Literature DB >> 33567494

Performance Analysis of Surface Reconstruction Algorithms in Vertical Scanning Interferometry Based on Coherence Envelope Detection.

Dongxu Wu1,2, Fusheng Liang1, Chengwei Kang1, Fengzhou Fang1,3.   

Abstract

Optical interferometry plays an important role in the topographical surface measurement and characterization in precision/ultra-precision manufacturing. An appropriate surface reconstruction algorithm is essential in obtaining accurate topography information from the digitized interferograms. However, the performance of a surface reconstruction algorithm in interferometric measurements is influenced by environmental disturbances and system noise. This paper presents a comparative analysis of three algorithms commonly used for coherence envelope detection in vertical scanning interferometry, including the centroid method, fast Fourier transform (FFT), and Hilbert transform (HT). Numerical analysis and experimental studies were carried out to evaluate the performance of different envelope detection algorithms in terms of measurement accuracy, speed, and noise resistance. Step height standards were measured using a developed interferometer and the step profiles were reconstructed by different algorithms. The results show that the centroid method has a higher measurement speed than the FFT and HT methods, but it can only provide acceptable measurement accuracy at a low noise level. The FFT and HT methods outperform the centroid method in terms of noise immunity and measurement accuracy. Even if the FFT and HT methods provide similar measurement accuracy, the HT method has a superior measurement speed compared to the FFT method.

Entities:  

Keywords:  algorithm; envelope detection; height measurement; low coherence; surface topography; vertical scanning interferometry

Year:  2021        PMID: 33567494      PMCID: PMC7915951          DOI: 10.3390/mi12020164

Source DB:  PubMed          Journal:  Micromachines (Basel)        ISSN: 2072-666X            Impact factor:   2.891


  14 in total

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Journal:  Appl Opt       Date:  1992-05-10       Impact factor: 1.980

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Authors:  S S Chim; G S Kino
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Journal:  Appl Opt       Date:  2000-05-01       Impact factor: 1.980

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Authors:  Yonghua Zhao; Zhongping Chen; Zhihua Ding; Hongwu Ren; J Stuart Nelson
Journal:  Opt Lett       Date:  2002-01-15       Impact factor: 3.776

5.  Interferometric measurement of a concave, φ-polynomial, Zernike mirror.

Authors:  Kyle Fuerschbach; Kevin P Thompson; Jannick P Rolland
Journal:  Opt Lett       Date:  2014-01-01       Impact factor: 3.776

6.  Surface and thickness measurement of a transparent film using wavelength scanning interferometry.

Authors:  Feng Gao; Hussam Muhamedsalih; Xiangqian Jiang
Journal:  Opt Express       Date:  2012-09-10       Impact factor: 3.894

7.  3D surface mapping of freeform optics using wavelength scanning lateral shearing interferometry.

Authors:  Young-Sik Ghim; Hyug-Gyo Rhee; Angela Davies; Ho-Soon Yang; Yun-Woo Lee
Journal:  Opt Express       Date:  2014-03-10       Impact factor: 3.894

8.  Surface recovery algorithm in white light interferometry based on combined white light phase shifting and fast Fourier transform algorithms.

Authors:  Quangsang Vo; Fengzhou Fang; Xiaodong Zhang; Huimin Gao
Journal:  Appl Opt       Date:  2017-10-10       Impact factor: 1.980

9.  Improvement of the fringe analysis algorithm for wavelength scanning interferometry based on filter parameter optimization.

Authors:  Tao Zhang; Feng Gao; Hussam Muhamedsalih; Shan Lou; Haydn Martin; Xiangqian Jiang
Journal:  Appl Opt       Date:  2018-03-20       Impact factor: 1.980

10.  A rapid measurement method for structured surface in white light interferometry.

Authors:  Zili Lei; Xiaojun Liu; L I Zhao; Wenjun Yang; Cheng Chen; Xiaoting Guo
Journal:  J Microsc       Date:  2019-11-14       Impact factor: 1.758

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