| Literature DB >> 35808118 |
Dongzhi Shan1,2, Jinsong Gao1,2,3, Nianxi Xu1, Hai Liu1, Naitao Song1, Qiao Sun1, Yi Zhao1, Yang Tang1, Yansong Wang1, Xiaoguo Feng1, Xin Chen1.
Abstract
A bandpass filter integrated metalens based on electromagnetically induced transparency (EIT) for long-wavelength infrared (LWIR) imaging is designed in this paper. The bandwidth of the metalens, which is a diffractive optical element, decreases significantly with the increase of the aperture size to a fixed f-number, which leads to the decline of imaging performance. The same material composition and preparation process of the metalens and the EIT metasurface in the long-wavelength infrared make it feasible that the abilities of focusing imaging and filtering are integrated into a metasurface device. With the purpose of validating the feasibility of this design method, we have designed a 300-μm-diameter integrated metalens whose f-number is 0.8 and the simulation was carried out. The introduction of EIT metasurface does not affect the focusing near the diffraction limit at the target wavelength, and greatly reduces the influence of stray light caused by non-target wavelength incident light. This bandpass filter integrated metalens design method may have a great potential in the field of LWIR compact optical systems.Entities:
Keywords: bandpass filter; electromagnetically induced transparency metasurface; integrated devices; long-wavelength infrared; metalens
Year: 2022 PMID: 35808118 PMCID: PMC9268714 DOI: 10.3390/nano12132282
Source DB: PubMed Journal: Nanomaterials (Basel) ISSN: 2079-4991 Impact factor: 5.719
Figure 1(a) The schematic diagram of the isolated cylindrical waveguide model; (b) simulated phase and amplitude of the eight chosen meta−atoms at the operation wavelength; (c) the variation of actual focal length of the metalens with incident wavelength; (d) Strehl ratio of the metalens as a function of the aperture size for different incident wavelengths.
Figure 2The schematic diagram of a bandpass filter integrated metalens.
Figure 3(a) The schematic diagram of EIT metasurface; (b) the simulated transmittance spectrum of the EIT metasurface without dark mode resonator and the substrate. The inset shows the simulated electric field intensity distribution corresponding to the resonant wavelength. The structure parameters are: p = 5.50 μm, t = 0.50 μm, w = 1.30 μm, l = 4.50 μm; (c) the simulated transmittance spectrum of the EIT metasurface. The inset shows the simulated electric field intensity distribution corresponding to the transmitted peak. The structure parameters are: p = 4.84 μm, t = 0.88 μm, w = 1.30 μm, l = 4.64 μm, r = 1.30 μm, and g = 0.40 μm; (d) the Q-factor of the EIT metasurface as a function of the parameter g, and the other structure parameters are the same as those shown in (c); (e) the transmitted peak of the EIT metasurface as a function of the parameter t, and the other structure parameters are the same as those shown in (c).
Figure 4(a) The schematic diagram of the dielectric Huygens meta−atoms; (b,c) the simulated amplitude and phase map of the Huygens meta−atoms as a function of the diameter d and the incident wavelength λ. The other structure parameters are: p = 4.84 μm and h = 1.425 μm; (d) simulated phase and amplitude of the eight chosen meta−atoms at the operation wavelength. The other structure parameters are: p = 4.84 μm and h = 1.425 μm; (e) required and realized phase at each radial coordinate on the side of the metalens.
Figure 5(a) The two−dimensional light intensity distribution diagram of the integrated metalens without the EIT metasurface for different wavelengths; (b) the two−dimensional light intensity distribution diagrams of the integrated metalens with the EIT metasurface for different wavelengths; (c) the one−dimensional light intensity distribution diagram of the integrated metalens without the EIT metasurface for different wavelengths; (d) the one−dimensional light intensity distribution diagram of the integrated metalens with the EIT metasurface for different wavelengths; (e) the simulated transmittance spectrum of the integrated metalens with or without the EIT metasurface, and the Q−factor corresponding to the integrated metalens with the EIT metasurface reaches 663.