| Literature DB >> 34257338 |
Christiane Ader1, Andreas Falkenstein1, Manfred Martin2,3,4.
Abstract
Resistive switching is an important phenomenon for future memory devices such as resistance random access memories or neuronal networks. While there are different types of resistive switching, such as filament or interface switching, this work focuses on bulk switching in amorphous, binary oxides. Bulk switching was found experimentally in different oxides, for example in amorphous gallium oxide. The forms of the observed current-voltage curves differ, however, fundamentally. Even within the same material, both abnormal bipolar and normal bipolar resistive switching were found. Here, we use a new drift-diffusion model to theoretically investigate bulk switching in amorphous oxides where the electronic conductivity can be described by Mott's concept of a mobility edge. We show not only that a strong, non-linear dependence of the electronic conductivity on the oxygen content is necessary for bulk switching but also that changing the geometry of the memristive device causes the transition between abnormal and normal bipolar switching.Entities:
Year: 2021 PMID: 34257338 PMCID: PMC8277833 DOI: 10.1038/s41598-021-93777-6
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1Geometry of the 2D rotational symmetric model. The oxide (light grey) completely covers the bottom electrode (BE), while the top electrode (TE) does not have to cover the whole top of the oxide, but can be smaller as shown here.
Figure 2Schematic density of states in amorphous solids. Occupation for energies up to the Fermi energy for is shown in blue hatched. Occupations for higher temperatures have to be calculated using the Fermi function (yellow). Within the mobility gap (red area) states are localised. Only electrons above the mobility edge (ME) (right green area) contribute to the electronic conductivity while electrons in the localised states are immobile and therefore have no contribution to the conductivity[27,28].
Basic parameters for the simulation.
| 1 | Oxygen diffusion coefficient | |
| 3 | Charge number of cation M | |
| 1.0 | Initial composition of MO | |
| Conductivity of the electrons at infinite high temperature | ||
| 1 eV | Fitting parameter for the electronic conductivity | |
| Fitting parameter for the electronic conductivity | ||
| Molar volume of the oxide MOn | ||
| 100 nm | Distance between TE and BE | |
| 0.02 V | Maximum voltage for the triangular voltage sweep | |
| 0 | ||
| 120 s (1D) | Time for one cycle equivalent to a sweeprate of | |
| 30 s (3D) | ||
| 298 K | Temperature |
Figure 31D-simulation with basic parameters (see Table 1). (a) The first six cycles of the I–V curve are displayed and show abnormal bipolar resistive switching. The numbered arrows indicate the temporal development, which is identical for all cycles. (b) Composition profiles (black) and electronic conductivity profiles (note the log-scale for the conductivity in red) after one quarter of a cycle when the maximum voltage is applied. The dotted lines indicate the first cycle while the solid lines indicate the steady cycles. The bottom electrode is on the left side, while the top electrode is on the right side.
Figure 4I–V curves for the variation of the diffusion coefficient in 1D with all other parameters fromTable 1. (a) Variation of the diffusion coefficient over five orders of magnitude. (b) Simulation with a high diffusion coefficient of the oxygen ions and a small cycle time
Figure 5I–V curves for 1D-simulations with parameters from Table 1. (a) Variation of the maximum voltage . (b) Variation of the sweeprate SR. (c) Variation of the sample’s thickness d. (d) Variation of the initial composition . In order to show all graphs in the same window they are scaled by the factor stated in the legend. The inset shows the unscaled current densities at the voltage of 0.02 V.
Figure 6I–V curve for a 1D-simulation with high voltage. The diffusion coefficient for the oxygen ions is and the voltage is All other parameters are listed in Table 1.
Figure 73D-simulations with parameters from Table 1. (a) Variation of the size of the bottom electrode (BE). The size of the top electrode (TE) is kept constant, while the diameter of the BE and the oxide layer vary in size. The circles indicate the location of the intersection point. Note that the green curve () is completely covered by the yellow curve. (b) Contour plot of the electrochemical potential of the oxygen ions at the maximum voltage of 0.02 V after the first quarter of a steady cycle. Shown is the cross section across the centre of the device. The electrodes are shown in grey with the TE being much smaller than the BE, corresponding to the yellow curve with a BE-area of in (a). (c) y-component of the gradient of the electrochemical potential of the oxygen ions in (b) at the BE ().
Figure 8Experimental I–V curve at 25 C of a 90 nm thick substoichiometric amorphous Gallium oxide thin film with a sweeprate of . The TE has a diameter of 200 µm and the BE a size of 1 cm 1 cm. Reprinted by permission from Springer Nature Limited: Springer Nature, Nature Communications[6] (Aoki et al). Copyright (2014).
Figure 9Concentration profiles of the oxygen ions along the rotational axis of the device for a 2D rotational symmetric simulation with basic parameters (see Table 1) and a BE with . The BE is at 0 m while the TE is at m. This is only the first quarter of a steady I–V curve.