| Literature DB >> 30023203 |
Adele Rafati1,2,3, Pooria Gill2,4.
Abstract
The potential applications of scanning tunneling microscopy and atomic force microscopy for the characterizations of DNA nanotubes in nanoscale have been described here. The nanotubes were designed using the Cadnano software according to M13 mp18 DNA as a scaffold. DNA nanotubes were fabricated using the origami technique assisted with ligase treatment subsequently. Transmission electron microscopy confirmed the morphology of DNA nanotubes. For the topographic characterization of DNA nanotubes, an atomic force microscope was used in comparison to a scanning tunneling microscope. The scanning tunneling microscopy results revealed a high-resolution topography of DNA nanotubes in the constant-current mode; however, more details of the self-assembly in DNA strands in nanotubes were explored by atomic force microscopy with contact mode (or constant height). Our findings suggested that those two microscopes could be candidates for ultrastructural characterizations of DNA nanotubes for obtaining two- and three-dimensional micrographs.Entities:
Keywords: DNA nanotube; atomic force microscope; scanning tunneling microscope; transmission electron microscope
Year: 2015 PMID: 30023203 PMCID: PMC6014237 DOI: 10.1016/j.jmau.2015.08.001
Source DB: PubMed Journal: J Microsc Ultrastruct ISSN: 2213-879X
Fig. 1Schematic of fabrication DNA nanotubes via integration of sticky-ended DNA nanostructures by ligation treatment. (A) Sticky-ended DNA nanostructure; (B) Ligase-treated sticky-ended DNA nanostructures; (C) Fabricated DNA nanotube.
Staple results obtained from the Cadnano software for self-assembly of desired DNA nanotubes.
| No. | Sequence (5' to 3') |
|---|---|
| 1 | CCAACGTGCAGGTCATTCGTA |
| 2 | CACTATTCCGGTTCATGGTCG |
| 3 | TTCCAGTTCCCTTAAGCAGGC |
| 4 | GAGATAGGGTTGACGCGCGGGGAGAGGCGGT |
| 5 | ACGGCCAGTGCCTGTTTCCTG |
| 6 | CATGCCTCAAAGGGGCGCTCA |
| 7 | GAGGATCAAAGAACGTCGGGA |
| 8 | GGCAAAATTGGAACGCTGCAT |
| 9 | ATCATGGGCTCACAAATGAGTGAGCTAACTCAC |
| 10 | GGTACCGACGAGCCAGTGTAA |
| 11 | GAAAATCTTGCCCTCACCAGT |
| 12 | AGCGGTCCACGCTGGTTGAGAGACGCCAGG |
| 13 | TGTGAAATTGTTATCCTCATAGCAAGCTTG |
| 14 | ACAACATAGCTCGAGACTCTA |
| 15 | CAGCTGACTGTTTGCGAAATC |
| 16 | CTGGCCCTTGCCCCTAAATCAAAAGAATAGCCC |
| 17 | AGCCTGGCTTTCCAGTGGACT |
| 18 | GAGACGGCGTGCCAAAGAGTC |
| 19 | GTGGTTTTCGGCCAAGTGTTG |
| 20 | TTGCGTATTGGGGTTGCAGCA |
| 21 | ATTAATTGCGTTCGAAAAACCGTCTATCACG |
| 22 | CTGCCCGGGTGCCTATTCCAC |
| 23 | AACCTGTGCCATAAGGAAGAA |
| 24 | CCAACGTGCAGGTCATTCGTA |
Fig. 2Transmission-electron-microscope micrograph of DNA nanotubes. The nanotubes have micron lengths with nanoscale widths. The micrograph was obtained with Philips EM028 transmission electron microscope equipped with field-emission gun.
Fig. 3Atomic force micrograph of a DNA nanotube on mica surface. Two-dimensional micrograph of DNA nanotubes; inset, high-resolution micrograph of DNA nanotube ultrastructures. The image has been obtained and analyzed using nanoatomic force microscopy with 150 Hz IGain, 0.0048 PGain, and 1.0 V set point via a JPK NanoWizard control.
Fig. 4High resolution of a scanning tunneling microscope micrograph from DNA nanotubes on highly ordered pyrolytic graphite surface. Three-dimensional micrograph of DNA nanotubes with ultrastructures; inset, two-dimensional micrograph of DNA nanotubes with more details of their structures. The image has been obtained by NAMA-STM SS-3L1 (Nanotechnology Systems Corporation). Current set point and sample bias voltage were set at 0.1 nA and 0.2 V, respectively. Rough data were filtered by line, plain adjusts, and average filters of NAMA-STM SS-3L1 Nanoanalyzer software.
Parameters affecting capabilities of atomic force microscope and scanning tunneling microscope in ultrastructural microscopy of DNA nanotubes.
| Microscope | Scanning range | Scanning frequency | Scanning mode | Probe | Figuration of micrographs | Scanning phase | Substrate for sampling |
|---|---|---|---|---|---|---|---|
| AFM | Wide (50 × 50 μm) | Slow | Contact, noncontact, tapping | Silicon cantilever | Two- & three-dimensional | Vacuum, air, liquid | Mica |
| STM | Limited (8 × 8 μm) | Slow | Constant current, constant height | Pt–Ir tip | Two- & three-dimensional | Vacuum, air | HOPG |
AFM = atomic force microscope; HOPG = highly ordered pyrolytic graphite; Pt–Ir = platinum–iridium; STM = scanning tunneling microscope.