions of the CuPc/MoSe2 flake using azimuthal polarization.
Figure 2The local structure-related optical properties of CuPc/MoSe2. (a) Linear optical image of CuPc/MoSe2 with a scan area of 8 × 8 μm. Raman and photoluminescence signals are collected simultaneously in the linear optical images. (b) SHG map of the corresponding region of CuPc/MoSe2. (c) AFM topographic image of the corresponding region of CuPc/MoSe2. (d) Photoluminescence mapping image of the corresponding region of the photoluminescence peak from MoSe2 at 790 nm. (e) Raman mapping image of the corresponding region of CuPc Raman peak at 1527 cm−1. The color bars in (d) and (e) indicate the integrated optical intensity. The linear optical image and photoluminescence (Raman) mapping images are conducted using azimuthal polarization. (f) Photoluminescence spectra and (g) Raman spectra collected from three different regions (R1, R2, and R3) of the CuPc/MoSe2 flake.
Figure 3(a) Relative Raman enhancement factor at the center of the MoSe2 flake in reference to the SiO2/Si substrate. (b) Photoluminescence spectra collected at the border region (bilayer) and the center position (monolayer) of CuPc on MoSe2 flake. The photoluminescence peak is due to the direct bandgap emission in the MoSe2 monolayer. (c) A sketch of the energy level diagram at the interface between CuPc molecule and 2H MoSe2 monolayer. The ground-state charge transfer, represented by the blue arrow, occurs from the valence band of the MoSe2 monolayer to the HOMO of the CuPc molecule. Left side: the red arrow denotes the HOMO–LUMO transition in CuPc excited by a 636 nm laser. The yellow arrow indicates the Raman scattering process. Right side: the absorption process in the MoSe2 monolayer is indicated by the red arrow. The olive arrow denotes the non-radiative relaxation process. The photoluminescence emission in MoSe2 monolayer is represented by the wine red arrow.