| Literature DB >> 28775300 |
Shuming Wang1, Pin Chieh Wu2,3, Vin-Cent Su4, Yi-Chieh Lai3, Cheng Hung Chu2, Jia-Wern Chen3, Shen-Hung Lu4, Ji Chen5,6, Beibei Xu5,6, Chieh-Hsiung Kuan4, Tao Li7,8, Shining Zhu9,10, Din Ping Tsai11,12,13.
Abstract
Among various flat optical devices, metasurfaces have presented their great ability in efficient manipulation of light fields and have been proposed for variety of devices with specific functionalities. However, due to the high phase dispersion of their building blocks, metasurfaces significantly suffer from large chromatic aberration. Here we propose a design principle to realize achromatic metasurface devices which successfully eliminate the chromatic aberration over a continuous wavelength region from 1200 to 1680 nm for circularly-polarized incidences in a reflection scheme. For this proof-of-concept, we demonstrate broadband achromatic metalenses (with the efficiency on the order of ∼12%) which are capable of focusing light with arbitrary wavelength at the same focal plane. A broadband achromatic gradient metasurface is also implemented, which is able to deflect wide-band light by the same angle. Through this approach, various flat achromatic devices that were previously impossible can be realized, which will allow innovation in full-color detection and imaging.Metasurfaces suffer from large chromatic aberration due to the high phase dispersion of their building blocks, limiting their applications. Here, Wang et al. design achromatic metasurface devices which eliminate the chromatic aberration over a continuous region from 1200 to 1680 nm in a reflection schleme.Entities:
Year: 2017 PMID: 28775300 PMCID: PMC5543157 DOI: 10.1038/s41467-017-00166-7
Source DB: PubMed Journal: Nat Commun ISSN: 2041-1723 Impact factor: 14.919
Fig. 1Achromatic metalens. a Schematic for chromatic (left) and achromatic (right) metalenses. In the case of chromatic metalens, the focal length is changed as the incident wavelength is switched, resulting in a rainbow-like focal line when it is illuminated by a light source with continuously changed wavelength. The focal point will become a single spot for the case of BAML with optimized phase compensation. b Phase profile for a BAML at arbitrary wavelength of λ ∈ {λ min, λ max}
Fig. 2Phase profile of integrated-resonant unit elements based on coupled nano-rods. a, c, e RCP-to-LCP polarization conversion efficiency (red curves), phase profile (blue curves) and (b, d, f) electric field distribution (color mapping) of integrated-resonant unit elements. Each unit element with 550 nm periods along x and y axes consists of one or several gold MNRs with fixed thickness 30 nm. The MNRs stand on a SiO2/Au substrate with varying gap size, length and width are optimized to achieve various phase compensation between λ min and λ max (Supplementary Tables 1 and 2). The thickness of dielectric spacer SiO2 is 60 nm. Gray region and black arrows remark the range of working bandwidth of BAML and positions of resonant modes, respectively
Fig. 3Verification of achromatic converging metalens. a Optical image of fabricated metalens with NA = 0.268. b Measured light intensity of focal spot at incident wavelength λ = 1500 nm. c Zoom-in scanning electron microscope (SEM) image of fabricated metalens. More images and design details can be found in the Supplementary Note 3. d Experimental (top row) and numerical (bottom row) intensity profiles of BAML along axial planes at various incident wavelengths
Fig. 4Performance of broadband achromatic metalens. Measured and simulated focal length of a BAML with various NA values and b chromatic metalenses. Measured c FWHM and d operation efficiency at corresponding focal plane as a function of wavelength. The efficiency is defined as the ratio of light intensity from the focal spot at corresponding focal plane to the light intensity reflected by a metallic mirror with the same pixel sizes. The error bars present the length of distance from the focal plane where the intensity of focal spot remains the maximum value in measurements
Fig. 5Broadband achromatic gradient metasurfaces. a Schematic of beam deflection with BAGMS. All anomalously deflected angles are the same when the incident wavelength is changed. b Phase distribution for a BAGMS at different incident wavelengths. The Δφ(x, λ) represents the phase difference between λ min and λ max at certain surface position. c Simulated intensity of RCP-to-LCP scattering light vs. angle of reflection at various incident wavelengths. The angle of reflection keeps at around 22.26˚ when the incident wavelength is changed from 1200 to 1650 nm. d SEM image of fabricated BAGMS. e (Left) Experimentally captured CCD images of RCP-to-LCP scattering light from the BAGMS. The intensities are normalized by the maximum value in each image. (Right) Cross section of normalized scattering light intensity along the central line of each corresponding CCD image for RCP-to-LCP (navy curves) and RCP-to-RCP (olive curves) components