| Literature DB >> 32196683 |
Carolin Weber1,2, Rafael Kranzer1, Jan Weidner1, Kevin Kröninger2, Björn Poppe3, Hui Khee Looe3, Daniela Poppinga1.
Abstract
PURPOSE: The aim of this study is the experimental and Monte Carlo-based determination of small field correction factors for the unshielded silicon detector microSilicon for a standard linear accelerator as well as the Cyberknife System. In addition, a detailed Monte Carlo analysis has been performed by modifying the detector models stepwise to study the influences of the detector's components.Entities:
Keywords: Monte Carlo; density; detector response; perturbation factor; small field
Mesh:
Year: 2020 PMID: 32196683 PMCID: PMC7496769 DOI: 10.1002/mp.14149
Source DB: PubMed Journal: Med Phys ISSN: 0094-2405 Impact factor: 4.071
Fig. 1Measurement setup to obtain the Cherenkov light ratio values. Left: minimum fiber configuration; right: maximum fiber configuration. [Color figure can be viewed at wileyonlinelibrary.com]
Monte Carlo parameters.
| Parameter | Description | References |
|---|---|---|
| Code, version/release date | EGSnrc/usercodeegs_chamber Version 4, released on 18 Apr 2018 | Kawrakow et al.15 ; Wulff et al.16 |
| Electron‐step algorithm | EGSnrc/PRESTA‐II | |
| Validation | Kawrakow et al.15 | |
| Source description | IAEA phase space files for a Varian ClinaciX 6 MV and CyberKnife system |
Download: www‐nds.iaea.org/phsp Varian ClinaciX18 Cyberknife19 |
| Bremsstrahlung cross sections | BH (default) | |
| Photon cross sections | XCOM | |
| Brems angular sampling | KM (default) | |
| Spin Effects | On (default) | |
| Electron impact ionization | Off (default) | |
| Rayleigh scattering | On (default) | |
| Bound compton scattering | Norej (default) | |
| Radiative compton corrections | Off (default) | |
| Atomic relaxations | eadl | |
| Pair angular sampling | Simple | |
| Triplet production | Off (default) | |
| Photoelectron angular sampling | On (default) | |
| Photonuclear attenuation | Off | |
| Boundary crossing algorithm | Exact | |
| Skin depth for BCA | 3 (default) | |
| Threshold kinetic energy inelastic collisions |
| |
| Threshold energy radiative collisions |
| |
| Charged particle cutoff |
| |
| Photon cutoff energy |
| |
| Photon cross section enhancement |
| Wulff et al.16 |
| Electron range rejection |
| |
| Scored quantities | Dose in the sensitive volume | |
| # histories/statistical uncertainty | For each field size 1000 runs with different random seed each using the number of particles in the related phase space file | |
| Statistical methods | History‐by‐history | Sempau et al.23 |
| Postprocessing | Dose from output files is taken directly for calculation of correction and perturbation factors [Eqs. ( |
Numerical values of Fig. 3. The uncertainty (k = 1) of the correction factors given in the table is +0.010 for the experimental values and +0.006 for the Monte Carlo‐based values.
| Varian TrueBeam | |||||||
|---|---|---|---|---|---|---|---|
| Diode E 60017 | microSilicon 60023 | ||||||
| Experiment | Monte Carlo | Experiment | Monte Carlo | ||||
| Equivalent field size length Sclin/cm |
| Equivalent field size length Sclin/cm |
| Equivalent field size length Sclin/cm |
| Equivalent field size length Sclin/cm |
|
| 0.63 | 0.939 | 0.58 | 0.930 | 0.63 | 0.983 | 0.58 | 0.979 |
| 0.82 | 0.956 | 0.82 | 0.986 | ||||
| 1.01 | 0.973 | 1.08 | 0.979 | 1.01 | 0.991 | 1.08 | 0.993 |
| 1.50 | 0.992 | 1.50 | 1.000 | ||||
| 2.00 | 1.004 | 2.17 | 0.999 | 2.00 | 1.004 | 2.17 | 1.004 |
| 3.00 | 1.002 | 3.00 | 1.002 | ||||
| 4.00 | 1.000 | 4.39 | 1.000 | 4.00 | 1.000 | 4.39 | 1.000 |
| 10.00 | 0.986 | 10.00 | 0.989 | ||||
Fig. 3Simulation geometries used for the decomposition of the small field output correction factors to quantify the perturbations caused by different detector’s components. The model of M Diode is the same as the one used in the simulations of the correction factors . [Color figure can be viewed at wileyonlinelibrary.com]
Fig. 2Monte Carlo detector models. Left: Diode E type 60017 center: Diode SRS type 60018 right: microSilicon type 60023. Identical colors indicate identical materials. [Color figure can be viewed at wileyonlinelibrary.com]
Fig. 4Measured and simulated correction factors, , obtained for Varian linear accelerator using (a) Diode E and (b) microSilicon; measured and simulated correction factors, , obtained for Cyberknife system using (c) Diode SRS and (d) microSilicon. Diode E and Diode SRS results are compared to different publications. , , , , , , [Color figure can be viewed at wileyonlinelibrary.com]
Fig. 5Detector’s components perturbation effect for the Diode E and microSilicon. [Color figure can be viewed at wileyonlinelibrary.com]
Parameters used for the detectors’ models in this study.
| Component | Material | Density | ||||
|---|---|---|---|---|---|---|
| 60017 | 60018 | 60023 | 60017 | 60018 | 60023 | |
| Detector housing (pink) | RW3 | RW3 | RW3 | 1.045 | 1.045 | 1.045 |
| Detector housing (light blue) | Ag | Ag | Air | 10.50 | 10.50 | 1.248e‐3 |
| Detector housing (dark blue) | Al | Al | Al | 2.82 | 2.82 | 2.82 |
| Detector housing (green) | PEEK | PEEK | PEEK | 1.31 | 1.31 | 1.31 |
| Detector housing (yellow) | FR4 | FR4 | FR4 | 2.00 | 2.00 | 2.00 |
| Detector housing (gray) | Cu/Carbon | Cu/Carbon | Cu/Carbon | 1.27 | 1.27 | 1.27 |
| Epoxy encapsulation (orange shades) | Epoxy | Epoxy | Epoxy | 1.77 | 1.4 | 1.16 |
| Silicon chip (dark red) | Si | Si | Si | 2.33 | 2.33 | 2.33 |