| Literature DB >> 31919346 |
Phay J Ho1, Benedikt J Daurer2, Max F Hantke2,3, Johan Bielecki2,4, Andre Al Haddad5, Maximilian Bucher5, Gilles Doumy5, Ken R Ferguson6, Leonie Flückiger7, Tais Gorkhover8, Bianca Iwan8, Christopher Knight9, Stefan Moeller6, Timur Osipov6, Dipanwita Ray6, Stephen H Southworth5, Martin Svenda2, Nicusor Timneanu2,10, Anatoli Ulmer11, Peter Walter6, Janos Hajdu2, Linda Young5,12, Filipe R N C Maia13, Christoph Bostedt14,15,16,17.
Abstract
Intense x-ray free-electron laser (XFEL) pulses hold great promise for imaging function in nanoscale and biological systems with atomic resolution. So far, however, the spatial resolution obtained from single shot experiments lags averaging static experiments. Here we report on a combined computational and experimental study about ultrafast diffractive imaging of sucrose clusters which are benchmark organic samples. Our theoretical model matches the experimental data from the water window to the keV x-ray regime. The large-scale dynamic scattering calculations reveal that transient phenomena driven by non-linear x-ray interaction are decisive for ultrafast imaging applications. Our study illuminates the complex interplay of the imaging process with the rapidly changing transient electronic structures in XFEL experiments and shows how computational models allow optimization of the parameters for ultrafast imaging experiments.Entities:
Year: 2020 PMID: 31919346 PMCID: PMC6952381 DOI: 10.1038/s41467-019-13905-9
Source DB: PubMed Journal: Nat Commun ISSN: 2041-1723 Impact factor: 14.919
Fig. 1Experimental setup.
Experimental setup for the single shot diffractive imaging measurements of sucrose clusters. The clusters intersect the focused FEL pulse and their coherent diffraction image is recorded with a large area pixel detector. Upstream of the focusing optics the energy of each XFEL pulse is measured and recorded with the scattering data. The clusters are small compared to the focus diameter and their location within the focal volume determines the incident fluence on them.
Fig. 2Examples of recorded diffraction images of sucrose clusters.
The circular diffraction images indicate spherical particles. With the increasing photon energies 530 eV (a), 800 eV (b), 1000 eV (c), 1140 eV (d) and 1483 eV (e) additional diffraction fringes become visible. The variations in the fringe locations stem from the particle size distribution.
Fig. 3Fluence measurements.
Comparison of the beamline peak fluence and the fitted incident fluence from the diffraction images. The fitted incident fluence () is obtained from diffraction images of sucrose clusters with sizes that fall within one standard deviation from the mean. The light gray points are all data and the black markers represent the 5% most intense hits at each photon energy. The peak fluence () is obtained from the beamline data and normalized to the Ar time-of-flight (TOF) data. The error bars of and are associated with the maximum uncertainty of the 5% most intense hits (see Supplementary Note 2). The shaded area indicates the water window. The numbers near the yellow points and gray points correspond to the pulse duration and number of recorded diffraction patterns, respectively.
Fig. 4Results from the computational study.
a Calculated scattering cross sections for a 50-nm sucrose cluster exposed to a 180-fs, 25 J/m pulse and comparison of the damaged (blue) to the undamaged (red) clusters as well as classical scaling model (black dashed line). b Comparison of dynamic scattering efficiency (DSE) from the calculations (blue) to the experimental results (black markers). The shaded area indicates the water window. The error bars for the experimental results are computed from the uncertainties of and , as shown in Fig. 3.
Fig. 5Calculated transient form factors at the resonance.
At 530 eV, resonance-mediated pathways induced by a broadband XFEL pulse lead to one or more cascades of core excitation and Auger decay in oxygen atoms. These processes induce rapid changes in the electronic configurations, as well as scattering amplitudes, since the atomic form factor is sensitive to electronic configurations near resonances. The gray dots indicate the absolute values of the complex form factor in the forward direction, , at 530 eV. The color of the depicted electronic states corresponds to the color of the calculated form factors.
Fig. 6Pulse duration dependence of the diffraction imaging process.
Influence of the pulse duration on the beam damage as function of photon energies as well as beam damage for different photon energies as function of pulse length (inset). The calculations are performed for a 1000-unit sucrose cluster exposed to intense XFEL pulses with 25 J/m. The shaded area indicates the water window.