| Literature DB >> 35630134 |
Chenglong Huang1, Nuo Xu2,3, Wenqing Wang1, Yihong Hu1, Liang Fang1.
Abstract
Emerging resistive random-access memory (ReRAM) has demonstrated great potential in the achievement of the in-memory computing paradigm to overcome the well-known "memory wall" in current von Neumann architecture. The ReRAM crossbar array (RCA) is a promising circuit structure to accelerate the vital multiplication-and-accumulation (MAC) operations in deep neural networks (DNN). However, due to the nonlinear distribution of conductance levels in ReRAM, a large deviation exists in the mapping process when the trained weights that are quantized by linear relationships are directly mapped to the nonlinear conductance values from the realistic ReRAM device. This deviation degrades the inference accuracy of the RCA-based DNN. In this paper, we propose a minimum error substitution based on a conductance-aware quantization method to eliminate the deviation in the mapping process from the weights to the actual conductance values. The method is suitable for multiple ReRAM devices with different non-linear conductance distribution and is also immune to the device variation. The simulation results on LeNet5, AlexNet and VGG16 demonstrate that this method can vastly rescue the accuracy degradation from the non-linear resistance distribution of ReRAM devices compared to the linear quantization method.Entities:
Keywords: ReRAM; conductance-aware quantization; non-linear conductance levels
Year: 2022 PMID: 35630134 PMCID: PMC9143747 DOI: 10.3390/mi13050667
Source DB: PubMed Journal: Micromachines (Basel) ISSN: 2072-666X Impact factor: 3.523
Figure 1(a) Device structure of the ReRAM cell. (b) The structure of an ReRAM crossbar array.
Figure 2(a) The differential pair structure of RCA; (b) RCA with a constant bias column.
Figure 3Mapping relationship between conductance levels and quantization levels.
Figure 4Conductance states distribution of ideal ReRAM cell and actual ReRAM cell.
Figure 5The conductance representations in a differential pair of ReRAM cells.
Figure 6An example of MES-CAQ.
Figure 7Fitting results for e-exponential model.
Non-linear model parameters [21,22].
| Parameters |
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|---|---|---|---|
| Values | 0.10 |
Figure 8The accuracy results of MES-CAQ in comparison to LQ on (a) LeNet5; (b) AlexNet; (c) VGG16.
Figure 9The accuracy results of MES-CAQ in comparison to LQ with device variation on (a) LeNet5; (b) AlexNet; (c) VGG16.