| Literature DB >> 35044784 |
Serhii Polishchuk1, Michele Puppin1, Alberto Crepaldi2,3, Gianmarco Gatti2, Dmitry N Dirin4,5, Olga Nazarenko4,5, Nicola Colonna6,7, Nicola Marzari7, Maksym V Kovalenko4,5, Marco Grioni2, Majed Chergui1.
Abstract
Describing the nanoscale charge carrier transport at surfaces and interfaces is fundamental for designing high-performance optoelectronic devices. To achieve this, we employ time- and angle-resolved photoelectron spectroscopy with ultraviolet pump and extreme ultraviolet probe pulses. The resulting high surface sensitivity reveals an ultrafast carrier population decay associated with surface-to-bulk transport, which was tracked with a sub-nanometer spatial resolution normal to the surface, and on a femtosecond time scale, in the case of the inorganic CsPbBr3 lead halide perovskite. The decay time exhibits a pronounced carrier density dependence, which is attributed via modeling to enhanced diffusive transport and concurrent recombination. The transport is found to approach an ordinary diffusive regime, limited by electron-hole scattering, at the highest excitation fluences. This approach constitutes an important milestone in our capability to probe hot-carrier transport at solid interfaces with sub-nanometer resolution in a theoretically and experimentally challenging, yet technologically relevant, high-carrier-density regime.Entities:
Keywords: diffusion; electronic structure; lead halide perovskites; nanoscale charge carrier transport; semiconductors; ultrafast photoelectron spectroscopy
Year: 2022 PMID: 35044784 PMCID: PMC8832496 DOI: 10.1021/acs.nanolett.1c03941
Source DB: PubMed Journal: Nano Lett ISSN: 1530-6984 Impact factor: 11.189
Figure 1Schematic view of the experiment. The numbered arrows correspond to (1) carrier transport into the bulk and (2) lateral transport across the surface.
Figure 2Electronic structure of CsPbBr3: (a) experimentally measured constant energy map as a function of the in-plane electron momentum of the lowest CB (shown in the top right corner) overlapped with a DFT simulation; (b) Dispersions of the VB and the CB measured at t = 100 fs (the color scale of the upper part of the image was multiplied by a factor of 5) overlapped with the DFT bands at k = π/a (red) and k = 0 (blue). Black dashed lines indicate the integration range used to obtain Figure . Violet arrows indicate the allowed pump excitation. Note: the experimental surface sensitivity leads to an additional partial integration along the k, as explained in ref (17).
Figure 3TR-ARPES data: (a) time evolution of the integrated photoemission intensity maps (the integration range is indicated by dashed lines in Figure b); (b) Gaussian fits of the integrated maps at the two time delays indicated by vertical lines in (a); (c) temporal dynamics of the CB population with a biexponential fit to the data. The time delay of 0 fs is fixed at the half-rise of the signal. The error bars indicate standard deviations of the Gaussian fit of the peak areas. The blue Gaussian represents the cross-correlation of the pump and probe pulses.
Figure 4Temporal evolution of the CB population (a) Biexponential fits (lines) to the experimental data (circles). The legend shows the incident pump fluence of the corresponding scan. The traces are offset by 100 arb.u. for better visibility. (b) The time scale of the fast decay component τfast as a function of electron–hole pair density in the probed volume. The vertical error bars indicate standard deviations of the plotted fit parameters. The horizontal error bars indicate estimated uncertainties originating from pump power fluctuations.
Figure 5Results of modeling charge carrier density evolution in the probed volume: (a) carrier density dependence of the diffusion coefficient originating from carrier degeneracy (Ddeg, blue) and electron–hole scattering (Deh, orange), overlapped with the combined dependence calculated according to Matthiessen’s rule (Dtheor, red) and with the effective diffusivity extracted from the global fit of the solutions of eq to the experimental data under the assumption of its linear variation at low N (Deff, green); (b) comparison of selected simulated traces (with normalized amplitude) extracted by solving eq , incorporating the diffusivity dependences D(N) depicted in (a) by red and green, correspondingly; (c) comparison of density dependences of τfast extracted from global biexponential fits to the experimental data (blue) and to the green and red traces in (b), correspondingly. The error bars indicate standard deviations of the plotted fit parameters.