The temperature-sensitive luminescence of nanoparticles enables their application as remote thermometers. The size of these nanothermometers makes them ideal to map temperatures with a high spatial resolution. However, high spatial resolution mapping of temperatures >373 K has remained challenging. Here, we realize nanothermometry with high spatial resolutions at elevated temperatures using chemically stable upconversion nanoparticles and confocal microscopy. We test this method on a microelectromechanical heater and study the temperature homogeneity. Our experiments reveal distortions in the luminescence spectra that are intrinsic to high-resolution measurements of samples with nanoscale photonic inhomogeneities. In particular, the spectra are affected by the high-power excitation as well as by scattering and reflection of the emitted light. The latter effect has an increasing impact at elevated temperatures. We present a procedure to correct these distortions. As a result, we extend the range of high-resolution nanothermometry beyond 500 K with a precision of 1-4 K. This work will improve the accuracy of nanothermometry not only in micro- and nanoelectronics but also in other fields with photonically inhomogeneous substrates.
The temperature-sensitive luminescence of nanoparticles enables their application as remote thermometers. The size of these nanothermometers makes them ideal to map temperatures with a high spatial resolution. However, high spatial resolution mapping of temperatures >373 K has remained challenging. Here, we realize nanothermometry with high spatial resolutions at elevated temperatures using chemically stable upconversion nanoparticles and confocal microscopy. We test this method on a microelectromechanical heater and study the temperature homogeneity. Our experiments reveal distortions in the luminescence spectra that are intrinsic to high-resolution measurements of samples with nanoscale photonic inhomogeneities. In particular, the spectra are affected by the high-power excitation as well as by scattering and reflection of the emitted light. The latter effect has an increasing impact at elevated temperatures. We present a procedure to correct these distortions. As a result, we extend the range of high-resolution nanothermometry beyond 500 K with a precision of 1-4 K. This work will improve the accuracy of nanothermometry not only in micro- and nanoelectronics but also in other fields with photonically inhomogeneous substrates.
Thermometry on the
microscopic scale is an essential characterization
tool for the development of nano- and microelectronic devices.[1−4] However, conventional thermometers like thermocouples are often
unable to reliably measure the temperature on this length scale due
to their size. An additional drawback is the requirement of direct
contact between the sensing element and the temperature-registration
instrument. The development of remote temperature sensing by optical
thermometry techniques partially solved this issue. These techniques
rely on temperature-dependent blackbody radiation (infrared thermography),[5] Raman scattering,[6,7] reflectance,[8] luminescence,[9] or
other optical properties.[10] Thermometry
based on luminescence is particularly interesting since it is easily
implemented, requiring only the deposition of a luminescent material
in or on a sample of interest and the detection of its luminescence.
The development of bottom-up synthesis methods for luminescent materials
with nanoscale dimensions opened up the field of luminescence nanothermometry[11] with a dramatically enhanced spatial resolution.
Therefore, luminescence nanothermometry is currently developing into
the method of choice for temperature measurements in microscopy.[12−16]Several luminescence properties of a nanothermometer can serve
as a measure of temperature. The luminescence intensity ratio (LIR)
between two emission bands is a popular choice because it is generally
considered insensitive to experimental parameters such as excitation
intensity, alignment, or the amount of deposited thermometer material.
Typical nanothermometers used in LIR thermometry consist of an inorganic
host crystal doped with lanthanide (Ln3+) ions, which become
luminescent due to 4f–4f transitions. The minor spectral overlap
between these transitions and their narrow linewidth prevents systematic
errors and provides high accuracy in the determination of the LIR.
An additional advantage of Ln3+-doped nanocrystals is the
possibility to efficiently generate upconversion luminescence, that
is, the emission of one high-energy photon after the absorption of
at least two low-energy photons.[17,18] Via this process,
infrared excitation can lead to visible luminescence. While detection
of visible luminescence is straightforward with a standard camera
or a photodiode, excitation with infrared light prevents background
fluorescence, a common issue of conventional down-shifting luminescence,
that is, excitation with one high-energy photon resulting in the emission
of one low-energy photon. These properties of upconversion nanoparticles
guarantee accurate determination of the LIR and thus reliable temperature
measurements.Typical applications of upconversion nanoparticles
in thermometry
on the microscopic scale are in cell biology and microelectronics.
Upconversion luminescence from Er3+/Yb3+-doped
nanoparticles is well known for temperature mapping in these fields,[12,13,16] but Eu3+/Tb3+- and Eu3+/Sm3+-doped systems have also been
used.[14,15] Using these nanoparticles, a high spatial
resolution is achieved by spatially mapping the LIR using either wide-field
or confocal microscopy. Thermometry via wide-field microscopy is a
fast technique as it directly images the intensity maps of two emission
bands using bandpass filters. Dividing the two images yields the spatially
resolved LIR, which easily translates to a temperature map. Confocal
microscopy is a slower technique as a laser spot scans the sample
to construct an image. However, it can provide a spectrum for every
pixel enabling a more reliable determination of the LIR. Both techniques
are mainly used to probe temperatures up to ∼350 K. Recent
work by our group demonstrated that it is possible to extend the temperature
range to 873 K using luminescent microcrystals.[3] In this previous work, deposition of the microcrystals
on a microheater designed for in situ transmission electron microscopy
(TEM) experiments revealed a temperature profile with a spatial resolution
of roughly 10 μm. However, these microheaters and other microelectromechanical
systems (MEMS) contain structures with dimensions smaller than 1 μm.[19] A higher spatial resolution of luminescence
thermometry at elevated temperatures is thus crucial for its implementation
in MEMS technology.In this work, we develop a combined microscopy
and data analysis
approach to map elevated temperatures with a high spatial resolution.
In particular, we measure the local temperatures on a MEMS-based microheater
using confocal microscopy mapping of the two green emission bands
of NaYF4:Er3+,Yb3+ upconversion nanoparticles.
The demand for a high spatial resolution comes with intrinsic challenges
due to the higher excitation powers necessary to obtain a sufficient
signal[20,21] and due to inhomogeneities of the optical
environment of nanothermometers. We characterize both phenomena and
develop data analysis procedures to correct them. This enables a quantitative
study of the temperature profile generated by the microheater at elevated
temperatures up to 523 K.
Experimental Section
Sample
Preparation
The synthesis procedure reported
in the work of Geitenbeek et al. was used to obtain multiple batches
of NaYF4:Er3+(2%),Yb3+(18%) nanoparticles
dispersed in cyclohexane.[17] Deposition
of the nanoparticles was achieved by drop casting on a microheater
(Wildfire Nano-Chips, commercially available from DENSsolutions).
The thickness of the dried nanoparticle layer (a few μm) was
estimated using the concentration of the nanoparticle dispersion.
Microcrystalline NaYF4:Er3+(2%),Yb3+(18%) samples were obtained following the
procedure of Krämer et al.[22]
Characterization
The particle size and morphology were
investigated using an FEI Tecnai 12 transmission electron microscope
operating at 120 keV. Samples were prepared by drying the diluted
nanoparticle dispersion onto carbon-coated copper grids. The luminescence
of the dried nanoparticle layer was mapped using a Nikon TE2000-S
inverted microscope fitted with a C1si confocal scanner.[23] A 980 nm laser diode was connected to the confocal
scanner head using a single-mode fiber. The laser light was reflected
using a 680 nm shortpass dichroic mirror and focused on the nanoparticle
layer using a 10× CFI Plan Fluor (NA = 0.3) air objective or
a 40× CFI S Plan Fluor ELWD (NA = 0.6) air objective. The luminescence
was directed back to the confocal scanner head by the same objective,
passed through the dichroic mirror, coupled into a 50 μm multimode
fiber, passed through a 680 nm shortpass filter, dispersed by an equilateral
SF10 glass prism (Linos), and finally detected using a back-illuminated
CCD (Princeton Instruments, NTE/CCD-1340). All maps were obtained
with a pixel dwell time of 100 ms. For the calibration of the luminescence,
powders of dried nanoparticles were heated with a Linkam THMS600 microscope
stage. Selective excitation of the microcrystalline NaYF4:Er3+(2%),Yb3+(18%) sample with 404 and 448
nm light was carried out using an Edinburgh Instruments FLS920 spectrofluorometer
equipped with TMS300 monochromators, a R928 photomultiplier tube,
and a Xe lamp (450 W). The reflection measurements were performed
on a Nikon Ti-U inverted microscope. The microheater was illuminated
in wide field with a broad-spectrum LED (Lumencor Sola) by a 40×
Nikon CFI Plan Fluor (NA = 0.75) air objective. The reflected light
was collected by the same objective and collimated outside of the
microscope using a relay lens system. The light was focused on a mechanical
slit at the entrance of an Andor Kymera 193i spectrometer and dispersed
with a 150 lines/mm grating on an Andor iXon EMCCD.
Simulation
Finite element simulations were carried
out using COMSOL Multiphysics. The electric currents and heat transfer
modules were two-way coupled to include the temperature-dependent
resistivity. The model assumes a vacuum environment. Convective heat
transfer through air is not taken into account, but radiation is included.
The validity of the model was shown in our previous work.[24]
Results and Discussion
The microheater
consists of a spiral-shaped metal that is embedded
between two layers of silicon nitride that form a membrane (Figure a,b).[24] A silicon substrate supports the membrane with
the microheater and enables loading into a dedicated TEM holder. Four
metal needles connect the holder with the metal contacts of the microheater.
By applying a voltage across two of the contacts, a current flows,
which induces Joule heating. The two other contacts are used to measure
resistance. The metal has a linear relationship between resistance
and temperature, which is exploited to measure and control the temperature. Figure c shows the temperature
profile at a center temperature of 523 K as predicted by a finite
element model.[24] The geometry of the metal
spiral was designed to generate a homogeneous temperature in the center
area where the electron microscopy users place their samples. Outside
this area, over a distance of 175 μm between the heating spiral
and the silicon substrate, the temperature shows a steep gradient
to room temperature at the edges of the membrane. This is explained
by the low thermal conductivity of silicon nitride, which minimizes
heat loss through the membrane. The much higher thermal conductivity
of the silicon substrate ensures that the substrate remains at room
temperature. Measuring the gradient requires a thermometry technique
with a high spatial resolution.
Figure 1
A microheater for an in situ TEM experiment.
(a) Magnification
of the microheater design. The metal heating spiral (orange) is embedded
in a silicon nitride membrane (blue). Electron microscopy users place
their samples on the electron-transparent silicon nitride windows
in the center of the heater. The scale bar is 1 cm, 1 mm, and 175
μm for the bottom, middle, and top magnification, respectively.
(b) Side view of the microheater. A silicon substrate supports the
silicon nitride membrane with the encapsulated molybdenum heating
spiral. Due to its low thermal conductivity, silicon nitride acts
as a thermal insulator between the heater and the silicon substrate.
This way a steep temperature gradient is realized between the edge
of the heating spiral and the 400 μm-thick silicon substrate,
which remains at room temperature. (c) Temperature profile across
the membrane and the microheater for a center temperature of 523 K
simulated with a finite element model. The scale bar is 175 μm.
A microheater for an in situ TEM experiment.
(a) Magnification
of the microheater design. The metal heating spiral (orange) is embedded
in a silicon nitride membrane (blue). Electron microscopy users place
their samples on the electron-transparent silicon nitride windows
in the center of the heater. The scale bar is 1 cm, 1 mm, and 175
μm for the bottom, middle, and top magnification, respectively.
(b) Side view of the microheater. A silicon substrate supports the
silicon nitride membrane with the encapsulated molybdenum heating
spiral. Due to its low thermal conductivity, silicon nitride acts
as a thermal insulator between the heater and the silicon substrate.
This way a steep temperature gradient is realized between the edge
of the heating spiral and the 400 μm-thick silicon substrate,
which remains at room temperature. (c) Temperature profile across
the membrane and the microheater for a center temperature of 523 K
simulated with a finite element model. The scale bar is 175 μm.Calibration of the resistance–temperature
relation of the
heater is currently done using Raman spectroscopy. Silicon particles
are deposited on the microheater, which is inserted into a vacuum
chamber to imitate the conditions of an electron microscopy experiment.
The position of the silicon peak in the Raman spectrum around 520
cm–1 is used as a measure of temperature.[6,25] Although the size of the Raman laser spot (1 μm) guarantees
a high spatial resolution, the temperature uncertainty can be as high
as 13 K at 523 K.[24] The aim of our luminescence
thermometry technique is thus to measure temperature with a similar
spatial resolution but a lower temperature uncertainty.The
discussion of our technique starts with the characterization
of the luminescent thermometers. We use hexagonal NaYF4 nanoparticles doped with 2% Er3+ and 18% Yb3+. The choice of this specific composition is motivated by its relatively
high upconversion quantum yield.[26] Using
a colloidal synthesis procedure,[17] we first
produce cubic α-NaYF4:Er3+(2%),Yb3+(18%) nanoparticles and further
heat these to 573 K to obtain hexagonal β-NaYF4:Er3+(2%),Yb3+(18%) nanoparticles with a diameter of
32 ± 1 nm (Figure a,b). Excitation with 980 nm light yields bright green upconversion
emission due to the radiative transitions in Er3+ from
the thermally coupled 2H11/2 and 4S3/2 levels to the 4I15/2 ground
state (Figure c).
Thermal coupling between these levels leads to stronger luminescence
from the higher-excited level upon a temperature (T) increase, which follows Boltzmann statistics[27]where kB is the Boltzmann
constant and ΔE is
the energy difference between the thermally coupled levels. Ii and Ai are the
integrated luminescence intensity and the spontaneous emission rate
from excited state i to the ground state with degeneracy gi, respectively. If ΔE is known
(for example from the literature), one could extract the exponential
prefactor C from the intensity ratio in an emission
spectrum. However, such a “calibration-free” procedure
introduces an additional error. We therefore fit the LIR between the 2H11/2 and 4S3/2 emissions
at various temperatures to the Boltzmann model in eq and find a ΔE value of 759 cm–1 (Figure d), which is in agreement with ΔE values from the literature.[17] This model can thus serve as calibration for our thermometers to
accurately measure temperature.
Figure 2
Upconversion nanoparticles: their fabrication
and luminescence.
(a) Schematic of the two-step synthesis of the nanoparticles—small
cubic α-NaLnF4 (Ln3+ = Y3+,
Er3+, or Yb3+) particles form at room temperature
followed by growth to larger β-NaLnF4 particles at
573 K. These particles are deposited on the microheater by drop casting.
(b) TEM image of NaYF4:Er3+(2%),Yb3+(18%) nanoparticles with a diameter of 32 ± 1 nm. The scale
bar is 50 nm. (c) Green upconversion luminescence of the nanoparticles
upon 980 nm excitation (1.0 kW cm–2) at various
temperatures ranging from 303 K (dark red) to 573 K (yellow). (d)
The logarithm of the ratio between the integrated intensities from
(c) vs the reciprocal temperature (colored dots). The integration
boundaries for the 2H11/2 and 4S3/2 emissions are 510–530 nm and 537–560 nm,
respectively. The blue line is a fit of the experimental ratios to
the Boltzmann model of eq .
Upconversion nanoparticles: their fabrication
and luminescence.
(a) Schematic of the two-step synthesis of the nanoparticles—small
cubic α-NaLnF4 (Ln3+ = Y3+,
Er3+, or Yb3+) particles form at room temperature
followed by growth to larger β-NaLnF4 particles at
573 K. These particles are deposited on the microheater by drop casting.
(b) TEM image of NaYF4:Er3+(2%),Yb3+(18%) nanoparticles with a diameter of 32 ± 1 nm. The scale
bar is 50 nm. (c) Green upconversion luminescence of the nanoparticles
upon 980 nm excitation (1.0 kW cm–2) at various
temperatures ranging from 303 K (dark red) to 573 K (yellow). (d)
The logarithm of the ratio between the integrated intensities from
(c) vs the reciprocal temperature (colored dots). The integration
boundaries for the 2H11/2 and 4S3/2 emissions are 510–530 nm and 537–560 nm,
respectively. The blue line is a fit of the experimental ratios to
the Boltzmann model of eq .As nanothermometry requires high
excitation intensities to obtain
a sufficient signal, we must understand how not only temperature but
also intense excitation changes the upconversion emission spectrum
(Figure a). We observe
an upconversion emission band at 555 nm that becomes stronger with
the increasing excitation intensity. With reference measurements,
upon excitation into (404 nm) or just below (448 nm) the 2H9/2 state of Er3+ (Figure b), we can show that the 555 nm emission
must be due to radiative relaxation from the 2H9/2 state to the first-excited state (4I13/2)
of Er3+. The 2H9/2 emission becomes
stronger in the upconversion spectrum at a higher excitation intensity.
This is consistent with a 2H9/2 population mechanism
requiring upconversion of three 980 nm photons compared to the two
photons that were needed to populate the 4S3/2 and 2H11/2 levels (Figure c and Figure S2). As the 2H9/2 → 4I13/2 upconversion emission partially overlaps with the emission
from the 4S3/2 state, we must take care when
integrating the spectral bands to determine the LIR. If we naively
integrated between the wavelength boundaries of the 2H11/2 and 4S3/2 emissions (Figure d), we would overestimate the 4S3/2 intensity at higher excitation powers and
therefore, using eq , underestimate the temperature. A possible solution would be to
only integrate the part of the 4S3/2 band without
an overlap with the 2H9/2 emission, effectively
excluding data points. As the relative error on a measurement of photon
counts reduces with higher total counts,[27] a narrow integration boundary would thus result in a larger relative
error of the LIR, leading to a higher temperature uncertainty. To
maintain a low uncertainty for the measured temperature, we design
a correction procedure that removes the 2H9/2 emission.
Figure 3
Multiphoton upconversion. (a) Green upconversion luminescence of
the nanoparticles at different excitation intensities of the 980 nm
laser. (b) Emission spectra of a microcrystalline NaYF4:Er3+(2%),Yb3+(18%) sample at different excitation
wavelengths recorded with a high spectral resolution using a spectrofluorometer.
(c) Simplified energy level diagrams for three different excitation
wavelengths with the absorption, emission, and energy transfer transitions
indicated by solid black, solid-colored, and dashed black arrows,
respectively. (d) Emission spectra of the upconversion nanoparticles
(measured) and a microcrystalline NaYF4:Er3+(2%),Yb3+(18%) sample (reference). Subtracting the reference
spectrum from the nanoparticle spectrum gives the difference spectrum
revealing the spectral shape of the 2H9/2 emission.
Multiphoton upconversion. (a) Green upconversion luminescence of
the nanoparticles at different excitation intensities of the 980 nm
laser. (b) Emission spectra of a microcrystalline NaYF4:Er3+(2%),Yb3+(18%) sample at different excitation
wavelengths recorded with a high spectral resolution using a spectrofluorometer.
(c) Simplified energy level diagrams for three different excitation
wavelengths with the absorption, emission, and energy transfer transitions
indicated by solid black, solid-colored, and dashed black arrows,
respectively. (d) Emission spectra of the upconversion nanoparticles
(measured) and a microcrystalline NaYF4:Er3+(2%),Yb3+(18%) sample (reference). Subtracting the reference
spectrum from the nanoparticle spectrum gives the difference spectrum
revealing the spectral shape of the 2H9/2 emission.The first step of this correction procedure is
to separate the
shapes of the 2H11/2 + 4S3/2 and the 2H9/2 emissions via a similar approach
as presented in the recent work of Rühl et al.[20] Here, we use a microcrystalline NaYF4:Er3+(2%),Yb3+(18%) sample
as a reference. This sample shows negligible 2H9/2 emission upon 980 nm excitation at an intensity of 0.3 kW cm–2 (Figure d)[22] because the surface-to-volume
ratio is much smaller compared to the nanoparticle samples. This results
in a weaker coupling of 4S3/2 with vibrations
in surface species, which leads to a reduced population of 4F9/2 and thereby results in less upconversion from 4F9/2 to 2H9/2.[28] The spectral difference between the reference
and the luminescence that is measured from the nanoparticles then
gives the shape of the 2H9/2 emission. Using
these spectral shapes, we fit a linear combination of the 4S3/2 emission and the 2H9/2 intensity
to each experimental spectrum of a confocal map. Here, we used the
same spectral range for the 4S3/2 and 2H9/2 emissions. Finally, we integrate the 2H11/2 + 4S3/2 emission between appropriate
boundaries to determinate the LIR. We record reference spectra at
various temperatures to apply this procedure to the calibration spectra
(Figure S1) and all spectra of the temperature
mapping experiments. Noticing and correcting this effect of the excitation
intensity is straightforward with confocal microscopy since the measurement
provides a spectrum per pixel. However, this is less straightforward
with wide-field microscopy as it would require a very narrow and selective
bandpass filter for the 4S3/2 emission.To acquire temperature-dependent luminescence from the microheater,
we cover it with a layer of upconversion nanoparticles. Using a confocal
microscope, we scan a 980 nm excitation laser over the microheater
to acquire an array of emission spectra, which we correct using the
above procedure. Integration of the 2H11/2 + 4S3/2 emission at each pixel yields an intensity
map at a set temperature of Tset = 303
K (Figure a). Notably,
the integrated luminescence is stronger on the heating spiral, indicating
that the collection and/or excitation efficiency of the luminescence
is higher on the metal due to its higher reflectivity. The objective
used has a relatively low numerical aperture (NA) of 0.3, corresponding
to a poor detection efficiency. However, its long working distance
makes a large number of measurements possible, including measurements
on a microheater inserted into a vacuum chamber (Figure S3a,b). To demonstrate the full potential of this setup,
we mapped the center of a microheater at 523 K in vacuum with a high
pixel density (Figure S3c). In this intensity
map, we can clearly distinguish the edges of the silicon nitride windows
with an accuracy of ∼1 μm.
Figure 4
Temperature mapping.
(a) Map of the integrated green luminescence
from a microheater coated with upconversion nanoparticles at a set
temperature of 303 K measured in an ambient atmosphere. The intensity
of the 980 nm excitation light was 1.0 kW cm–2.
The measurement provides a spectrum for every pixel. The scale bar
is 50 μm. (b) Converting the ratio of the emission peaks using
the calibration spectra shown in Figure S1 yields a temperature map.
Temperature mapping.
(a) Map of the integrated green luminescence
from a microheater coated with upconversion nanoparticles at a set
temperature of 303 K measured in an ambient atmosphere. The intensity
of the 980 nm excitation light was 1.0 kW cm–2.
The measurement provides a spectrum for every pixel. The scale bar
is 50 μm. (b) Converting the ratio of the emission peaks using
the calibration spectra shown in Figure S1 yields a temperature map.Next, we convert the LIR from each corrected emission spectrum
to construct a temperature map (Figure b). At first sight, the temperature values in the map
seem to be in agreement with the set temperature. However, we notice
a systematic deviation of the apparent temperature on the heating
spiral—it is approximately 4 K lower. This is likely an artifact
of our nanothermometry technique because the heating element cannot
be colder than its surroundings. We exclude the correction procedure
for multiphoton upconversion as the potential origin of this deviation
since the uncorrected temperature maps show a similar trend (Figure S4). In addition, the apparent temperature
did not change at different excitation intensities (Figure S5). Laser heating could therefore not be the cause
of the lower apparent temperature on the heating spiral. This phenomenon
thus requires further investigation to allow for reliable temperature
mapping.We propose that the systematic deviation of the apparent
temperature
between the spiral and the membrane is an intrinsic challenge of nanothermometry
related to inhomogeneities of the photonic environment of the nanothermometers
at the nanoscale.[29] Drexhage was the first
to demonstrate how the emission of fluorescent molecules depends on
the photonic environment, in particular, on the vicinity of a reflective
mirror at a distance of up to a few times the emission wavelength.[30,31] This dependence can be explained as interference of the reflected
emission with direct emission of the molecules, affecting the emission
pattern (that is, the directions in which the emission is strongest)
and the overall spontaneous emission rate.[32] The same interference phenomenon affected the apparent temperatures
in our system. Indeed, the thickness of both the nanoparticle layer
(a few μm) and the silicon nitride membrane is on the order
of the emission wavelength and the microheater can act as a mirror.[33] The emission wavelengths of 4S3/2 and 2H11/2 are slightly different,
so interference affects the emission patterns in different ways. This
changes the LIR of the emission collected by our objective (Figure a). The different
components of the microheater (metal spiral vs silicon nitride membrane)
have different reflectivities, explaining why the interference effect
depends on the location of the nanoparticles on the microheater.
Figure 5
Artifacts
in luminescence thermometry on the microscopic scale.
(a) Schematic of Er-doped nanoparticles
on a mirror. Interference of the direct and the reflected 2H11/2 (green) and 4S3/2 (yellow)
emissions changes the spectrum that is collected using the microscopy
objective. (b) Histograms of the measured temperatures from 1849 pixels
in the center of temperature maps that were obtained with NA values
of 0.3 and 0.6 at room temperature (Figure S6). (c) Intensity of the reflected light from a halogen lamp that
illuminated a location on and off the spiral of a bare microheater.
The spectra were recorded with an NA of 0.75. (d) Temperature difference
between locations on and off the spiral (ΔT) as a function of the set temperature. The green dots show the average
of the experimental ΔT values determined from
40 pixels both on spiral and off spiral. The bars indicate the propagated
errors on ΔT values determined from the standard
deviation of the average apparent temperatures on and off the spiral.
The solid line is a fit of the experimental ΔT values to a model that calculates the temperature dependence of
the temperature error ΔT(T) from Boltzmann thermometers due to the photonic environment (eq ). (e) Temperature map
of the microheater at a set temperature of 523 K measured in an ambient
atmosphere (left). The intensity of the 980 nm excitation light is
1.0 kW cm–. Correction of the
left map using eq yields
the temperature map on the right. The scale bars are 50 μm.
Artifacts
in luminescence thermometry on the microscopic scale.
(a) Schematic of Er-doped nanoparticles
on a mirror. Interference of the direct and the reflected 2H11/2 (green) and 4S3/2 (yellow)
emissions changes the spectrum that is collected using the microscopy
objective. (b) Histograms of the measured temperatures from 1849 pixels
in the center of temperature maps that were obtained with NA values
of 0.3 and 0.6 at room temperature (Figure S6). (c) Intensity of the reflected light from a halogen lamp that
illuminated a location on and off the spiral of a bare microheater.
The spectra were recorded with an NA of 0.75. (d) Temperature difference
between locations on and off the spiral (ΔT) as a function of the set temperature. The green dots show the average
of the experimental ΔT values determined from
40 pixels both on spiral and off spiral. The bars indicate the propagated
errors on ΔT values determined from the standard
deviation of the average apparent temperatures on and off the spiral.
The solid line is a fit of the experimental ΔT values to a model that calculates the temperature dependence of
the temperature error ΔT(T) from Boltzmann thermometers due to the photonic environment (eq ). (e) Temperature map
of the microheater at a set temperature of 523 K measured in an ambient
atmosphere (left). The intensity of the 980 nm excitation light is
1.0 kW cm–. Correction of the
left map using eq yields
the temperature map on the right. The scale bars are 50 μm.The effect of the photonic environment becomes
evident when we
compare luminescence spectra acquired using objectives with different
numerical apertures. We measure temperature maps of the same sample
using microscopy objectives with NA values of 0.3 and 0.6. Figure b shows histograms
of the apparent temperatures in the center of these maps, both recorded
at room temperature. For a NA of 0.3, the center of the histogram
is at 296 K. This value completely changes when we collect emission
over a wider angle with a NA of 0.6, showing a shift to 290 K. Clearly,
the dependence of the apparent temperature distributions on the NA
confirms the modification of the luminescence spectrum by the photonic
environment.Further evidence of the effect of the irregular
photonic environment
on the microheater is obtained from reflectance measurements. Here,
we study a bare microheater by separately illuminating the heating
spiral and a location next to it. The intensity of the reflected light
is roughly two times higher on the heating spiral (Figure S7), which is consistent with the observations shown
in Figure a. In addition,
normalization demonstrates a higher relative reflectivity on the heating
spiral in the range of the 2H11/2 emission,
that is, 510–535 nm (Figure c). Interference between the reflected and direct 2H11/2 emissions is thus stronger on the heating
spiral than off spiral.Finally, we examine how the temperature
error due to the photonic
environment depends on the actual temperature in a pixel. We first
determine the difference in the apparent temperature between locations
on and off spiral (ΔT) and observe an increase
at higher temperatures (Figure d). The relation between the apparent temperature and the
spontaneous emission rates explains this observation (eq ). For the nanoparticles on the
microheater, we must interpret the spontaneous emission rates Ai in eq as the rates of spontaneous emission under angles that can
be collected by our instrumentation. This specification requires no
special attention if the emission is approximately isotropic such
as in thermometry on the millimeter scale where any photonic effects
average out. However, nanoscale photonic heterogeneities lead to a
locally different A2/A1 ratio. The constant C of eq should therefore be multiplied
by a correction factor Cp that accounts
for the effect of the photonic environment on the emission rates.
The apparent temperature Tp of a nanothermometer
with anisotropic emission depends on its actual temperature T as well as on this correction factor Cp. This yields a temperature error of (Derivation S1)Higher actual temperatures thus lead to an increase of ΔT for Cp < 1, which matches
the trend shown in Figure d. We further confirm this by fitting the experimental ΔT values to eq . This gives us a method to correct the systematic deviation in measured
temperatures on the microheater.This second correction starts
with the determination of Cp for each
location on the microheater. Here,
we assume that the temperature distribution is homogeneous for the
map recorded at a set temperature of 303 K (Figure b and Figure S8). For every pixel, Cp is then the only
unknown in eq , which
makes it possible to construct a map of Cp values. In this case, this “calibration-free” procedure
is necessary to correct the position-dependent photonic effects. We
find values of around 0.95 on the spiral, while Cp is around 1 off the spiral. Indeed, the photonic effects
on A2/A1 are
expected to be subtle as the 2H11/2 and 4S3/2 emissions have nearly the same wavelength.
To correct the maps at elevated temperatures, we plug these values
and the apparent temperatures off the spiral into eq to obtain the actual temperatures.
The average temperature in the center of the heating spiral was lower
at elevated set temperatures, up to approximately 10 K at 523 K. We
attribute this deviation to a temperature gradient through the layer
of nanothermometers, leading to a lower temperature near the nanothermometer–air
interface than on the surface of the microheater. A potential origin
of this gradient is the poor thermal conductivity of the nanothermometer
layer compared to Si particles that were used for calibration of the
microheater.[34] A thinner layer of nanothermometers
would reduce this gradient but resulted in incomplete coverage of
the microheater and it thereby complicated the analysis of the temperature
homogeneity. To correct the photonic artifact, we used the apparent
temperature in the center of the heating spiral as an input for the
physical temperature in eq . After correction (Figure e), the microheater shows a homogeneous temperature
distribution at elevated set temperatures, which matches the simulations
presented in Figure c. This clearly demonstrates the effectiveness of our correction
procedure in removing temperature artifacts due to the photonic environment.Finally, we use the fully corrected temperature maps to study the
temperature homogeneity of the microheater. Figure shows horizontal traces through the center
of these maps. The temperature is nearly constant in the center of
these traces followed by a decrease at the edges. We compare this
with temperature profiles simulated using the finite element model
(Figure c). As an
input for the simulation, we use the measured temperature at the center
of the fully corrected maps. The simulated temperature profiles (lines)
show an excellent match with the experimental traces (dots). We determine
the standard deviation of the temperature in the center to quantify
the accuracy of this thermometry method and find values of 1 K at
323 K increasing to only 4 K at 513 K. This confirms both the reliability
of the finite element model as a design tool and the strength of our
temperature mapping technique as a characterization tool, achieving
a high accuracy and a spatial resolution of ∼1 μm. This
makes nanothermometry using confocal luminescence spectroscopy a promising
method to map temperature profiles in other fields such as biology[13] and catalysis,[35] where
temperature variations are important but hard to monitor with conventional
methods.
Figure 6
Mapping elevated temperatures. The dots show the average of seven
horizontal line traces through the center of the temperature maps
at elevated temperatures. The lines represent the temperature profiles
as simulated using the finite element model.
Mapping elevated temperatures. The dots show the average of seven
horizontal line traces through the center of the temperature maps
at elevated temperatures. The lines represent the temperature profiles
as simulated using the finite element model.
Conclusions
In summary, we have mapped the luminescence of upconversion nanoparticles
and designed an analysis procedure to accurately measure the temperature
profile of a MEMS-based microheater. To ensure high temperature accuracy,
it is crucial to correct each emission spectrum for complications
that are inherent to luminescence nanothermometry (but often ignored):
additional emission lines at high excitation intensities and spectral
variations induced by the photonic environment of the nanoparticles.
A reliable correction procedure was developed and it enabled the experimental
assessment of the temperature homogeneity at the surface of the microheater.
The combination of luminescence thermometry and confocal microscopy
not only allows for temperature mapping of this specific microheater
but can also be applied to visualize temperature variations with a
micrometer resolution and superior accuracy up to high temperatures
in many other fields. This makes our thermometry technique a valuable
new tool in characterizing temperature distributions on the micrometer
scale, which becomes increasingly important with the ongoing trend
toward further miniaturization of devices.
Authors: Fiorenzo Vetrone; Rafik Naccache; Alicia Zamarrón; Angeles Juarranz de la Fuente; Francisco Sanz-Rodríguez; Laura Martinez Maestro; Emma Martín Rodriguez; Daniel Jaque; José García Solé; John A Capobianco Journal: ACS Nano Date: 2010-06-22 Impact factor: 15.881
Authors: J Tijn van Omme; Marina Zakhozheva; Ronald G Spruit; Mariya Sholkina; H Hugo Pérez Garza Journal: Ultramicroscopy Date: 2018-05-17 Impact factor: 2.689
Authors: Carlos D S Brites; Patricia P Lima; Nuno J O Silva; Angel Millán; Vitor S Amaral; Fernando Palacio; Luís D Carlos Journal: Nanoscale Date: 2012-07-04 Impact factor: 7.790
Authors: Andrea D Pickel; Ayelet Teitelboim; Emory M Chan; Nicholas J Borys; P James Schuck; Chris Dames Journal: Nat Commun Date: 2018-11-21 Impact factor: 14.919