| Literature DB >> 35478488 |
Xiaochen Wu1,2, Zhao Guo3, Shuang Zhu1,4, Bingbing Zhang5, Sumin Guo2, Xinghua Dong1, Linqiang Mei1,4, Ruixue Liu1, Chunjian Su2, Zhanjun Gu1,4.
Abstract
Inorganic perovskite quantum dots CsPbX3 (X = Cl, Br, and I) has recently received extensive attention as a new promising class of X-ray scintillators. However, relatively low light yield (LY) of CsPbX3 and strong optical scattering of the thick opaque scintillator film restrict their practical applications for high-resolution X-ray microscopic imaging. Here, the Ce3+ ion doped CsPbBr3 nanocrystals (NCs) with enhanced LY and stability are obtained and then the ultrathin (30 µm) and transparent scintillator films with high density are prepared by a suction filtration method. The small amount Ce3+ dopant greatly enhances the LY of CsPbBr3 NCs (about 33 000 photons per MeV), which is much higher than that of bare CsPbBr3 NCs. Moreover, the scintillator films made by these NCs with high density realize a high spatial resolution of 862 nm thanks to its thin and transparent feature, which is so far a record resolution for perovskite scintillator-based X-ray microscopic imaging. This strategy not only provides a simple way to increase the resolution down to nanoscale but also extends the application of as-prepared CsPbBr3 scintillator for high resolution X-ray microscopic imaging.Entities:
Keywords: X-ray microscopic imaging; perovskite nanocrystals; resolution; scintillator film
Year: 2022 PMID: 35478488 PMCID: PMC9189653 DOI: 10.1002/advs.202200831
Source DB: PubMed Journal: Adv Sci (Weinh) ISSN: 2198-3844 Impact factor: 17.521
Figure 1Crystal structure and photoluminescence (PL) characterization of Ce3+‐doped CsPbBr3 NCs. a) Crystal structure of the Ce3+ doped CsPbBr3 NCs. b) TEM image of Ce3+‐doped (8%) CsPbBr3 NCs and corresponding HRTEM image (top right). c) TEM image of CsPbBr3 NCs and corresponding HRTEM image (top right). d) Powder XRD pattern of the undoped and Ce3+‐doped CsPbBr3 NCs. e) PL spectra of the CsPbBr3 NCs with different Ce3+ ions content. f) PL decay curve of Ce3+‐doped (8%) CsPbBr3 NCs.
Figure 2Preparation and characterization of scintillator film. a) Scheme of the scintillator film synthesis procedure by the suction filtration method. b) Top view of the scintillator film without PS protective layer. c) SEM image of the side scintillator film with PVDF substrate and d) its enlarged view. e) Photograph of the scintillator film on the top of the logo. f) Photographs of the flexible scintillator film and g) a large area scintillator film (50 cm2). h) Photograph of the “IHEP” logo under X‐ray illumination.
Figure 3Radioluminescence (RL) characterization of as‐prepared scintillator film. a) Schematic of the testing system for RL intensity measurement. b) RL spectra of CsPbBr3 NCs with different Ce3+ doping concentrations. c) RL spectra of the scintillator films prepared by spin‐coated and suction filtration methods in the same thickness. d) Light yield of CsPbBr3 NCs with different Ce3+ doping concentrations. e) Radiation stability of CsPbBr3 NCs and CsPbBr3 with 8% Ce3+ doping concentration under continuous X‐ray irradiation for 1200 s and f) repeated cycles of X‐ray excitation with a time interval of 300 s. RL intensity measurements for g) undoped and h) Ce3+‐doped (8%) CsPbBr3‐based scintillator films as a function of different X‐ray dose rates. i) Environmental stability of scintillator film with PS protection layer within a month. j) RL responses of the scintillator film to Beijing Sychrotron Radiation Facility (BSRF). The change of gray value along the k) y direction and l) x direction of j).
Figure 4X‐ray microscopic imaging system and resolution. a) Schematic of the X‐ray microscopic imaging system. b,c) SEM images of the line pair card. d,e) X‐ray microscopic images of the line pair card and f) modulation transfer function (MTF) curve of the X‐ray microscopic imaging system using an objective lens with magnification of 40. The thickness of scintillator film used in this imaging system is 30 µm. g,h) The X‐ray microscopic images of the center area of the line pair card. i) The change of gray value along the line in e).
Figure 5Application of this X‐ray microscopic imaging system. a) SEM image, b) optical microscopic image, and c) X‐ray microscopic image of the copper mesh. d) Onion epidermal cells stained with iodine solution of potassium iodide (top) and its X‐ray microscopic image (bottom). e) Photograph of the chip (top) and its X‐ray microscopic image (bottom). f) Photograph of the storage card (top) and its X‐ray microscopic image (bottom).