| Literature DB >> 35629492 |
Abstract
The study of mechanical and chemical phenomena arising within a material that is being subjected to external stress is termed mechanochemistry (MC). Recent advances in MC have revealed the prospect not only to enable a greener route to chemical transformations but also to offer previously unobtainable opportunities in the production and screening of biomaterials. To date, the field of MC has been constrained by the inability of current characterisation techniques to provide essential localised multiscale chemically mapping information. A potential method to overcome this is secondary electron hyperspectral imaging (SEHI). SEHI is a multiscale material characterisation technique applied within a scanning electron microscope (SEM). Based on the collection of secondary electron (SE) emission spectra at low primary beam energies, SEHI is applicable to the chemical assessment of uncoated polymer surfaces. Here, we demonstrate that SEHI can provide in situ MC information using poly(glycerol sebacate)-methacrylate (PGS-M) as an example biomaterial of interest. This study brings the use of a bespoke in situ SEM holder together with the application of SEHI to provide, for the first time, enhanced biomaterial mechanochemical characterisation.Entities:
Keywords: advanced characterisation; biomaterials; biotechnology; hyperspectral imaging; mechanochemistry; multiscale analysis; polymer chemistry; scanning electron microscope; secondary electron hyperspectral imaging; surface analysis
Year: 2022 PMID: 35629492 PMCID: PMC9144768 DOI: 10.3390/ma15103462
Source DB: PubMed Journal: Materials (Basel) ISSN: 1996-1944 Impact factor: 3.748
Figure 1(A) Schematic outlining the forces present when implementing a three-point bending test; (B) a Nav Cam image taken within a scanning electron microscope (SEM) chamber of a bespoke SEM sample holder subjecting PGS-M to both compression and tension; (C) an image showing the bespoke SEM holder attached onto an SEM stage; (D) an image showing the range of differing SEM holders with adjustable angles for material flexion.
Figure 2(A) A conventional SEM image of PGS-M under compression taken using an Everhart Thornley detector (ETD); (B) a conventional SEM image of PGS-M under tension taken using an Everhart Thornley detector (ETD); (C) a secondary electron (SE) image of PGS-M under tension taken using a through-lens detector (TLD) at a horizontal field of view of 25 μm; (D) a secondary electron (SE) image of PGS-M under compression taken using a through-lens detector (TLD) at a horizontal field of view of 25 μm.
Figure 3(A) Secondary electron spectra (SES) for regions of PGSM under compression (n = 6) and tension (n = 6). SE spectra collected from an ROI of 3 × 3 μm using the Helios FEI Helios G4 CX DualBeam microscope. (B) SES for regions of PGS-M under compression (n = 6) and tension (n = 6). SE spectra collected from an ROI of 600 × 600 nm using the Helios FEI Helios G4 CX DualBeam microscope. (C) SES spectra for regions of PGS-M under compression (n = 6) and tension (n = 6). SE spectra collected from an ROI of 300 × 300 nm using the Helios FEI Helios G4 CX DualBeam microscope. (D) SES spectra for regions of PGS-M under compression (n = 6) and tension (n = 6). SE spectra collected from an ROI of 150 × 150 nm using the Helios FEI Helios G4 CX DualBeam microscope.
Figure 4(A) Secondary electron spectra (SES) for regions of PGSM under compression (n = 6) and tension (n = 6) collected using the Helios FEI Helios G4 CX DualBeam microscope. The SE spectra highlights an energy window of 2.4 eV selected for SEHI mapping. (B) Secondary electron (SE) images of PGS-M under (i) tension and (ii) compression, taken using a through-lens detector (TLD) (10 μm scale bar). (C) Secondary electron hyperspectral imaging (SEHI) image of PGS-M under (i) tension and (ii) compression, taken using a through-lens detector (TLD) (10 μm scale bar).