| Literature DB >> 29387928 |
Weiwei Wu1, Wenyan Ren1, Honglei Hao1, Hailun Nan2, Xin He2, Qiuling Liu2, Dejian Lu3.
Abstract
Mutation analysis of 42 Y chromosomal short tandem repeats (Y-STRs) loci was performed using a sample of 1160 father-son pairs from the Chinese Han population in Eastern China. The results showed that the average mutation rate across the 42 Y-STR loci was 0.0041 (95% CI 0.0036-0.0047) per locus per generation. The locus-specific mutation rates varied from 0.000 to 0.0190. No mutation was found at DYS388, DYS437, DYS448, DYS531, and GATA_H4. DYS627, DYS570, DYS576, and DYS449 could be classified as rapidly mutating Y-STRs, with mutation rates higher than 1.0 × 10-2. DYS458, DYS630, and DYS518 were moderately mutating Y-STRs, with mutation rates ranging from 8 × 10-3 to 1 × 10-2. Although the characteristics of the Y-STR mutations were consistent with those in previous studies, mutation rate differences between our data and previous published data were found at some rapidly mutating Y-STRs. The single-copy loci located on the short arm of the Y chromosome (Yp) showed relatively higher mutation rates more frequently than the multi-copy loci. These results will not only extend the data for Y-STR mutations but also be important for kinship analysis, paternal lineage identification, and family relationship reconstruction in forensic Y-STR analysis.Entities:
Keywords: Chinese Han population; Microsatellites; Mutation; Rapidly mutating Y-STRs (RM Y-STRs); Y chromosomal short tandem repeat (Y-STR)
Mesh:
Year: 2018 PMID: 29387928 DOI: 10.1007/s00414-018-1784-x
Source DB: PubMed Journal: Int J Legal Med ISSN: 0937-9827 Impact factor: 2.686