| Literature DB >> 30022027 |
Guanhaojie Zheng1,2,3, Cheng Zhu4, Jingyuan Ma3,5, Xiaonan Zhang2,3, Gang Tang6, Runguang Li7, Yihua Chen1, Liang Li1, Jinsong Hu3,5, Jiawang Hong6, Qi Chen8, Xingyu Gao9,10, Huanping Zhou11.
Abstract
Crystal orientations in multiple orders correlate to the properties of polycrystalline materials, and it is critical to manipulate these microstructural arrangements to enhance device performance. Herein, we report a controllable approach to manipulate the facet orientation within the ABX3 hybrid perovskites polycrystalline films by cation cascade doping at A-site. Two-dimensional synchrotron radiation grazing incidence wide-angle X-ray scattering is employed to probe the crystal orientations in multiple orders in mixed perovskites thin films, revealing a general pattern to guide crystal planes stacking upon extrinsic doping during crystallization. Different from previous studies, this method enables to adjust the crystal stacking mode of certain crystallographic planes in polycrystalline perovskites. Moreover, the preferred facet orientation is found to facilitate photocarrier transport across the absorber and pertaining interface in the resultant PV device, which provides an exemplary paradigm for further explorations that relate to the microstructures of hybrid perovskite materials and relevant optoelectronics.Entities:
Year: 2018 PMID: 30022027 PMCID: PMC6052040 DOI: 10.1038/s41467-018-05076-w
Source DB: PubMed Journal: Nat Commun ISSN: 2041-1723 Impact factor: 14.919
Fig. 1One-dimensional XRD and SEM image. a XRD pattern and b SEM images for perovskite films with cation cascade doping labeled as FAMA, FAMACs, FAMACsRb, and FAMACsRbK, respectively
Fig. 2GIWAXS analysis and schematic diagram for microstructure evolution process. a GIWAXS patterns for perovskite films with cation cascade doping as FAMA, FAMACs, FAMACsRb, and FAMACsRbK, respectively. b Integrated intensity plots azimuthally along the ring at qr approximate to 0.16 Å−1, assigned to the (001) plane of corresponding perovskite films noted in a. c The evolution schematic diagram of GIWAXS patterns occurred with cation cascade doping
Fig. 3GIWAXS analysis for cesium-doped samples. a GIWAXS patterns for perovskite films with different cesium concentration labeled as FAMA-Cs 0, FAMA-Cs 2, FAMA-Cs 5, and FAMA-Cs 10. b Integrated intensity plots azimuthally along the ring at qr approximate to 0.16 Å−1, assigned to the (001) plane of corresponding perovskite films corresponding to those in a
Fig. 4Statistics of photovoltaic parameters. Statistics of I–V performance parameters: Voc (a), Jsc (b), PCE (c), FF (d) for devices based on mixed FAMA perovskites with different cesium-doping concentration. Twelve devices for each Cs+-doping concentration were involved in the statistics
Fig. 5c-AFM and SCLC analysis for cesium-doped samples. a c-AFM images and SCLC data for FAMA perovskite films with different cesium-doping concentration (volume ratio: b 0, c 5 and, d 10%)
Fig. 6Analysis of carrier dynamics. a TPC, b TPV, c EIS, and d IMPS analysis for FAMA perovskite samples with different cesium-doping concentration (volume ratio: 0, 5, and 10%)