| Literature DB >> 30242184 |
Takahiro Moriyama1,2, Kent Oda3, Takuo Ohkochi4, Motoi Kimata5, Teruo Ono3,6.
Abstract
For a long time, there were no efficient ways of controlling antiferromagnets. Quite a strong magnetic field was required to manipulate the magnetic moments because of a high molecular field and a small magnetic susceptibility. It was also difficult to detect the orientation of the magnetic moments since the net magnetic moment is effectively zero. For these reasons, research on antiferromagnets has not been progressed as drastically as that on ferromagnets which are the main materials in modern spintronic devices. Here we show that the magnetic moments in NiO, a typical natural antiferromagnet, can indeed be controlled by the spin torque with a relatively small electric current density (~4 × 107 A/cm2) and their orientation is detected by the transverse resistance resulting from the spin Hall magnetoresistance. The demonstrated techniques of controlling and detecting antiferromagnets would outstandingly promote the methodologies in the recently emerged "antiferromagnetic spintronics". Furthermore, our results essentially lead to a spin torque antiferromagnetic memory.Entities:
Year: 2018 PMID: 30242184 PMCID: PMC6155024 DOI: 10.1038/s41598-018-32508-w
Source DB: PubMed Journal: Sci Rep ISSN: 2045-2322 Impact factor: 4.379
Figure 1The spin torque writing scheme and the sequential write-read memory operation. (a) The basic principle of the spin torque rotation of the antiferromagnets using the spin Hall effect in a Pt/NiO/Pt multilayer structure. The writing current I in the Pt layers invokes the spin Hall effect, and injects the spin currents with the spin polarization and toward the antiferromagnetic NiO. The spin currents exert a spin torque and (green arrows) on the microscopic magnetic moments in the same rotation direction. (b) Measurement procedure of the spin torque write and the Hall resistance read. R is measured after each write “1” and “0”. Microscope image of the Hall cross structure is shown in the center. Our common definition of the angle θ is also shown. (c) The sequential write-read operation in Pt/NiO 10 nm/Pt with I = 23, 25, and 26 mA and Pt/SiO2 10 nm/Pt with I = 30 mA. The arrows on the top represent the write “1” and “0” operations described in (b). As indicated in the graph, ∆R is defined as ∆R = R (“1”) − R (“0”) where R (“1”) and R (“0”) respectively represent the R after the write “1” and the write “0”.
Figure 2Writability by the spin torque and robustness against an external field. (a) ∆R and Δρ1/ρ as a function of the writing current I for Pt/NiO 10 nm/Pt. (b) R measurements for Pt/NiO 10 nm/Pt in a rotating magnetic field H = 5, 10, and 14.5 Tesla. θ is the field angle in the circular coordinate shown in Fig. 1(b).
Figure 3The NiO domains after the spin-torque writing with X-ray magnetic linear dichroism-photoemission electron microscopy (XMLD-PEEM). XMLD-PEEM images, processed by dividing the higher energy peak by the lower energy peak at the Ni-L2 edge, after the write “1” (a) and the write “0”. (b) The black dotted lines indicate the Hall bar structure. The incident and linear-polarized direction of the X-ray beam are indicated with the red and green arrows, respectively. The rectangles show the region where the NiO domain was modified. (c) and (d) are electron yield as a function of the photon energy scan of the rectangle regions. (e) The post-processed monochrome images from the center region framed by the white square in (b) show the delimiting boundaries of the NiO domains (See SI for more details). Difference between the state “1” and “0” is also shown.
ΔR and Δρ1/ρ with I = 26 mA for four different samples. Standard deviation (SD.) is shown in the last column.
| Sample# | 1 | 2 | 3 | 4 | SD. |
|---|---|---|---|---|---|
| 16.1 | 110.4 | 39.6 | 6.9 | 46.8 | |
| Δ | 1.0 | 6.9 | 2.5 | 0.4 | 2.9 |