| Literature DB >> 32431825 |
Abstract
Estimates of heat-transfer rates during plunge-cooling and the patterns of ice observed in cryo-EM samples indicate that the grid bars cool much more slowly than do the support foil and sample near the middle of the grid openings. The resulting transient temperature differences generate transient tensile stresses in the support foil. Most of this foil stress develops while the sample is liquid and cooling toward its glass transition T g, and so does not generate tensile sample stress. As the grid bars continue cooling towards the cryogen temperature and contracting, the tensile stress in the foil is released, placing the sample in compressive stress. Radiation-induced creep in the presence of this compressive stress should generate a doming of the sample in the foil openings, as is observed experimentally. Crude estimates of the magnitude of the doming that may be generated by this mechanism are consistent with observation. Several approaches to reducing beam-induced motion are discussed. © Robert E. Thorne 2020.Entities:
Keywords: beam-induced motion; cryo-EM; radiation damage
Year: 2020 PMID: 32431825 PMCID: PMC7201280 DOI: 10.1107/S2052252520002560
Source DB: PubMed Journal: IUCrJ ISSN: 2052-2525 Impact factor: 4.769
Figure 1Temperature and stress during plunge-cooling of cryo-EM samples. (a) The grid cools more slowly than the foil and sample near the middle of the grid openings, so a large temperature difference between the grid and foil may transiently occur. (b) The transient temperature difference produces a transient tensile stress in the foil, the dimensions of which are constrained by those of the grid. The sample vitrifies and becomes strongly coupled to the foil only at T g, when the foil is under tensile stress. As the grid bars cool, the temperature difference between the grid bars and foil decreases and the tensile stress in the foil is released, the sample is placed under compressive stress. The grid and foil are here assumed to be of the same material.
Figure 2Schematic illustration of how compressive stress and doming may be generated during plunge-cooling of cryo-EM samples. (a) The sample and foil have cooled to T g and the foil is under tensile stress between the warmer grid bars. (b) The sample, foil and grid have reached the final temperature T cryo; tensile stress in the foil associated with the transient temperature difference between the grid and foil has been released, and the sample is now under compression. (c) After receiving an electron dose D, radiation-induced creep in the presence of compressive stress has produced doming of the sample within the holes in the foil.