| Literature DB >> 29713434 |
Ipek Caglar1, Sabit Melih Ates1, Zeynep Yesil Duymus1.
Abstract
PURPOSE: The purpose of this study was to evaluate and compare three polishing systems on the surface roughness and phase transformation of monolithic zirconia.Entities:
Keywords: Grinding; Monolithic zirconia; Phase transformation; Polishing; Surface roughness
Year: 2018 PMID: 29713434 PMCID: PMC5917105 DOI: 10.4047/jap.2018.10.2.132
Source DB: PubMed Journal: J Adv Prosthodont ISSN: 2005-7806 Impact factor: 1.904
Polishing systems used in the study
| Group | Brand/Manufacturer | Composition | Recommended revolution (RPM) | Lot number |
|---|---|---|---|---|
| M | Luster for zirconia in Meisinger, Meisinger, Hager&Meisinger GmbH | Stage 1: Pregrinding | 8000 – 12000 | A77751 |
| Stage 2: Smootding & pre-polishing eisinger GmbH | 7000 – 12000 | |||
| Stage 3: High-gloss polishing | 7000 – 12000 | |||
| E | EVE Diacera, EVA Ernst Vetter GmbH | Stage 1: Pregrinding | 7000 – 12000 | 240231 |
| Stage 2: Smootding & pre-polishing | 7000 – 12000 | |||
| Stage 3: High-gloss polishing | 7000 – 12000 | |||
| P | EVE Diapol, EVA Ernst Vetter GmbH | Stage 1: Removing | 7000 – 12000 | 230893 |
| Stage 2: Smootding | 7000 – 12000 | |||
| Stage 3: High-luster polishing | 7000 – 12000 |
Mean and standard deviations of surface roughness values (um)
| Group | N | Mean (SD) |
|---|---|---|
| Control | 20 | 1.11 (0.27)a |
| G | 20 | 1.77 (0.26)b |
| M | 20 | 0.28 (0.11)c |
| E | 20 | 0.28 (0.07)c |
| P | 20 | 0.78 (0.14)d |
Same letters indicates the values that were not statistically different (P > .05).
SD: Standard deviation, Control: Sintered zirconia, Group G: Grinding, Group M: Meisinger polishing systems, Group E: EVE Diacera polishing systems, Group P: EVE Diapol polishing systems
Fig. 1Scanning electron microscopy image (×1000 magnification) of the zirconia specimens as received, control group.
Fig. 2Scanning electron microscopy image (×1000 magnification) of the grinded zirconia specimens, Group G.
Fig. 3Scanning electron microscopy image (×1000 magnification) of the zirconia specimens after polishing with Meisinger system, Group M.
Fig. 4Scanning electron microscopy image (×1000 magnification) of the zirconia specimens after polishing with EVE Diacera system, Group E.
Fig. 5Scanning electron microscopy image (×1000 magnification) of the zirconia specimens after polishing with EVE Diapol system, Group P.
Fig. 6XRD patterns of zirconia specimens.