| Literature DB >> 31949900 |
Toshiyuki Nishiyama1,2, Akinobu Niozu1,2, Christoph Bostedt3,4,5,6, Ken R Ferguson3, Yuhiro Sato1, Christopher Hutchison1, Kiyonobu Nagaya1,2, Hironobu Fukuzawa2,7, Koji Motomura7, Shin-Ichi Wada2,8, Tsukasa Sakai1, Kenji Matsunami1, Kazuhiro Matsuda1, Tetsuya Tachibana7, Yuta Ito7, Weiqing Xu7, Subhendu Mondal7, Takayuki Umemoto8, Christophe Nicolas9, Catalin Miron9,10,11, Takashi Kameshima12, Yasumasa Joti12, Kensuke Tono12, Takaki Hatsui2, Makina Yabashi2, Kiyoshi Ueda2,7.
Abstract
With the emergence of X-ray free-electron lasers, it is possible to investigate the structure of nanoscale samples by employing coherent diffractive imaging in the X-ray spectral regime. In this work, we developed a refinement method for structure reconstruction applicable to low-quality coherent diffraction data. The method is based on the gradient search method and considers the missing region of a diffraction pattern and the small number of detected photons. We introduced an initial estimate of the structure in the method to improve the convergence. The present method is applied to an experimental diffraction pattern of an Xe cluster obtained in an X-ray scattering experiment at the SPring-8 Angstrom Compact free-electron LAser (SACLA) facility. It is found that the electron density is successfully reconstructed from the diffraction pattern with a large missing region, with a good initial estimate of the structure. The diffraction pattern calculated from the reconstructed electron density reproduced the observed diffraction pattern well, including the characteristic intensity modulation in each ring. Our refinement method enables structure reconstruction from diffraction patterns under difficulties such as missing areas and low diffraction intensity, and it is potentially applicable to the structure determination of samples that have low scattering power. © Nishiyama et al. 2020.Entities:
Keywords: XFELs; clusters; coherent diffractive imaging; computation; electron density; phase problem; single particles; structure reconstruction
Year: 2020 PMID: 31949900 PMCID: PMC6949595 DOI: 10.1107/S2052252519014222
Source DB: PubMed Journal: IUCrJ ISSN: 2052-2525 Impact factor: 4.769
Figure 1Measured diffraction patterns from Xe clusters. (a) A concentric ring pattern suggesting a spherical cluster. (b) The 1D scattering intensity deduced from the pattern (a) and a fitting curve. (c) A pattern consisting of concentric rings with aperiodic intensity modulation suggests existence of a cluster having surface structures. (d) The 1D scattering intensity deduced from the pattern (c) and a fitting curve. The scale bars in (a) and (c) are 0.1 nm−1.
Figure 2The object used in the simulation of the structure reconstruction. (a) 2D projected electron density of the object. (b) 2D projection of a uniform sphere used as the initial structure in structure optimization. (c) Difference between (a) and (b) defined as (a) − (b). The scale bars are 100 nm.
Figure 3Diffraction patterns simulated from the electron density shown in Fig. 2 ▸(a). The top row represents the highest incident XFEL fluence case and the fluence is reduced as it moves to the bottom. The first column shows the diffraction patterns without missing regions and the missing region becomes larger as it moves to the right. The current experimental condition corresponds to the middle one (e). The scale bars are 0.1 nm−1.
Figure 4Electron density reconstructed from the simulation data using the present method. Each figure represents the reconstructed structure obtained from the corresponding diffraction pattern in Fig. 3 ▸. The scale bars are 100 nm.
Figure 5Electron density reconstructed from the simulation data. The initial electron density [Fig. 2 ▸(b)] was subtracted from the reconstructed results (Fig. 4 ▸). The scale bars are 100 nm.
Figure 6Result of the structure reconstruction from the measured diffraction pattern [Fig. 1 ▸(c)] using the implemented algorithm. (a) A projection of a uniform dense sphere used as the initial estimate of the density map. (b) The reconstructed density map by the implemented algorithm. (c) The difference between (a) and (b) defined as (b) − (a). (d) The simulated pattern from (a). (e) The simulated pattern from (b). The scale bars in (a)–(c) are 100 nm and those in (d)–(e) are 0.1 nm−1.
Figure 7Result of the structure reconstruction from the measured diffraction pattern [Fig. 1 ▸(c)] using the implemented algorithm. (a) A projection of a sphere with a small sphere used as the initial estimate of the density map. The initial estimate of the density map was constructed from the optimization result shown in Fig. 2 ▸. (b) The reconstructed density map by the implemented algorithm. (c) The difference between (a) and (b) defined as (b) − (a). (d) The simulated pattern from (a). (e) The simulated pattern from (b). The scale bars in (a)–(c) are 100 nm and those in (d)–(e) are 0.1 nm−1.