| Literature DB >> 35745900 |
Biyao Wang1, Minghao Huang2, Pengrui Dang1, Jiahui Xie1, Xinwen Zhang2, Xu Yan1.
Abstract
Polyetheretherketone (PEEK) has been widely applied in fixed dental prostheses, comprising crowns, fixed partial dentures, and post-and-core. PEEK's excellent mechanical properties facilitate better stress distribution than conventional materials, protecting the abutment teeth. However, the stiffness of PEEK is not sufficient, which can be improved via fiber reinforcement. PEEK is biocompatible. It is nonmutagenic, noncytotoxic, and nonallergenic. However, the chemical stability of PEEK is a double-edged sword. On the one hand, PEEK is nondegradable and intraoral corrosion is minimized. On the other hand, the inert surface makes adhesive bonding difficult. Numerous strategies for improving the adhesive properties of PEEK have been explored, including acid etching, plasma treatment, airborne particle abrasion, laser treatment, and adhesive systems.Entities:
Keywords: adhesion; bonding; fixed dental prosthesis; polyetheretherketone; properties
Year: 2022 PMID: 35745900 PMCID: PMC9228596 DOI: 10.3390/polym14122323
Source DB: PubMed Journal: Polymers (Basel) ISSN: 2073-4360 Impact factor: 4.967
The mechanical and physical properties.
| Mechanical and Physical Properties | PEEK | GFR-PEEK | CFR-PEEK | Ti6Al4V | Cortical Bone | Dentin |
|---|---|---|---|---|---|---|
| Specific gravity (g/cm3) | 1.31 | 1.51 | 1.41 | 4.34 | 1.92 | |
| Young’s modulus (GPa) | 3–4 | 12 | 18 | 110–130 | 14 | 18.6 |
| Tensile strength (MPa) | 110 | 97 | 131 | 976 | 104–121 | 104 |
| Tensile modulus of elasticity (GPa) | 4.3 | 6.9 | 7.6 | 113 | 13.6–28.3 | |
| Tensile elongation (at break) (%) | 40 | 2 | 5 | 6–10 | 1–3 | |
| References | [ | [ | [ | [ | ||
Figure 1Clinical photographs of PEEK prostheses: (a) Frontal view of PEEK crowns; (b) Occlusal view of PEEK crowns; (c) Frontal view of PEEK fixed partial dentures; (d) Occlusal view of PEEK fixed partial dentures; (e) Frontal view of PEEK post-and-core; (f) Occlusal view of PEEK post-and-core.
The application of acid etching for the improvement of PEEK adhesion behavior.
| Strategies | Microscopic Analyses | Mean Roughness Values (Ra, μm) | Wettability Assays, | Shear Bond Strength (SBS, MPa) | Reference, Author, Year |
|---|---|---|---|---|---|
| 70, 80, 85, 90, 98% | Formation of broader and deepen pores with increasing concentration | Ra elevated with increasing concentration (from 0.04 ± 0.02 to 0.74 ± 0.25 μm) | SBS enhanced with increasing concentration (from 1.75 ± 0.66 to 27.36 ± 3.95 MPa) | Chaijareenont et al., 2018 [ | |
| 98% sulfuric acid etching | Well-distributed multi-scale pores and pits over the entire surface | Ra elevated over time (from 1.05 ± 0.59 to 1.26 ± 0.51 μm) | Higher wettability (θ at ~55°) vs. the untreated surface (θ at ∼65°) | SBS enhanced over time (from 4.95 ± 2.86 MPa to 21.43 ± 5.00 MPa) | Escobar et al., 2021 [ |
| 98% sulfuric acid etching (A, for 1 min); | A: Sponge-like, complex fiber network characterized surface | Sandblasting (1.37 ± 0.28 μm) > combined (0.78 ± 0.26 μm) > sulfuric acid (0.73 ± 0.20 μm) > untreated (0.29 ± 0.10 μm) | Sulfuric acid (13.43 ± 1.42 MPa) > Combination (11.72 ± 1.69 MPa) > | Adem et al., 2021 [ | |
| 98% sulfuric acid etching for 0, 5, 30, 60, 90, 120, 300 s | Etched pores were broadened and deepened over time. | Printed PEEK: the highest SBS (27.90 ± 3.48 MPa) was achieved at 30 s. | Zhang et al., 2021 [ | ||
| 98% sulfuric acid etching for 0.5, 1, 3, 5, 7 min | Formation of a 3D porous network that become more complex over time. | Higher wettability (5 min θ at 115.3 ± 9.9°) vs. the untreated surface (θ at 92.9 ± 3.2°) | Ma et al., 2020 [ |
Abbreviation: SEM, scanning electron microscope; FTIR, Fourier transform infrared spectroscopy spectra; AFM, atomic force microscopy.
The application of plasma treatment for the improvement of PEEK adhesion behavior.
| Strategies | Microscopic Analyses | Mean Roughness Values (Ra, μm) | Wettability Assays, | Shear Bond Strength (SBS, MPa) | Reference, Author, Year |
|---|---|---|---|---|---|
| H, O, H/O (1:1) plasma treatment | After 30 min, no significant difference in Ra | After 10 min, θ become stable: | Fu et al., 2021 [ | ||
| He plasma treatment 1 min | In treated C-PEEK and G-PEEK, some | CFR-PEEK: a higher wettability (37.2 ± 2.6°) than control (88.6 ± 0.9°) | Treated CFR- and GFR-PEEK exhibited significantly higher SBS than control | Okwa et al., 2020 [ | |
| N, Ar, O, Air plasma treatment | The surface of plasma treated PEEK | An average surface roughness value of 1.01 ± 0.21 μm after polishing | N (10.04 ± 1.84 MPa) > Ar (9.56 ± 1.35 MPa) > Air (9.27 ± 1.33 MPa) > O (8.59 ± 1.64 MPa) > Untreated (5.38 ± 2.90 MPa) | Younis et al., 2019 [ | |
| O2 plasma and Ar/O2 (1:1) plasma 35 min treatment for unfilled PEEK veneered with composite (Gradia) | O2 plasma treated (0.76 ± 0.21 μm) > untreated (0.75 ± 0.14 μm); Ar/O2 plasma treated (0.68 ± 0.21 μm) < untreated (0.79 ± 0.22 μm) | Ar/O2 plasma treated (θ at 2.8 ± 1.3°) < O2 plasma treated (θ at 0.0 ± 0.0°) | O2 plasma treated (28.69 ± 4.20 MPa) > Ar/O2 plasma treated (24.48 ± 3.22 MPa) > untreated (18.25 ± 5.15 MPa) | Bötel et al., 2018 [ | |
| O2 plasma and Ar/O2 (1:1) plasma 35 min treatment for | O2 plasma treated (2.1 ± 0.78 μm) > untreated (2.08 ± 0.89 μm); Ar/O2 plasma treated (2.86 ± 0.21 μm) < untreated (3.13 ± 0.15 μm) | Ar/O2 plasma treated (θ at 2.0 ± 1.6°) < O2 plasma treated (θ at 0.0 ± 0.0°) | Ar/O2 plasma treated (31.54 ± 3.49 MPa) > O2 plasma treated (30.38 ± 5.56 MPa) > untreated (17.31 ± 1.93 MPa) | Bötel et al., 2018 [ |
Abbreviation: SEM, scanning electron microscope; FTIR, Fourier transform infrared spectroscopy spectra; AFM, atomic force microscopy; H, hydrogen plasma; O, oxygen plasma; H/O, hydrogen/oxygen; CFR-PEEK, carbon fiber reinforced-PEEK; GFR-PEEK, glass fiber reinforced-PEEK; He, helium plasma; Ar, argon plasma; N, nitrogen plasma; EUV, extreme ultraviolet; Gradia, veneer composite (GC GRADIA®, GC Europe, Leuven, Belgium).
The application of sandblasting for the improvement of PEEK adhesion behavior.
| Strategies | Microscopic Analyses | Mean Roughness Values (Ra, μm) | Wettability Assays, | Shear Bond Strength (SBS, MPa) | Reference, Author, Year |
|---|---|---|---|---|---|
| Sandblasting (S, 50 µm), | S: grooved fissured surface structure | LS (2.9 ± 0.1 μm) and PS (2.7 ± 0.1 μm) > S > L (1.3 ± 0.1 μm) and P (1.4 ± 0.1 μm) > Untreated | LS (θ at 6.9 ± 0.7°) and PS (θ at 4.9 ± 0.2°) > S (θ at 8.8 ± 0.6°) > L (θ at 19.6 ± 0.8°) and P (θ at 21.5 ± 2.2°) > Untreated (θ at 34.6 ± 2.2°) | LS (22.0 ± 1.3 MPa) and PS (21.2 ± 0.8 MPa) > S (17.4 ± 2.4 MPa) > L (10.1 ± 1.2 MPa) and P (12.4 ± 0.7 MPa) > Untreated (8.3 ± 0.6 MPa) | Taha et al., 2022 [ |
| Sandblasting (S, 50 μm, at 0.28 MPa for 15 s); | No significant increase of Ra values | No significant increase of SBS values after various treatment | Tosun et al., 2022 [ | ||
| 110 µm alumina particles, | Alumina particles: increased roughness; | 98% sulfuric acid (2.106 ± 0.186 μm) > alumina particles | 98% sulfuric acid (7.52 ± 1.20 MPa) > alumina particles (3.91 ± 0.59 MPa) | Parkar et al., 2021 [ | |
| Silica-modified sandblasting (SS, 30 μm, at 0.3 MPa for 15 s); | Yb:PL laser (2.85 ± 0.20 μm) > Sandblasting (2.26 ± 0.33 μm) > | Silica-modified sandblasting (θ at 48.4 ± 6.28°) > Acetone (θ at 70.19 ± 4.49°) or Sulfuric acid (θ at 76.07 ± 6.61°) > Untreated (θ at 79.67 ± 4.97°) > Sandblasting (θ at 84.83 ± 4.56°) and Yb:PL laser (θ at 103.6 ± 4.88°) | Sulfuric acid (15.82 ± 4.23 MPa) > Yb:PL laser (11.46 ± 1.97 MPa) > Sandblasting (10.81 ± 3.06 MPa) > Silica-modified sandblasting (8.07 ± 2.54 MPa) > Acetone (5.98 ± 1.54 MPa) or Untreated (5.09 ± 2.14 MPa) | Çulhaoğlu et al., 2020 [ |
Abbreviation: SEM, scanning electron microscope; FTIR, Fourier transform infrared spectroscopy spectra; AFM, atomic force microscopy; Er:YAG, erbium-doped yttrium aluminum garnet laser.
The application of laser treatment for the improvement of PEEK adhesion behavior.
| Strategies | Microscopic Analyses (SEM or AFM Images) | Mean Roughness Values (Ra, μm) | Shear Bond Strength (SBS, MPa) | Reference, Author, Year |
|---|---|---|---|---|
| Er:YAG, Nd:YAG, and KTP lasers (3 W, 20 Hz for 30 s) | Er:YAG: rougher surfaces without any discernable defects; | Nd:YAG (16.35 ± 0.63 MPa) > Er:YAG (14.29 ± 0.49 MPa) > KTP (11.3 ± 0.41 MPa) > Untreated (8.09 ± 0.55 MPa) | Ulgey et al., 2021 [ | |
| Er:YAG laser (1.5 W, 20 s) and CO2 laser (4 W, 50 s). | Er:YAG (14.4 ± 1.7 MPa) > CO2 (10.6 ± 1.9 MPa) > Untreated (7.7 ± 1.8 MPa) | Jahandideh et al., 2020 [ | ||
| 100-μm deep, 150-μm deep, and 200-μm deep Nd:YVO4 laser groove treatments | Nd:YVO4 laser: a surface lattice pattern with regular grooves and undercuts | 200-μm (19.9 ± 1.7 MPa) > 150-μm (19.6 ± 1.6 MPa) > 100-μm (15.9 ± 1.8 MPa) > Untreated (0.5 ± 0.1 MPa) | 200-μm (15.0 ± 5.3 MPa) > 150-μm (14.4 ± 4.8 MPa) > 100-μm (13.2 ± 5.4 MPa) > Untreated (4.5 ± 2.9 MPa) | Tsuka et al., 2019 [ |
| Laser ablation with 200-μm holes spaced 400 μm apart (D2E4); | CO2 laser: good quality and reproducible holes on surfaces, but the resin cement did not penetrate the holes; | PEEK: Sulfuric acid > D2E4 or D2E6 > Combination; | Henriques et al., 2018 [ | |
| Untreated group (C); | C and SS: relatively smooth surfaces and minimal irregularities; L: irregular surface with deeper and narrow pits; S, LS and LSS: irregularities with larger but not deeper valleys and pits | LSS (θ at 2.31 ± 0.52°) > LS (θ at 2.20 ± 0.23°) > L (θ at 1.79 ± 0.29°) or S (θ at 1.58 ± 0.15°) > SS (θ at 1.31 ± 0.25°) or C (θ at 1.03 ± 0.11°) | LSS (13.14 ± 1.45 MPa) > LS (6.35 ± 1.21 MPa) or SS (12.07 ± 2.82 MPa) > S (10.97 ± 2.88 MPa) > L (6.03 ± 1.04 MPa) or C (6.35 ± 1.21 MPa) | Ates et al., 2018 [ |
Abbreviation: SEM, scanning electron microscope; FTIR, Fourier transform infrared spectroscopy spectra; AFM, atomic force microscopy; Er:YAG, erbium-doped yttrium aluminum garnet laser; Nd:YAG, neodymium-doped yttrium aluminum garnet laser; KTP, potassium titanyl phosphate laser; CO2, carbon dioxide; CFR-PEEK, carbon fiber reinforced-PEEK; GFR-PEEK, glass fiber reinforced-PEEK; Nd:YVO4, Neodymium-doped yttrium orthovanadate laser.