| Literature DB >> 30424406 |
S Beatriz Goncalves1,2, José M Palha3, Helena C Fernandes4, Márcio R Souto5, Sara Pimenta6, Tao Dong7,8, Zhaochu Yang9, João F Ribeiro10, José H Correia11,12.
Abstract
In optogenetic studies, the brain is exposed to high-power light sources and inadequate power density or exposure time can cause cell damage from overheating (typically temperature increasing of 2 ∘ C). In order to overcome overheating issues in optogenetics, this paper presents a neural tool capable of assessing tissue temperature over time, combined with the capability of electrical recording and optical stimulation. A silicon-based 8 mm long probe was manufactured to reach deep neural structures. The final proof-of-concept device comprises a double-sided function: on one side, an optrode with LED-based stimulation and platinum (Pt) recording points; and, on the opposite side, a Pt-based thin-film thermoresistance (RTD) for temperature assessing in the photostimulation site surroundings. Pt thin-films for tissue interface were chosen due to its biocompatibility and thermal linearity. A single-shaft probe is demonstrated for integration in a 3D probe array. A 3D probe array will reduce the distance between the thermal sensor and the heating source. Results show good recording and optical features, with average impedance magnitude of 371 k Ω , at 1 kHz, and optical power of 1.2 mW·mm - 2 (at 470 nm), respectively. The manufactured RTD showed resolution of 0.2 ∘ C at 37 ∘ C (normal body temperature). Overall, the results show a device capable of meeting the requirements of a neural interface for recording/stimulating of neural activity and monitoring temperature profile of the photostimulation site surroundings, which suggests a promising tool for neuroscience research filed.Entities:
Keywords: LED chip; optogenetics; silicon neural probes; temperature monitoring; thermoresistance
Year: 2018 PMID: 30424406 PMCID: PMC6187356 DOI: 10.3390/mi9090473
Source DB: PubMed Journal: Micromachines (Basel) ISSN: 2072-666X Impact factor: 2.891
Figure 1Design of the 3D silicon neural array concept. Pt thermoresistance (RTD) patterning on a single shaft (bottom view), and on the opposite side 10 recording sites and an LED chip (top view).
Figure 2Design and geometrical dimensions of RTD patterned on the optrode.
Figure 3Cross-section view of the neural device fabrication process flow (not to scale).
Parameters of the thin-films deposition to manufacture the optrode with RTD.
| Material | Technology | Thickness (nm) | Pressure (mbar) | Gas injection (sccm) | Power (W) | Rate (Å/s) |
|---|---|---|---|---|---|---|
| TiO | RF sputtering | 10 | 2 × 10 | 10 (Ar); 2 (O | 200 | 0.1 |
| Pt | DC sputtering | 50 and 60 | 6 × 10 | 40 (Ar) | 100 | 3.4 |
| Cr | e-beam | 30 | 6.3 × 10 | – | 140 | 1 |
| Al | e-beam | 600 and 200 | 5.3 × 10 | – | 700 | 23 |
| Ti | e-beam | 15 | 4.3 × 10 | – | 350 | 0.8 |
| Si | RF sputtering | 800 and 400 | 6 × 10 | 7 (Ar); 13 (N | 150 | 0.3 |
Figure 4Lithographic masks used during fabrication process of the optrode. (a) RTD’s interconnection lines and pads; (b) RTD; (c) interconnection lines, recording sites, and pads for LED and recording points; (d) connection pads to external electronics (top) and exposure of recording sites and pads for the LED (bottom).
Figure 5Results of the fabricated optrode integrating 10 Pt recording sites and commercial LED chip, and also a Pt RTD on its backside.
Figure 6Experimental LED’s normalized light intensity as a function of the wavelength. LED peak intensity is at approximately 470 nm.
Figure 7Impedance results for the Pt 50 × 50 m recording sites.
Figure 8RTD’s resistivity vs. temperature. The dashed line results from a processing data five-point adjacent-averaging smoothing method, which replaces a point using the average of its five closest points.
Resistance values at 0 C (R) and 100 C (R) for RTD and commercial Pt100. The calculated TCR value is also included.
| Sample |
|
|
|
|---|---|---|---|
| Pt100 | 100.23 | 137.71 | 0.0037 |
| RTD | 1548.58 | 1787.55 | 0.0015 |
Comparison of RTD developed in this work and previous studies.
| Ref. | Material | Sensitivity ( | Resolution ( | |
|---|---|---|---|---|
| [ | Au | - | - | 0.03 |
| [ | Poly-Si | - | - | 0.9 |
| [ | Pt | 0.781 | 0.0028 | - |
| [ | Pt | 8.8 | - | 0.5 |
| [ | Pt | - | 0.0015 | 1 |
| [ | Au | - | 0.0032 | 0.25 |
| [ | Pt | 1.485 | 0.0035 | - |
| This work | Pt | 2.4 | 0.0015 | 0.19 |
Figure 9Comparative temperature measurements using Pt100 vs. RTD (green line). Measurement accuracy is given by error lines: maximum error (blue dashed line) and average error (red dashed line).
Figure 10Measurements temperature results with a commercial Pt100 and the proposed RTD when medium is set to 35 C.