| Literature DB >> 31316799 |
Ali Ebrahim1,2, Tadeo Moreno-Chicano1, Martin V Appleby2, Amanda K Chaplin1, John H Beale2, Darren A Sherrell2, Helen M E Duyvesteyn2,3, Shigeki Owada4,5, Kensuke Tono4,5, Hiroshi Sugimoto5, Richard W Strange1, Jonathan A R Worrall1, Danny Axford2, Robin L Owen2, Michael A Hough1.
Abstract
An approach is demonstrated to obtain, in a sample- and time-efficient manner, multiple dose-resolved crystal structures from room-temperature protein microcrystals using identical fixed-target supports at both synchrotrons and X-ray free-electron lasers (XFELs). This approach allows direct comparison of dose-resolved serial synchrotron and damage-free XFEL serial femtosecond crystallography structures of radiation-sensitive proteins. Specifically, serial synchrotron structures of a heme peroxidase enzyme reveal that X-ray induced changes occur at far lower doses than those at which diffraction quality is compromised (the Garman limit), consistent with previous studies on the reduction of heme proteins by low X-ray doses. In these structures, a functionally relevant bond length is shown to vary rapidly as a function of absorbed dose, with all room-temperature synchrotron structures exhibiting linear deformation of the active site compared with the XFEL structure. It is demonstrated that extrapolation of dose-dependent synchrotron structures to zero dose can closely approximate the damage-free XFEL structure. This approach is widely applicable to any protein where the crystal structure is altered by the synchrotron X-ray beam and provides a solution to the urgent requirement to determine intact structures of such proteins in a high-throughput and accessible manner.Entities:
Keywords: XFELs; fixed targets; heme peroxidase; metalloproteins; microcrystals; radiation damage; serial femtosecond crystallography; serial millisecond crystallography; serial synchrotron crystallography
Year: 2019 PMID: 31316799 PMCID: PMC6608622 DOI: 10.1107/S2052252519003956
Source DB: PubMed Journal: IUCrJ ISSN: 2052-2525 Impact factor: 4.769
Figure 1Fixed-target instrumentation in place at (a) beamline I24, Diamond Light Source and (b) beamline BL2 EH3, SACLA. (c) Schematic of fixed target used showing layout of 8 × 8 ‘city blocks’, each comprising 20 × 20 apertures. Shown is a zoomed-in view of a single city block with motion path followed and chip cross-section. (d) Formation of dose-resolved datasets by collecting multiple images at each chip aperture. For XFEL data collection, only a single dose point is recorded at each position.
Figure 2(a) 2F o–F c electron-density map contoured at 1σ for the damage-free SFX structure of DtpAa at 1.88 Å resolution, showing the clear and well resolved water network within the heme pocket. Water molecules interact extensively with the pocket residue Asp239 as well as with Arg369 (omitted for clarity). (b) Superposition of the SFX structure (blue) with the 32.8 kGy SSX structure (red). Small changes to the heme-pocket water network are apparent even at this low dose.
Figure 32F o–F c electron-density maps contoured at 1σ for the heme environment of DtpAa in (a) the SFX dataset from SACLA and (b–f) selected structures from the two MSS series. (g) Superposition of selected structures revealing the dose-dependent migration of the water molecule W1 away from the heme Fe. The SFX structure is shown in green with MSS in blue.
Figure 4Plot of Fe–W1 distance as a function of X-ray dose from the two measured MSS series. The SFX structure determined using SACLA is plotted as the zero-dose point (magenta). The elongation of the bond length with dose is well fitted by a linear function (red line). The deviation at higher doses is associated with a dissociation of W1 from the immediate vicinity of the heme Fe. The extrapolation to zero dose (dashed red line) gives a value of 2.37 (±0.05) Å which is very close to the 2.40 (±0.13) Å value of this parameter in the SFX structure. Error bars shown are the estimated standard uncertainty in bond length obtained from the DPI value of the Fe and W1 atoms (see Materials and methods).