| Literature DB >> 35296657 |
Max C Lemme1,2, Deji Akinwande3, Cedric Huyghebaert4, Christoph Stampfer5,6.
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Year: 2022 PMID: 35296657 PMCID: PMC8927416 DOI: 10.1038/s41467-022-29001-4
Source DB: PubMed Journal: Nat Commun ISSN: 2041-1723 Impact factor: 14.919
Fig. 1The era of geometrical or Dennard[9] scaling of silicon technology ended around the turn of the century (green lines, “happy scaling”).
Since then, material and architecture innovations like copper interconnects[10], high-k dielectrics with metal gates[11] and FinFETs[12] continued to drive Moore’s law (yellow lines, “less happy scaling”). Future scaling, or “More Moore”, may require thin nanosheet transistors, where 2D materials are considered ideal candidates (magenta, inset a and transmission electron micrograph)[13,14]. Substantial performance and functionality gains are expected through “CMOS + X” integration, for example through sensors or high frequency electronics integrated on CMOS chips in the “More Than Moore” domain (inset c). Photonic integrated circuits may boost overall system performance and data handling capabilities, as well as unlock spectroscopic sensing applications, enabled by the optoelectronic performance of 2DMs. Computing-In-Memory or memristors will enable future neuromorphic computing applications and 2DMs may be ideally suited to be integrated with silicon CMOS (inset b). 2D quantum technologies are the least mature even at the laboratory level, but will benefit from all expected achievements as 2DMs enter semiconductor processing lines. 2D materials hold great promise to become the X-Factor for CMOS. This may be described as the era of heterogenous scaling, where new and additional materials provide unprecedented performance in three-dimensional chip stacks. Note that the Y-axis had a unit of “log2(#transistors/$)“ during the classic “Moore’s law” period. This has to be replaced in the era of heterogeneous scaling, and we suggest labeling it “Performance (a.u.)”, because the increase in performance will become application specific. It will be determined by (combined) factors like power consumption and efficiency, capability to perform pattern recognition, sensor fusion, etc., which results in somewhat arbitrary units due to the diverse functionalities and underlying technologies. (Insets: BEOL Introduction of Cu: Reproduced with permission from the AAAS, reference;[10] High-k/Metal Gate: © 2007 IEEE. Reprinted, with permission, from Mistry, K. et al. A 45 nm Logic technology with high-k+metal gate transistors, strained silicon, 9 Cu interconnect layers, 193 nm dry patterning, and 100% Pb-free packaging. In 2007 IEEE International Electron Devices Meeting 247–250 (2007);[11] FinFET/New architectures: Republished with permission of IEEE, from Jan, C. -H. et al. A 22 nm SoC platform technology featuring 3-D tri-gate and high-k/metal gate, optimized for ultra low power, high performance and high density SoC applications. In 2012 International Electron Devices Meeting 3.1.1–3.1.4, 2012;[12] permission conveyed through Copyright Clearance Center, Inc.; 2D Materials: source: ref. [14]).