Literature DB >> 29335772

Investigation on the correlation between energy deposition and clustered DNA damage induced by low-energy electrons.

Wei Liu1,2, Zhenyu Tan3, Liming Zhang4, Christophe Champion5.   

Abstract

This study presents the correlation between energy deposition and clustered DNA damage, based on a Monte Carlo simulation of the spectrum of direct DNA damage induced by low-energy electrons including the dissociative electron attachment. Clustered DNA damage is classified as simple and complex in terms of the combination of single-strand breaks (SSBs) or double-strand breaks (DSBs) and adjacent base damage (BD). The results show that the energy depositions associated with about 90% of total clustered DNA damage are below 150 eV. The simple clustered DNA damage, which is constituted of the combination of SSBs and adjacent BD, is dominant, accounting for 90% of all clustered DNA damage, and the spectra of the energy depositions correlating with them are similar for different primary energies. One type of simple clustered DNA damage is the combination of a SSB and 1-5 BD, which is denoted as SSB + BD. The average contribution of SSB + BD to total simple clustered DNA damage reaches up to about 84% for the considered primary energies. In all forms of SSB + BD, the SSB + BD including only one base damage is dominant (above 80%). In addition, for the considered primary energies, there is no obvious difference between the average energy depositions for a fixed complexity of SSB + BD determined by the number of base damage, but average energy depositions increase with the complexity of SSB + BD. In the complex clustered DNA damage constituted by the combination of DSBs and BD around them, a relatively simple type is a DSB combining adjacent BD, marked as DSB + BD, and it is of substantial contribution (on average up to about 82%). The spectrum of DSB + BD is given mainly by the DSB in combination with different numbers of base damage, from 1 to 5. For the considered primary energies, the DSB combined with only one base damage contributes about 83% of total DSB + BD, and the average energy deposition is about 106 eV. However, the energy deposition increases with the complexity of clustered DNA damage, and therefore, the clustered DNA damage with high complexity still needs to be considered in the study of radiation biological effects, in spite of their small contributions to all clustered DNA damage.

Entities:  

Keywords:  Clustered DNA damage; Energy deposition; Low-energy electron; Monte Carlo simulation; Radiation biological effect

Mesh:

Year:  2018        PMID: 29335772     DOI: 10.1007/s00411-018-0730-0

Source DB:  PubMed          Journal:  Radiat Environ Biophys        ISSN: 0301-634X            Impact factor:   1.925


  33 in total

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5.  Calculation on spectrum of direct DNA damage induced by low-energy electrons including dissociative electron attachment.

Authors:  Wei Liu; Zhenyu Tan; Liming Zhang; Christophe Champion
Journal:  Radiat Environ Biophys       Date:  2017-02-09       Impact factor: 1.925

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Authors:  Laura J Eccles; Peter O'Neill; Martine E Lomax
Journal:  Mutat Res       Date:  2010-12-02       Impact factor: 2.433

Review 10.  Induction and repair of clustered DNA lesions: what do we know so far?

Authors:  Alexandros G Georgakilas; Peter O'Neill; Robert D Stewart
Journal:  Radiat Res       Date:  2013-05-17       Impact factor: 2.841

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  1 in total

Review 1.  Ionizing Radiation and Complex DNA Damage: Quantifying the Radiobiological Damage Using Monte Carlo Simulations.

Authors:  Konstantinos P Chatzipapas; Panagiotis Papadimitroulas; Dimitris Emfietzoglou; Spyridon A Kalospyros; Megumi Hada; Alexandros G Georgakilas; George C Kagadis
Journal:  Cancers (Basel)       Date:  2020-03-26       Impact factor: 6.639

  1 in total

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