| Literature DB >> 33568669 |
Arne Quellmalz1, Xiaojing Wang2, Simon Sawallich3,4, Burkay Uzlu4,5, Martin Otto5, Stefan Wagner5, Zhenxing Wang5, Maximilian Prechtl6, Oliver Hartwig6, Siwei Luo6, Georg S Duesberg6, Max C Lemme4,5, Kristinn B Gylfason2, Niclas Roxhed2, Göran Stemme2, Frank Niklaus7.
Abstract
Integrating two-dimensional (2D) materials into semiconductor manufacturing lines is essential to exploit their material properties in a wide range of application areas. However, current approaches are not compatible with high-volume manufacturing on wafer level. Here, we report a generic methodology for large-area integration of 2D materials by adhesive wafer bonding. Our approach avoids manual handling and uses equipment, processes, and materials that are readily available in large-scale semiconductor manufacturing lines. We demonstrate the transfer of CVD graphene from copper foils (100-mm diameter) and molybdenum disulfide (MoS2) from SiO2/Si chips (centimeter-sized) to silicon wafers (100-mm diameter). Furthermore, we stack graphene with CVD hexagonal boron nitride and MoS2 layers to heterostructures, and fabricate encapsulated field-effect graphene devices, with high carrier mobilities of up to [Formula: see text]. Thus, our approach is suited for backend of the line integration of 2D materials on top of integrated circuits, with potential to accelerate progress in electronics, photonics, and sensing.Entities:
Year: 2021 PMID: 33568669 PMCID: PMC7876008 DOI: 10.1038/s41467-021-21136-0
Source DB: PubMed Journal: Nat Commun ISSN: 2041-1723 Impact factor: 14.919