| Literature DB >> 29382044 |
Chong-You Chen, Chia-Hsuan Chang, Chang-Ming Wang1, Yi-Jing Li2, Hsiao-Yuan Chu3, Hong-Hseng Chan4, Yu-Wei Huang5, Wei-Ssu Liao6.
Abstract
Nanoparticle alignment on the substrate attracts considerable attention due to its wide application in different fields, such as mechanical control, small size electronics, bio/chemical sensing, molecular manipulation, and energy harvesting. However, precise nanoparticle positioning and deposition control with high fidelity are still challenging. Herein, a straightforward strategy for high quality nanoparticle-alignment by chemical lift-off lithography (CLL) is demonstrated. This technique creates high resolution self-assembled monolayer (SAM) chemical patterns on gold substrates, enabling nanoparticle-selective deposition and precise alignment. The fabricated nanoparticle arrangement geometries and dimensions are well-controllable in a large area. With proper nanoparticle surface functionality control and adequate substrate molecular manipulation, well-defined nanoparticle arrays with single-particle-wide alignment resolution are achieved.Entities:
Keywords: chemical lift-off lithography; nanoparticle; patterning; selective deposition; self-assembled monolayer
Year: 2018 PMID: 29382044 PMCID: PMC5853703 DOI: 10.3390/nano8020071
Source DB: PubMed Journal: Nanomaterials (Basel) ISSN: 2079-4991 Impact factor: 5.076
Figure 1Schematic illustration of citrate-capped Au nanoparticle selective deposition on the chemical lift-off lithography (CLL)-created molecular pattern. The hydroxyl-terminated mercaptoundecanol (MCU) self-assembled monolayer (SAM) is used as the operation matrix. In the CLL process, a polydimethylsiloxane (PDMS) stamp is first treated with oxygen plasma for 40 s, and then conformal sealed onto a MCU SAM-modified substrate for 24 h. After separating stamp and substrate, 100 pM Au nanoparticle suspension solution is dropped onto the substrate for 1 h of incubation. Finally, the substrate is wash with deionized (DI) water and blown dried with nitrogen gas, producing clear nanoparticle selective deposition showing in the scanning electron microscope (SEM) image. The scale bar is 1 μm.
Figure 2SEM images of Au nanoparticles remaining on the MCU SAM-modified Au substrate after different treatments: (A) Without any cleaning; (B) 30 min of 80 °C hot water cleaning; and (C) 30 min of 60 °C 0.1 M urea cleaning. (D) Particle densities counted from (A–C), where (a), (b), and (c) are histogram columns corresponding to (A), (B), and (C), respectively. The scale bars are 1 μm. (N = 3).
Figure 3SEM images showing different Au nanoparticle densities on the CLL-treated substrates. The CLL process is operated under the 24 h stamp seal time condition. (A) 1 h of nanoparticle deposition time is fixed with changing solution concentrations; (B) 150 pM of nanoparticle suspension solution is used with various deposition time. The scale bars are 2 μm.
Figure 4Au nanoparticle arrays with different geometries and dimensions created by CLL-induced selective particle alignment. (A–E) are large area SEM images with their corresponding zoom-in images showing in (F–J). The corresponding cartoon images represent the stamp-substrate contact areas (orange) and noncontact regions (blue) during the conformal sealing procedure. The CLL process is operated under conditions of 24 h stamp seal time and 1 h of 100 pM nanoparticle deposition duration. The yellow and red scale bars are 5 and 0.5 μm, respectively.